考虑常利率的二维离散风险模型的破产概率

考虑一个带常利率的二维离散风险模型.假设两险种的理赔服从二维一阶自回归模型,利用鞅方法导出最终破产概率的Lundberg型不等式及上界.并通过具体数值分析解释了各种不同参数对破产概率上界的影响.     

Cohen-Macaulay and Gorenstein property of Rees algebras of non-singular equimultiple prime ideals

We give criteria for the Cohen-Macaulay and Gorenstein property of Rees algebras of height 2 non-singular equimultiple prime ideals in terms of explicite representations of the associated graded rings. As consequences, we show that in general, the Cohen-Macaulay resp. Gorenstein property of such Rees algebras does not imply the Cohen-Macaulay resp. Gorenstein property of the base ring and that these properties depend upon the characteristic. Dedicated to the memrory of Professor Lê Van Thiêm Professor Lê Van Thiêm was the first directorof Hanoi Institute of Mathematics     

Stability of strongly continuous representations of abelian semigroups

Part of this work was carried out while the authors were visiting the University of Franche-Comté, Besan?on, and Hokkaido University, Sapporo, respectively     

Integral global optimization method for solution of nonlinear complementarity problems

The mapping in a nonlinear complementarity problem may be discontinuous. The integral global optimization algorithm is proposed to solve a nonlinear complementarity problem with a robust piecewise continuous mapping. Numerical examples are given to illustrate the effectiveness of the algorithm.     

The free loop space and the algebraic k-theory of spaces

Let A(X) be the space defined by Waldhausen whose homotopy groups define the algebraic K-groups of the space X and let . Here (X) denotes the free loop space of X and Q denotes the functor . For X = Y, the suspension of a connected space Y, we shall prove that the homotopy fibers Ã(X), B(X) of the maps A(X) A (point), B(X) B (point) are equivalent as infinite loop spaces.     

The first excited single-proton resonance in ~(15)F by complex-scaled Green's function method

The complex-scaled Green's function(CGF)method is employed to explore the single-proton resonance in 15F.Special attention is paid to the first excited resonant state 5/2+,which has been widely studied in both theory and experiments.However,past studies generally overestimated the width of the 5/2+state.The predicted energy and width of the first excited resonant state 5/2+by the CGF method are both in good agreement with the experimental value and close to Fortune's new estimation.Furthermore,the influence of the potential parameters and quadruple deformation effects on the resonant states are investigated in detail,which is helpful to the study of the shell structure evolution.     

HL-2A装置上边界间歇性事件与湍流粒子输运的统计学研究

通过对粒子概率分布函数的计算,发现在高等离子体密度下边界间歇性事件的爆发频率有所增加。通过条件平均的手段,正负间歇性事件得以区分,并发现了二者在空间上的不同特征。不同密度梯度下的湍流粒子输运计算表明,间歇性事件与湍流粒子输运之间存在密切联系,间歇性事件的存在能够大大增加湍流粒子输运的大小。在高等离子体密度时,间歇性事件的强度有所增加,而与之相应地,湍流粒子输运的大小也有所增强。     

碳纳米管的可控长度拾取及导电性分析

拾取指定长度的半导体性碳纳米管对大规模制造碳纳米管场效应管具有重要意义.本文提出了一种利用原子力显微镜探针和钨针对碳纳米管进行可控长度拾取的方法并进行了碳纳米管导电性分析.在扫描电子显微镜下搭建微纳操作系统,针对切割操作过程中原子力显微镜探针、钨针和碳纳米管的接触情况进行了力学建模和拾取长度误差分析.建立了单根金属性碳纳米管、单根半导体性碳纳米管及碳纳米管束与钨针接触的电路模型,推导了接入不同性质碳纳米管后电路的电流电压特性方程.使用原子力显微镜探针对碳纳米管的空间位姿进行调整,控制钨针对碳纳米管上目标位置进行通电切割,同时获取切割电路中的电流电压数据.实验结果表明,本文提出的方法能够有效控制所拾取碳纳米管的长度,增加碳纳米管与原子力显微镜探针的水平接触长度能够减小碳纳米管形变导致的拾取长度误差,建立的电流电压特性方程能够用于分析碳纳米管的导电性.     

Spin-exchange relaxation of naturally abundant Rb in a K-Rb-~(21)Ne self-compensated atomic comagnetometer

The total effective spin-exchange relaxation of naturally abundant Rb in a K–Rb–21Ne comagnetometer is analyzed,and the results show that the coexistence of 87Rb and 85Rb isotopes in the same volume can lead to a large extra spinexchange broadening compared to pure 87Rb.This broadening mainly comes from the contribution of the equivalent reduction in the Rb spin-exchange rate.On this basis,an approximate relaxation model is proposed and experimentally demonstrated to be more accurate than that from a previous work.This study also provides a method for determining the properties of alkali-metal vapor cells.     

Surface roughness investigation of semi-conductor wafers

Conventionally, surface roughness is predominantly determined through the use of stylus instruments. However, there are certain limitations involved in the method, particularly when a test specimen, such as a silicon wafer, has a smooth mirror-like surface. Hence, it is necessary to explore alternative non-contact techniques. Light scattering has recently been gaining popularity as an optical technique to provide prompt and precise inspection of surface roughness. In this paper, the total integrated scattering (TIS) model is modified to retrieve parameters on surface micro-topography through light scattering. The applicability of the proposed modified TIS model is studied and compared with an atomic force microscope. Experimental results obtained show that the proposed technique is highly accurate for measuring surface roughness in the nanometer range.