Bidendriform bialgebras, trees, and free quasi-symmetric functions

We introduce bidendriform bialgebras, which are bialgebras such that both product and coproduct can be split into two parts satisfying good compatibilities. For example, the Malvenuto-Reutenauer Hopf algebra and the non-commutative Connes-Kreimer Hopf algebras of planar decorated rooted trees are bidendriform bialgebras. We prove that all connected bidendriform bialgebras are generated by their primitive elements as a dendriform algebra (bidendriform Milnor-Moore theorem) and then is isomorphic to a Connes-Kreimer Hopf algebra. As a corollary, the Hopf algebra of Malvenuto-Reutenauer is isomorphic to the Connes-Kreimer Hopf algebra of planar rooted trees decorated by a certain set. We deduce that the Lie algebra of its primitive elements is free in characteristic zero (G. Duchamp, F. Hivert and J.-Y. Thibon conjecture).     

透镜初级球差的横向剪切干涉条纹研究

利用玻璃平行平板构成简单的横向剪切干涉仪可以观察到单薄透镜形成的准直光束的剪切干涉条纹,由干涉条纹分布求出对应的几何像差和离焦量.用焦距为190 mm的单薄透镜做实验,实验结果与计算机模拟结果符合,说明可以从剪切干涉条纹的分布求出透镜的轴向调整误差和初级球差.     

Fracture strength of class II slot cavities restored with polymerizable restorative materials

This study compared the fracture strength of Class II slot cavities restored with polymerizable restorative materials. Sixty, caries-free, posterior teeth were divided into five groups of 12 teeth. The Class II slot cavities were prepared. The teeth were restored with two packable composites (Filtek P60, Surefil), a microhybrid composite (Filtek Z250)and two ormocer (Definite, Admira). The restorations were then subjected to fracture resistance tests. The marginal ridges of the restorations were loaded at an angle of 13.5° to the long axis of the tooth in an Universal Testing Machine until failure. Analysis of mean forces indicated that, Filtek P60, Surefil and Filtek Z250 exhibited better performance than Definite and Admira. The tested resin composites differed in their mechanical properties. This study suggested that fracture behavior were highly influenced by the filler system. Overall, Filtek P60, Surefil, Filtek Z250, demonstrated good fracture resistance. Copyright © 2003 John Wiley & Sons, Ltd.     

Surface roughness investigation of semi-conductor wafers

Conventionally, surface roughness is predominantly determined through the use of stylus instruments. However, there are certain limitations involved in the method, particularly when a test specimen, such as a silicon wafer, has a smooth mirror-like surface. Hence, it is necessary to explore alternative non-contact techniques. Light scattering has recently been gaining popularity as an optical technique to provide prompt and precise inspection of surface roughness. In this paper, the total integrated scattering (TIS) model is modified to retrieve parameters on surface micro-topography through light scattering. The applicability of the proposed modified TIS model is studied and compared with an atomic force microscope. Experimental results obtained show that the proposed technique is highly accurate for measuring surface roughness in the nanometer range.     

Low-energy ion-assisted control of interfacial structures in metallic multilayers

A molecular dynamics method has been used to simulate the argon ion-assisted deposition of Cu/Co/Cu multilayers and to explore ion beam assistance strategies that can be used during or after the growth of each layer to control interfacial structures. A low-argon ion energy of 5–10 eV was found to minimize a combination of interfacial roughness and interlayer mixing (alloying) during the ion-assisted deposition of multilayers. However, complete flattening with simultaneous ion assistance could not be achieved without some mixing between the layers when a constant ion energy approach was used. It was found that multilayers with lower interfacial roughness and intermixing could be grown either by modulating the ion energy during the growth of each metal layer or by utilizing ion assistance only after the completion of each layers deposition. In these latter approaches, relatively high-energy ions could be used since the interface is buried and less susceptible to intermixing. The interlayer mixing dependence upon the thickness of the over layer has been determined as a function of ion energy.     

Synthesis of grafted poly(p‐phenyleneethynylene) with energy donor–acceptor architecture via atom transfer radical polymerization: Towards nonaggregating and hole‐facilitating light‐emitting material

In this contribution, we demonstrate a new effective methodology for constructing highly efficient and durable poly(p‐phenyleneethynylene) (PPE) containing emissive material with nonaggregating and hole‐facilitating properties through the introduction of hole‐transporting blocks into the PPE system as the grafting coils as well as building the energy donor–acceptor architecture between the grafting coils and the PPE backbone. Poly(2‐(carbazol‐9‐yl)ethyl methacrylate) (PCzEMA), herein, is chosen as the hole‐transporting blocks, and incorporated into the PPE system as the grafting coils via atom transfer radical polymerization. The chemical structure of the resultant copolymer, PPE‐g‐PCzEMA, was characterized by NMR and gel permeation chromatography, showing that the desirable copolymer was obtained with the narrow polydispersity. The increased thermal stability of PPE‐g‐PCzEMA was confirmed by thermogravimetric analysis and differential scanning calorimetry along with its macroinitiator. The optoelectronic properties of this copolymer were studied in detail by ultraviolet‐visible absorption, photoluminescence emission and excitation spectra, and cyclic voltammogram (CV). The results indicate that PPE‐g‐PCzEMA exhibits the solid‐state luminescent property dominated by individual lumophores, and also the energy transfer process from the PCzEMA blocks to the PPE backbone with a relatively higher energy transfer efficiency in the solid‐state compared to that of the solution state. Additionally, the hole‐injection property is greatly facilitated due to the presence of PCzEMA, as confirmed by CV profiles. All these data indicate that PPE‐g‐PCzEMA is a good candidate for use in optoelectronic devices. © 2007 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 45: 3776–3787, 2007     

Emulsion stability and potassium leakage in emulsion liquid membrane systems

Potassium leakage was studied in liquid membrane systems containing various emulsifiers and compared with emulsion, stability in the storage test. The effects of various parameters upon emulsion stability and the leakage of standard traces are discussed. The transfer of cations can be caused by emulsion breaking, by transport with the specific carrier and/or with surfactants used as emulsifiers. The latter case becomes especially important when hydrophilic surfactants, e.g. ones containing polyoxyethylene chains, are present in liquid membranes. In systems containing hydrophobic emulsifiers the transfer of potassium is relatively low. In each case considered the effect of emulsifiers upon the transfer of the standard tracer should be checked prior to using the leakage test to characterize emulsion stability.