首页 | 本学科首页   官方微博 | 高级检索  
文章检索
  按 检索   检索词:      
出版年份:   被引次数:   他引次数: 提示:输入*表示无穷大
  收费全文   10621篇
  免费   205篇
  国内免费   45篇
化学   6182篇
晶体学   85篇
力学   358篇
数学   1709篇
物理学   2537篇
  2022年   103篇
  2021年   126篇
  2020年   130篇
  2019年   142篇
  2018年   127篇
  2017年   106篇
  2016年   202篇
  2015年   171篇
  2014年   182篇
  2013年   592篇
  2012年   381篇
  2011年   474篇
  2010年   337篇
  2009年   291篇
  2008年   436篇
  2007年   391篇
  2006年   391篇
  2005年   344篇
  2004年   370篇
  2003年   289篇
  2002年   300篇
  2001年   198篇
  2000年   185篇
  1999年   145篇
  1998年   120篇
  1997年   134篇
  1996年   165篇
  1995年   126篇
  1994年   131篇
  1993年   165篇
  1992年   160篇
  1991年   162篇
  1990年   120篇
  1989年   124篇
  1988年   133篇
  1987年   182篇
  1986年   150篇
  1985年   202篇
  1984年   190篇
  1983年   145篇
  1982年   171篇
  1981年   183篇
  1980年   172篇
  1979年   170篇
  1978年   167篇
  1977年   167篇
  1976年   145篇
  1975年   158篇
  1974年   127篇
  1973年   124篇
排序方式: 共有10000条查询结果,搜索用时 15 毫秒
21.
22.
We consider an optimal growth (multi-sector) model with nonconvex technology. Using the Clarke results on generalized gradients, we prove that the value function has left and right derivatives with respect to the initial capital stock, without requiring supermodularity assumptions.  相似文献   
23.
24.
We present a pole expansion for the propagators in the framework of normalized quantum electrodynamics and compare it with the more canonical results from S-matrix theory.  相似文献   
25.
26.
27.
The oxide scales of AISI 304 formed in boric acid solutions at 300 degrees C and pH = 4.5 have been studied using X-ray photoelectron spectroscopy (XPS) depth profiling. The present focus is depth profile quantification both in depth and chemical composition on a molecular level. The roughness of the samples is studied by atomic force microscopy before and after sputtering, and the erosion rate is determined by measuring the crater depth with a surface profilometer and vertical scanning interferometry. The resulting roughness (20-30 nm), being an order of magnitude lower than the crater depth (0.2-0.5 microm), allows layer-by-layer profiling, although the ion-induced effects result in an uncertainty of the depth calibration of a factor of 2. The XPS spectrum deconvolution and data evaluation applying target factor analysis allows chemical speciation on a molecular level. The elemental distribution as a function of the sputtering time is obtained, and the formation of two layers is observed-one hydroxide (mainly iron-nickel based) on top and a second one deeper, mainly consisting of iron-chromium oxides.  相似文献   
28.
Summary High-purity indium was analysed by spark source mass spectrometry, using electrical and photoplate detection. For the calibration of the differences in elemental sensitivity, a standard sample was prepared in which 10 impurities were determined by graphite furnace atomic absorption spectrometry. In this way accuracies of less than 40% were obtained for relatively homogeneous elements at ppm and sub-ppm level. About 40 elements could be determined with detection limits of 10 to 30 ppb. Two pattern recognition methods, principal component analysis and clustering analysis, were applied to obtain information on trace element distribution, which indicated that a number of elements were strongly spatially correlated in the analysed sample.
Chemische Analyse und Verteilungsbestimmung von Spurenelementen in Indium-Matrix durch Funkenquellen-Massenspektrometrie

On leave from: Department of Chemistry, Nanjing Normal University, Nanjing, People's Republic of China  相似文献   
29.
In this paper, we examine a variant of the uncapacitated lot-sizing model of Wagner–Whitin that includes fixed charges on the stocks. Such a model is natural in a production environment where stocking is a complex operation, and appears as a subproblem in more general network design problems.

Linear-programming formulations, a dynamic program, the convex hull of integer solutions and a separation algorithm are presented. All these turn out to be very natural extensions of the corresponding results of Barany et al. (Math. Programming Stud. 22 (1984) 32) for the uncapacitated lot-sizing problem. The convex hull proof is based on showing that an extended facility location formulation is tight and by projecting it onto the original space of variables.  相似文献   

30.
Taylor expansions of analytic functions are considered with respect to several points, allowing confluence of any of them. Cauchy-type formulas are given for coefficients and remainders in the expansions, and the regions of convergence are indicated. It is explained how these expansions can be used in deriving uniform asymptotic expansions of integrals. The method is also used for obtaining Laurent expansions in several points as well as Taylor-Laurent expansions.

  相似文献   

设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号