Pulsed NMRON oscillatory free induction decay signals in the angular distribution of gamma radiation from plated60CoFe

Results for an inhomogeneously broadened⁶⁰CoFe NMRON sample have been obtained for gamma detected single pulse (nutation) and two pulse (free induction decay) experiments in the region of intermediate-to-lowR(=₁/). Here ₁ is the angular frequency measure of the strength of the ferromagnetically enhanced RF field at the nucleus and is the HWHM of the inhomogeneously broadened line. Comparisons of the oscillatory FID signals obtained are made with the theoretical predictions of the following paper [6].     

Non-reactive metal/semiconductor interfaces: a combined AES,AFM andPAC study

Thin In films on Ge(100), Si(100) andSi(111) are investigated using Auger-electron spectroscopy (AES), atomic force microscopy (AFM) andperturbed -angular correlation (PAC) spectroscopy, respectively. The growth mode of the metal films is characterized by in situ AES measurements, indicating distinct differences between the different substrate surfaces. Additional AFM investigations are used to monitor the film topography at higher metal coverage. Finally, the local crystalline structure of the films is studied by the PAC technique.