氢化丁苯共聚物结构的核磁共振波谱表征Ⅰ.13C谱带的归属

本文分别用JEOL FX-90Q和Bruker AM-300波谱仪测定了氢化聚丁二烯和氢化丁苯共聚物的¹H,¹³C-NMR谱,得到了分辨率较高的谱图和新的结构信息。借助DEPT技术确定了各谱带的CH或CH₂类型。利用Grant-Paul和Lindeman-Adams介绍的化学位移经验计算公式,考虑苯基对α、β和γ碳原子的影响,计算了各种三单元序列中有关碳原子的化学位移。对脂肪碳部分的28组谱带重新进行了归属。化学位移计算值与实测值基本相符,并得到了不同组成的模型聚合物¹³C-NMR谱的各谱带强度变化规律的验证。     

用光电法测量刚体的转动惯量──对波纹法测量刚体转动惯量的改进

用Ｊ─ＬＤ２转动惯量测试仪的波纹法测试转动惯量的实验方法，测量精度差，操作不方便．利用实验室现有的仪器改进成光电法测试转动惯量的方法，简单易行，测量精度高，操作方使，实践效果良好．     

THE INVERSE PROBLEM FOR PART SYMMETRIC MATRICES ON A SUBSPACE

In this paper, the following two problems are considered:Problem Ⅰ. Given S∈E Rn×p,X,B 6 Rn×m, find A ∈ SRs,n such that AX = B, where SR8,n = {A∈ Rn×n|xT(A - AT) = 0, for all x ∈ R(S)}.Problem Ⅱ. Given A* ∈ Rn×n, find A ∈ SE such that ||A-A*|| = minA∈sE||A-A*||, where SE is the solution set of Problem Ⅰ.The necessary and sufficient conditions for the solvability of and the general form of the solutions of problem Ⅰ are given. For problem Ⅱ, the expression for the solution, a numerical algorithm and a numerical example are provided.     

Stability of polymer thin-film transistors based on poly(2-methoxy-5-(2′-ethyl-hexyloxy)-1,4-phenylene vinylene)

Polymer thin-film transistors (PTFTs) based on poly(2-methoxy-5-(2′-ethyl-hexyloxy)-1,4-phenylene vinylene) (MEH-PPV) semiconductor are fabricated by spin-coating process and characterized. In the experiments, solution preparation, deposition and device measurements are all performed in air for large-area applications. Hysteresis effect and gate-bias stress effect are observed for the devices at room temperature. The saturation current decreases and the threshold voltage shifts toward the negative direction upon gate-bias stress, but carrier mobility hardly changes. By using quasi-static C-V analysis for MOS capacitor structure, it can be deduced that the origin of threshold-voltage shift upon negative gate-bias stress is predominantly associated with hole trapping within the SiO₂ gate dielectric near the SiO₂/MEH-PPV interface due to hot-carrier emission.     

不同地区人发中微量元素的测定与生存环境的比较研究

采用高压密封消化罐对人发样品进行处理,将化学计量学应用于ICP-AES法测定了人头发中20种微量元素的含量。该方法操作简单、快速、灵敏度高,准确性好, 且多元素同时测定,回收率在94.07%～107.60%之间。相对标准偏差小于3.49%。通过对不同地区不同年龄1 600人头发的测定结果,探讨了营养、环境污染等因素对人体健康的影响,从而对其生存环境进行比较研究。     

Widely tunable, high-repetition-rate, dual signal-wave optical parametric oscillator by using two periodically poled crystals

This paper reports on a high-repetition-rate dual signal-wave (DSW) optical parametric oscillator (OPO) operating at the 1.5 μm band with tunable wavelength intervals from 2.5 nm to 69.1 nm. Two periodically poled crystals, a periodically poled lithium niobate (PPLN) with multiple gratings and a single grating MgO-doped PPLN (PPMgOLN), are cascaded in the same OPO cavity to generate dual signal-waves by using quasi-phase-matched (QPM) technique. The pump source was a Q-switched diode-pumped Nd:YVO₄ laser operating at 50 kHz. At an incident pump power of 3 W, an average output power of 169.6 mW at 1489.2 nm and 1558.3 nm has been achieved.     

Frequency-stabilized semimonolithic frequency doubler with high output power

We present a semimonolithic frequency-doubler from 1080 to 540 nm with 80% doubling efficiency and up to 849-mW output power of green light.     

Hard X-ray one dimensional nano-focusing at the SSRF using a WSi2 /Si multilayer Laue lens

The multilayer Laue lens (MLL) is a novel diffraction optics which can realize nanometer focusing of hard X-rays with high efficiency. In this paper, a 7.9 μm-thick MLL with the outmost layer thickness of 15 nm is designed based on dynamical diffraction theory. The MLL is fabricated by first depositing the depth-graded multilayer using direct current (DC) magnetron sputtering technology. Then, the multilayer sample is sliced, and both cross-sections are thinned and polished to a depth of 35-41 μm. The focusing property of the MLL is measured at the Shanghai Synchrotron Facility (SSRF). One-dimensional (1D) focusing resolutions of 205 nm and 221 nm are obtained at E=14 keV and 18 keV, respectively. It demonstrates that the fabricated MLL can focus hard X-rays into nanometer scale.