高性能ZnO纳米块体材料的制备及其拉曼光谱学特征

利用六面顶高压设备制备了高密度、低脆性、纳米级的ZnO块体材料，用MDI/JADE5 X射线衍射仪(Cu靶)和XL30S-FEG场发射扫描电子显微镜对高压样品的相组成、晶粒尺寸及微观形貌进行了表征.利用E55+FRA106/5傅里叶变换激光拉曼光谱仪通过ZnO块体样品位于50—500cm^-1之内的拉曼光谱, 研究了极性半导体纳米材料的拉曼光谱学特征.发现在极性半导体ZnO纳米块体材料中，没有出现明显的尺寸限制效应. 关键词： ZnO纳米块体 拉曼光谱 尺寸限制效应     

C波段平面异向介质设计及其后向波特性验证

提出了一种工作在C波段的新型平面结构异向介质，它除了带宽宽和损耗小外，还具有体积小、结构简单的优点，而且能够实现工作频段的平移，频率平移范围为4—20 GHz.基于电磁波由自由空间入射半无限大异向介质平板的传输和反射数据，计算出了电波在其中传播时的相速随频率的变化曲线，结果表明所讨论的异向介质确实在预想的频段上表现出后向波特性；同时利用相位观察法进一步验证了上述的后向波特性，从而肯定了异向介质的存在. 关键词： 异向介质 宽频带 小单元 后向波特性     

H原子与CO2分子碰撞的化学反应与能量转移

用时间分辨傅立叶红外发射光谱的方法对H原子与CO2分子的碰撞动力学进行了实验研究．用紫外激光光解的方法分别制备出三个不同平动能为174．7、241．0和306．2 kJ／mol的氢原子,并引发H CO2→OH CO反应．观察到了反应的产物,即振动激发的CO (v≤2)．同时也看到了在H原子与CO2分子的碰撞中发生高效的T- V能量转移．CO2的反对称伸缩模的最高振动能级为v=4．化学反应与能量转移的速率之比大约为10．     

正则带的半格结构

Petrich解决了一般带的构造定理（见[1]或[2]），在此基础上，我们将证明正则带（满足等式axya=axaya的带）的一些特征，并给出一个带为正则带或右似正规带（满足等式xya=xaya的带）的充分必要条件，这些结果是Yamada和Kimura的关于正规带（满足等式axya=ayxa的带）的结果的推广，正规带被他们描述为矩形带的强半格（见[1]或[3]）。     

Microstructure of a-SiOx:H

A set of a-SiO_x:H (0.52 <x< 1.58) films are fabricated by plasma-enhanced-chemical-vapor-deposition (PECVD) method at the substrate temperature of 250°C. The microstructure and local bonding configurations of the films are investigated in detail using micro-Raman scattering, X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy (FTIR). It is found that the films are structural inhomogeneous, with five phases of Si, Si₂O:H, SiO:H, Si₂O₃:H and SiO₂ that coexist. The phase of Si is composed of nonhydrogenated amorphous silicon (a-Si) clusters that are spatially isolated. The average size of the clusters decreases with the increasing oxygen concentration x in the films. The results indicate that the structure of the present films can be described by a multi-shell model, which suggests that a-Si cluster is surrounded in turn by the subshells of Si₂O:H, SiO:H, Si₂O₃:H, and SiO₂.     

基于半像素错位的多幅图像重建高分辨率图像技术研究

介绍了一种基于半像素错位的多幅图像重建高分辨率图像技术。分析了半像素错位的多幅图像与高分辨率图像各像素灰度值的对应关系 ,并从CCD数字化采样的角度进行了论证。同时 ,结合实际摄像机CCD结构 ,求出了高分辨率图像重建的计算公式 ,并通过实验进行了验证和完善。重建的本质是以原高分辨率图像的 4邻域平均图像为基础 ,增加一定比例的边缘细节信息 ,去接近原高分辨率图像。CCD的动态范围越大 ,图像的灰度级越多 ,那么计算误差就越小 ,图像的边缘细节信息就可以利用更多 ,重建的图像就越接近原高分辨率图像。通过实验和分析表明 ,利用半像素错位的多幅低分辨率图像重建高分辨率图像的原理是正确的 ,方案是可行的     

HeI photoelectron spectroscopic (PES) and quantum chemistry study on the dimeric compound of 2(5H) furanone

The He1 photoelectron (PE) spectra of both 2(5H) furanone and itstrans-chair-dimeric-compound (t-c-DFN) are reported. The assignment of the PES bands is made on the basis of band shapes, the PES results of the molecules which have the similar atomic groups, and the restricted Hartree-Fock (RHF) calculations for the molecules studied. From the results of both PES experimental and theoretical calculations, it is proved that the ionization potential (IPS) of the HOMO for the dimeric-compound is lower than that of the HOMO for the monomer. And the total energy computed for thet-c-DFN is the lowest in the four possible configurations of dimeric-compounds of 2(5H) furanone. Therefore the synthesis oft-c-DFN is also the easiest. Project supported by the National Natural Science Foundation of China.     

多约束下的串、并联混合系统可靠度与冗余度的优化判定模型及算法

本文给出了单目标多约束下串、并联混合系统中 ,由选取重要单元 (重要度最大的单元 )的方法 ,来提高系统可靠度的有效优化判定模型及算法 ,用同样思想给出了串、并联系统中冗余度的优化判定模型及算法     

Effects of Processing Parameters on Microstructure and Properties of Nanoscale ZrC/ZrB2 Multilayered Coatings

ZrC/ZrB2 multilayered coatings with bilayer periods of 3.5-40nm are synthesized by rf magnetron sputtering. Analyses of x-ray diffraction, scanning electron microscopy and nanoindentation indicate that multilayered coatings possess much higher hardness and greater fracture resistance than monolithic ZrC and ZrB2 coatings. A maximum hardness （41.TCPa） and a critical fracture load （73.7mN） are observed in the multilayer with A = 32 nm deposited at the substrate bias -40 V. Higher residual stress built in the ZrC layer can be released by periodic insertion of ZrB2 into the ZrC layer. A clear multilayered structure with mixed ZrB2（001）, ZrB2 （002） and ZrC （111） orientations should be responsible for the enhanced mechanical properties.     

The ordinary quiver of a weight three block of the symmetric group is bipartite

Suppose F is a field of characteristic p?5, and that B is a p-block of the symmetric group Sn of defect 3. We prove that the Ext¹-quiver of B is bipartite, with the bipartition being described in a simple way using the leg-lengths of p-hooks of partitions.