Chemical isolation of element 106 from aqueous solutions according to model experiments with short-lived tungsten isotopes

The short-lived isotopes of W and their descendants have been isolated from the products of the bombardment of¹⁴⁴Sm with²⁴Mg by a fast continuous ion-exchange method, using HF solution media. The feasibility of this method for isolation of element 106 is discussed.     

Model calculations of interface segregation in dilute systems

Using a discrete model for the segregation kinetics based on the Darken theory of diffusion and on the regular solution model (RSM), one and two dimensional simulations of interface segregation in binary and ternary systems have been performed. The aim of the calculations was to investigate the kinetics of segregation sequences in ternary systems, the segregation kinetics in discrete systems during the initial phase and finally the kinetics of surface segregation in the region of a grain boundary intersected by the surface.     

Resonance ionization spectroscopy for trace analysis and fundamental research

Resonance ionization spectroscopy (RIS) and its combination with mass spectrometry (RIMS) have grown to become powerful techniques, which offer high sensitivity as well as elemental and isotopic selectivity. The principles of RIS and RIMS are introduced; they primarily concern the analysis of the optical spectra for the choice of efficient excitation schemes and the suitable design of the experimental apparatus. Recent applications span from studies of short-lived isotopes at on-line mass separators to a wide variety of trace analysis applications for radioactive isotopes, which can range from measurements of solar neutrino flux to environmental assessment.On leave from Pacific Northwest Laboratory, Richland, USA     

ARXPS-analysis and morphology of sputtered nanocrystalline TiC/SiC coatings

ARXPS (angle resolved X-ray photoelectron spectroscopy) measurements are used to obtain informations about surfaces and grain boundaries. Data acquired from nanocrystalline carbidic hard coatings have been employed to establish structural models. Magnetron-sputtered coatings of TiC, SiC and TiC/SiC were examined. In such coatings, partly defective TiC nanocrystallites are surrounded by interfacial carbide. This excess carbon shows a binding state similar to that of doped graphite or fullerenes. X-ray amorphous SiC is found in the residue. On top of sputtered SiC coatings, less oxide and graphite is found as compared to TiC/SiC or TiC coatings.