Molecular modeling of alkyl monolayers on the Si(100)-2 x 1 surface

Molecular modeling was used to simulate various surfaces derived from the addition of 1-alkenes and 1-alkynes to Si=Si dimers on the Si(100)-2 x 1 surface. The primary aim was to better understand the interactions between adsorbates on the surface and distortions of the underlying silicon crystal due to functionalization. Random addition of ethylene and acetylene was used to determine how the addition of an adduct molecule affects subsequent additions for coverages up to one molecule per silicon dimer, that is, 100% coverage. Randomization subdues the effect that the relative positions of the adsorbates have on the enthalpy of the system. For ethylene and acetylene, the enthalpy of reaction changes less than 3 and 5 kcal/mol, respectively, from the first reacted species up to 100% coverage. As a result, a (near-)complete coverage is predicted, which is in line with experimental data. When 1-alkenes and 1-alkynes add by [2 + 2] addition, the hydrocarbon chains interact differently depending on the direction they project from the surface. These effects were investigated for four-carbon chains: 1-butene and 1-butyne. As expected, the chains that would otherwise intersect bend to avoid each other, raising the enthalpy of the system. For alkyl chains longer than four carbons, the chains are able to reorient themselves in a favorable manner, thus, resulting in a steady reduction in reaction enthalpy of about 2 kcal/mol for each additional methylene unit.     

A detailed view of the Gaussian–Lorentzian sum and product functions and their comparison with the Voigt function

The Gaussian–Lorentzian sum (GLS) and product (GLP) functions remain important in X-ray photoelectron spectroscopy (XPS) peak fitting. Here, we present a detailed view of these functions, comparing them with each other and with the Voigt function (the “LA(m)” function). First, we show the GLS, GLP, and LA(m) functions as a function of their mixing parameters, m, which reveals differences between them. We then illustrate the use of these functions to fit a series of spectra acquired at different pass energies (resolutions). Next, we show the underlying Gaussian and Lorentzian components of a series of GLS and GLP functions as a function of m, which confirms that the GLS is a simple linear combination of Gaussian and Lorentzian functions. However, one of the two functions used to make the GLP can be very wide, that is, at its extremes, one of these functions has infinite width. We then discuss a plot of the areas of the GLS, GLP, and LA(m) functions as a function of m, which reveals the expected, linear increase in area of the GLS, but nonlinear changes in the areas of the other two functions. Finally, to better understand them, we fit these functions to each other. These results indicate that the GLS and GLP better match the LA(m) function at lower and higher values of the mixing parameter, respectively.     

Heterogeneous electron-transfer kinetics for ruthenium and ferrocene redox moieties through alkanethiol monolayers on gold

The standard heterogeneous electron-transfer rate constants between substrate gold electrodes and either ferrocene or pentaaminepyridine ruthenium redox couples attached to the electrode surface by various lengths of an alkanethiol bridge as a constituent of a mixed self-assembled monolayer were measured as a function of temperature. The ferrocene was either directly attached to the alkanethiol bridge or attached through an ester (CO(2)) linkage. For long bridge lengths (containing more than 11 methylene groups) the rate constants were measured using either chronoamperometry or cyclic voltammetry; for the shorter bridges, the indirect laser induced temperature jump technique was employed to measure the rate constants. Analysis of the distance (bridge length) dependence of the preexponential factors obtained from an Arrhenius analysis of the rate constant versus temperature data demonstrates a clear limiting behavior at a surprisingly small value of this preexponential factor (much lower than would be expected on the basis of aqueous solvent dynamics). This limit is independent of both the identity of the redox couple and the nature of the linkage of the couple to the bridge, and it is definitely different (smaller) from the limit derived from an equivalent analysis of the rate constant (versus temperature) data for the interfacial electron-transfer reaction through oligophenylenevinylene bridges between gold electrodes and ferrocene. There are a number of possible explanations for this behavior including, for example, the possible effects of bridge conformational flexibility upon the electron-transfer kinetics. Nevertheless, conventional ideas regarding electronic coupling through alkane bridges and solvent dynamics are insufficient to explain the results reported here.     

Reevaluating the conventional approach for analyzing spectroscopic ellipsometry psi/delta versus time data. Additional statistical rigor may often be appropriate

A standard approach for confirming the stability of thin films consists of probing them over an extended period of time by spectroscopic ellipsometry (SE) and plotting the resulting psi (Ψ) and delta (Δ) values versus time at a few selected wavelengths across the spectral range. In general, if Ψ and Δ remain constant with time, or essentially constant, the material is deemed to be stable. Here, we suggest that in addition to this ‘eyeball’ approach, a statistical analysis of the data may often be appropriate. In particular, we reevaluate a set of Ψ/Δ versus time data from a sputtered bismuth–tellurium–selenium film that appear to remain essentially constant by the traditional approach, subjecting it to a distance analysis, a principal components analysis, and a cluster analysis. The application of these statistical tools, especially to range‐selected data (300–989 nm), reveals previously unobserved changes, suggesting that either the film in question or the analytical approach itself had changed during the course of the measurements. Weighted distance formulas for Ψ and Δ were also applied so that the data did not need to be range selected for the key effects to be observed. The distance approach was similarly applied (i) to a set of SE data from a thin carbon film, which revealed consistent changes in the material that were not apparent in the standard approach, and (ii) to samples that were deliberately contaminated or improperly measured. Thus, we recommend a more rigorous, statistical approach to the analysis of SE Ψ/Δ versus time data. Copyright © 2016 John Wiley & Sons, Ltd.     

Spectroscopic ellipsometry of SU‐8 photoresist from 190 to 1680 nm (0.740–6.50 eV)

SU‐8 is an important, epoxy‐based, negative photoresist that can create high aspect ratio features. Spectroscopic ellipsometry (SE) is a nondestructive analytical technique that can be performed in the open air. In this study, reflection and transmission SE measurement data were combined to model the optical function of SU‐8 photoresist. The data were fit using three different models: (i) a B‐spline model, (ii) a four‐Gaussian oscillator model with an ultraviolet (UV) and an infrared (IR) pole, and (iii) a Cody–Lorentz model with three additional Gaussian oscillators. All three models successfully fit the data, where the B‐spline model showed the lowest mean squared error. In situ SE data were also collected and fitted to follow possible changes in the optical properties of the SU‐8 during its development. Time‐dependent density functional theory (TD‐DFT) modeling of a complete SU‐8 monomer is qualitatively and quantitatively consistent with the measured optical function.