Statistical properties of the sum of two partially correlated speckle patterns

The probability density function and average contrast of the sum of two speckle patterns produced with various intensity ratios and correlation conditions have been experimentally investigated. The experimental results are compared with the theoretical ones obtained by Barakat and Goodman. Comparison shows excellent agreement between the experimental and theoretical results.     

Very fast magic angle spinning (1)H-(14)N 2D solid-state NMR: sub-micro-liter sample data collection in a few minutes

Substantial resolution and sensitivity enhancements of solid-state (1)H detected (14)N HMQC NMR spectra at very fast MAS rates up to 80 kHz, in a 1mm MAS rotor, are presented. Very fast MAS enhances the (1)H transverse relaxation time and efficiently decouples the (1)H-(14)N interactions, both effects leading to resolution enhancement. The micro-coil contributes to the sensitivity increase via strong (14)N rf fields and high sensitivity per unit volume. (1)H-(14)N HMQC 2D spectra of glycine and glycyl-L-alanine at 70 kHz MAS at 11.7 T are observed in a few minutes with a sample volume of 0.8 μL.     

Topotactic Conversion of β‐Helix‐Layered Silicate into AST‐Type Zeolite through Successive Interlayer Modifications

AST‐type zeolite with a plate morphology can be synthesized by topotactic conversion of a layered silicate (β‐helix‐layered silicate; HLS) by using N,N‐dimethylpropionamide (DPA) to control the layer stacking of silicate layers and the subsequent interlayer condensation. Treatment of HLS twice with 1) hydrochloric acid/ethanol and 2) dimethylsulfoxide (DMSO) are needed to remove interlayer hydrated Na ions and tetramethylammonium (TMA) ions in intralayer cup‐like cavities (intracavity TMA ions), both of which are introduced during the preparation of HLS. The utilization of an amide molecule is effective for the control of the stacking sequence of silicate layers. This method could be applicable to various layered silicates that cannot be topotactically converted into three‐dimensional networks by simple interlayer condensation by judicious choice of amide molecules.     

Effect of substrate orientation on the defect-induced bound exciton emissions in GaAs grown by molecular beam epitaxy

The dependence of photoluminescence (PL) spectra at 2 K on the substrate orientation is reported for GaAs grown by molecular beam epitaxy (MBE). Samples investigated are GaAs grown on (n11)A- and (n11)B-oriented substrates where n is 2, 3, 5 and 9, and those on (321)A- (110)B- and (100)A-oriented ones. It was demonstrated that emissions denoted by defect-induced bound excitons (DIBE) present strong crystal orientation dependence. In the (n11) series, DIBE was enhanced peculiarly in (211)A and (311)A substrates and two sharp emissions denoted by t^* and v₃ were specifically observed there, but they were completely quenched for the (211)B substrate. When n exceeds 3, DIBE was observed ubiquitously in (n11)A and (n11)B substrates. The (321)A substrate indicated a most idiosyncratic DIBE with a strong enhancement of t^* and v₃. These results show that the spectral features pertinent to DIBE fully reflect the whole stacking process of impinging molecular beams on the growth front which is governed by the surface structure inherent to the surface dangling bonds of the substrate.     

Effect of surface roughness on the statistical distribution of image speckle intensity

An experimental investigation is made of the effect of surface roughness on the statistical distribution of image speckle intensity. A speckle pattern is formed by spatially coherent light at the image plane of an object having some surface roughness and its statistical properties are investigated. It is found that the contrast of the speckle is related to the surface roughness. By this relation, a new technique for the measurement of surface roughness is proposed.     

Statistical properties of the sum of partially-developed,correlated speckle patterns

General formulas for the average contrast and probability density function of the sum ofN partially-developed, correlated speckle patterns have been theoretically derived. These two parameters characterizing the statistical properties of added speckle patterns have been actually evaluated for the sum of two partially-developed, correlated speckle patterns and shown in figures as a function of the surface roughness of illuminated objects, the wavelength difference of two illuminating lights, and the number of scattering cells within the illuminated area of objects.