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H. W. Wenz W. J. Lichtenberg H. Katterwe 《Fresenius' Journal of Analytical Chemistry》1991,341(3-4):155-165
Summary When a shot is fired, the projectile and the cartridge case are released from the weapon, as well as components of the priming charge and propellant, the so-called powder-gunshot residues. In order to solve firearm offences, it is therefore very important to determine the topography of trace-bearing areas on the bullet and the cartridge case, as well as the chemical composition of gunshot residue particles. Gunshot residue particles are made visible with the scanning electron microscope (SEM) and are analysed by means of energy-dispersive X-ray spectroscopy (EDXS) and lately also by means of wavelength-dispersive X-ray spectroscopy (WDXS). In addition to this, analyses of these particles are displayed by means of Auger electron spectroscopy (AES) and secondary ion mass spectroscopy (SIMS) and depth profiles are prepared. To determine the local distributions of gunshot residue elements with regard to their quantity, the direct Zeeman atomic absorption spectroscopy (DZ-AAS) is employed. Besides the determination of the chemical composition, the topography of the trace-bearing areas on the bullet and cartridge case plays an important part. For the detection of these surfaces, light optical and electron-optical methods are employed. Moreover, the use of opto-electronical testing systems has been attracting more and more attention recently. 相似文献
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R. Arnaldi R. Averbeck K. Banicz J. Castor B. Chaurand C. Cicalo A. Colla P. Cortese S. Damjanovic A. David A. De Falco A. Devaux A. Drees L. Ducroux H. En’yo A. Ferretti M. Floris A. Foerster P. Force N. Guettet A. Guichard H. Gulkanian J. Heuser M. Keil L. Kluberg J. Lozano C. Lourenço F. Manso A. Masoni P. Martins A. Neves H. Ohnishi C. Oppedisano P. Parracho P. Pillot G. Puddu E. Radermacher P. Ramalhete P. Rosinsky E. Scomparin J. Seixas S. Serci R. Shahoyan P. Sonderegger H.J. Specht R. Tieulent G. Usai R. Veenhof H.K. Wöhri 《The European Physical Journal C - Particles and Fields》2007,49(1):235-241
The NA60 experiment at the CERN SPS has studied low-mass muon pairs in 158 A GeV In–In collisions. A strong excess of pairs
is observed above the yield expected from neutral meson decays. The unprecedented sample size close to 400000 events and the
good mass resolution of about 2% made it possible to isolate the excess by subtraction of the decay sources. The shape of
the resulting mass spectrum shows some non-trivial centrality dependence, but is largely consistent with a dominant contribution
from π+π-→ϱ→μ+μ- annihilation. The associated ϱ spectral function exhibits considerable broadening, but essentially no shift in mass. The
pT-differential mass spectra show the excess to be much stronger at low pT than at high pT. The results are compared to theoretical model predictions; they tend to rule out models linking hadron masses directly to
the chiral condensate.
PACS 25.75.-q; 12.38.Mh; 13.85.Qk 相似文献
957.
R. Rehm M. Walther J. Schmitz J. Fleißner F. Fuchs J. Ziegler W. Cabanski 《Opto-Electronics Review》2006,14(1):19-24
The first fully operational mid-IR (3–5 μm) 256×256 IR-FPA camera system based on a type-II InAs/GaSb short-period superlattice
showing an excellent noise equivalent temperature difference below 10 mK and a very uniform performance has been realized.
We report on the development and fabrication of the detecor chip, i.e., epitaxy, processing technology and electro-optical
characterization of fully integrated InAs/GaSb superlattice focal plane arrays. While the superlattice design employed for
the first demonstrator camera yielded a quantum efficiency around 30%, a superlattice structure grown with a thicker active
layer and an optimized V/III BEP ratio during growth of the InAs layers exhibits a significant increase in quantum efficiency.
Quantitative responsivity measurements reveal a quantum efficiency of about 60% for InAs/GaSb superlattice focal plane arrays
after implementing this design improvement.
The paper presented there appears in Infrared Photoelectronics, edited by Antoni Rogalski, Eustace L. Dereniak, Fiodor F. Sizov, Proc. SPIE Vol. 5957, 595707 (2005). 相似文献
958.
A. Konjhodzic A. Adamczyk F. Vagizov Z. Hasan E E. Alp W. Sturhahn Jiyong Zhao J J. Carroll 《Hyperfine Interactions》2006,170(1-3):83-89
With the decrease in size of devices, rapid characterization of nano-devices is an inevitable necessity. It is shown that Mössbauer spectroscopy using synchrotron radiation from the advanced photon source provides such a tool of investigation. Results are presented and compared for conventional Mössbauer and Nuclear Forward Scattering for 151Eu-doped magnesium sulfide as an example, especially at low concentrations. 相似文献
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