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Very thin samples show proportionality between the intensity and the weight per unit area of the analyte. Matrix effects do not exist. The matrix effects of very thick samples suitably can be corrected by multiple regression according to Eq. (1). Between these two kinds of samples the intermediate ones are situated with the intensity of the analyte as a function of the weight per unit area of the sample as an additional parameter of correction.
It was shown that these samples can also be corrected by multiple regression without knowing the weight per unit area of the samples by using the weight per unit area of the analyte instead of its concentration according to Eq. (5). This was demonstrated by calculation with simulated standards.
In addition to the described effects the correction program Eq. (5) is able to correct for the influences of dust particle sizes and their depth distribution in the filter.
相似文献The residual matrix in x-ray spectrometry
Summary The usual functions for the matrix correction presume that the concentrations of all matrix elements are known. But in practice one has frequently to deal with samples which contain an unknown residual matrix. If the concentrations of the matrix elements are used to carry out the correction the influence of this residual matrix can be governed by introducing a quadratic term of the analyte's intensity into the correcting function. It is also possible to use the intensities of the matrix elements as starting-point of the matrix correction. In this case one can introduce the intensity of a suitable chosen scattered radiation into the correcting function in order to correct for the residual matrix. The theoretical foundations of these procedures are discussed.相似文献