There is great interest in the generation of energy-tunable, bright, short-pulse X/γ-ray sources, which are required in various research fields. Laser–Compton scattering (LCS) is considered to be one of the most promising methods to implement this kind of X/γ-ray source. At the 100-MeV LINAC of the Shanghai Institute of Applied Physics, a 2-J, 8-ns, 1064-nm, Q-switched Nd:YAG laser is brought to a slanting collision at 40° (44°) with an 112-MeV, 0.9-ns (rms) relativistic electron beam. We measured the LCS X-ray energy spectrum with a peak energy of 31.73±0.22stat±1.64syst keV and a peak width (rms) of 0.74±0.26stat±0.03syst keV. This preliminary investigation was carried out to understand the feasibility of developing an energy-tunable X/γ-ray source. Based on this study, the future Shanghai Laser Electron Gamma Source (SLEGS) at the Shanghai Synchrotron Radiation Facility (SSRF) can be constructed to be not only an energy-tunable γ-ray source by guiding the laser incident angle from laser–Compton scattering, but also a high flux (~1010 photons/s or even higher) γ-ray source by adding a laser super-cavity. 相似文献
Narrow-line Seyfert 1 (NLS1) galaxies are believed to harbor low-mass black holes accreting at high rates, and they are therefore important targets when studying the nature of black hole growth, galaxy evolution, and accretion physics. We have rigorously studied the physical properties of a sample of NLS1 galaxies. We briefly review previous findings and present new results, including: (1) The locus of NLS1 galaxies on the MBH-σ plane, which we find to follow the relation of non-active galaxies after removing objects obviously dominated by outflows. (2) The presence of “blue outliers” which hint at extreme outflows as they would be predicted from merger models. (3) More subtle evidence for winds and outflows across the whole NLS1 population. (4) New correlations and trends which link black hole mass, Eddington ratio and physical parameters of the emission-line region. A new element is added to the eigenvector 1 space based on a principal component analysis, which aims at identifying the main drivers of AGN correlation properties.
This paper investigates the major structural parameters, such as crystal quality and strain state of (001)-oriented GaN thin films grown on sapphire substrates by metalorganic chemical vapour deposition, using an in-plane grazing incidence x-ray diffraction technique. The results are analysed and compared with a complementary out-of-plane x- ray diffraction technique. The twist of the GaN mosaic structure is determined through the direct grazing incidence t of (100) reflection which agrees well with the result obtained by extrapolation method. The method for directly determining the in-plane lattice parameters of the GaN layers is also presented. Combined with the biaxial strain model, it derives the lattice parameters corresponding to fully relaxed GaN films. The GaN epilayers show an increasing residual compressive stress with increasing layer thickness when the two dimensional growth stage is established, reaching to a maximum level of-0.89 GPa. 相似文献
Effect coatings have the unique property of large change of appearance under different viewing conditions. This results in quality control problems of related products. In this letter, samples of metallic panels with effect coatings are visually assessed and measured. Based on experimental results, we propose formulae to predict precisely the total differences of effective samples in terms of variations in color, coarseness, and glint. Under diffused illumination, the total difference formula includes color difference and coarseness difference. Under directional illumination, the total difference formula includes color difference and glint difference. 相似文献