The mechanism of emission in the red photoluminescence band of porous silicon

Porous silicon (PS) exhibits several photoluminescence (PL) bands, whose spectral position and intensity depend strongly on the actual conditions of preparation of PS, its treatment, and subsequent use. The PS PL band peaking at about 1.8 eV and usually assigned to the intrinsic emission of silicon nanocrystals was studied. It was shown that the temperature-induced variation of the PL kinetics in the 80 to 300-K interval follows a complex pattern and depends noticeably on the actual point on the band profile. The temperature behavior of PL decay in the 1.8-eV band is determined by the electron-hole recombination rate within a nanocrystal and the cascade carrier transitions from small to large nanocrystals, with an attendant decrease in energy.     

A fast method to measure the thickness of removed layer from etching of SSNTD based on EDXRF

Solid state nuclear track detectors are commonly used for measurements of concentrations of radon gas and/or radon progeny. All these measurements depend critically on the thickness of the removed layer during etching. However, the thickness of removed layer calculated using the etching period does not necessarily provide a sufficiently accurate measure of the thickness. For example, the bulk etch rate depends on the strength of stirring during etching for the LR 115 detector. We propose here to measure the thickness of the removed layer by using energy-dispersive X-ray fluorescence spectrometry. In the present work, a reference silver nitrate pellet is placed beneath the LR 115 detector, and the fluorescence X-ray intensity for silver is then measured. We have found a linear relationship between the X-ray intensity and the thickness of the removed layer for LR 115 detector. This provides a fast method to measure the thickness of removed layer from etching of LR 115 detector. However, this method was found to be inapplicable for the CR-39 detector. Therefore, alternative methods have yet to be explored for the CR-39 detector.     

Characterizations of Tb:Zn2SiO4 films on silicon wafer prepared by sol-gel dip-coating and solid-phase reaction

Terbium-doped Zn_2SiO_4 films were successfully prepared on Si wafers by a simple sol-gel dip-coating and solid-phase reaction method of ZnO and SiO_2. X-ray diffraction (XRD) and UV－Vis absorption results revealed that films processed below 850℃ were ZnO in wurzite structure, and films processed above 850℃ were Zn_2SiO_4 in wellimite structure. Photoluminescence measurements of the Tb-doped Zn_2SiO_4 films showed two strong emission bands at 490 and 545nm. The photoluminescence lifetime was 4.6ms.     

Measurement of the differential cross section and of the tensor and vector analyzing powers for the fragmentation of 4.5-GeV/c deuterons on beryllium in the reaction involving proton emission at an angle of 80 mrad

The invariant differential cross section, the tensor analyzing power A _yy , and the vector analyzing power A _y for the reaction ⁹Be(d, p)X are measured at an initial deuteron momentum of 4.5 GeV/c and a proton detection angle of about 80 mrad. The data obtained for the differential cross section are consistent with the results of measurements at 3.5 and 5.78 GeV/c and a proton emission angle of 2.5°. The values found for the tensor analyzing power A _yy are compared with similar data obtained previously for the deuteron-fragmentation process occurring on a carbon target at various values of the initial deuteron momentum and leading to proton emission at zero angle. The data on the differential cross section for the reaction ⁹Be(d, p)X can be satisfactorily described within the relativistic impulse approximation by using standard deuteron wave functions; however, the approach based on this conceptual framework proves to be inadequate in dealing with data on the tensor analyzing power. These results indicate that it is necessary either to change the method for describing the relativistic deuteron or to take into account additional mechanisms.     

Accuracy analysis of airborne gravimeter calibration using repeated flight paths

Some possible errors in determining the gravity anomalies are discussed. Such errors may be caused by an inaccurate calibration of the gravimeter used in an airborne survey system. An approach based on wavelet decompositions is proposed for its additional calibration with the use of flight data obtained during repeated flights.     

A quality criterion for visual tracking during nystagmus

The aim of this study is to construct a quantitative characteristic for the degree of gaze stabilization on a visual target with consideration of physiological constraints. A quality criterion for visual tracking during optokinetic vestibulocervical nystagmus is proposed. The index of imaginary tracking during rotation in the dark allows one to speak of a difference in the image stabilization quality between a healthy person and a patient. Experimental nystagmus data are used to calculate the quality index of visual tracking and the index of imaginary tracking.     

Chlorination of aromatic substrates catalyzed by the phthalocyanine complexes

The chlorination of benzene, toluene, and o-xylene with molecular chlorine in the presence of the phthalocyanine complexes of different structures was studied. The transformations of the catalysts during the reaction were investigated. Published in Russian in Izvestiya Akademii Nauk. Seriya Khimicheskaya, No. 8, pp. 1644–1647, August, 2008.     

4-Functionally-substituted 3-heterylpyrazoles: XIX. 3-aryl-4-(5-isoxazolyl)pyrazoles

Oximes of 4-(4-pyrazolyl)-3-buten-2-onees obtained by successive reaction of 3-aryl-4-formylpyrazoles with acetone and hydroxylamine at the treatment with iodine suffered an oxidative cyclization yielding 3-aryl-4-(5-isoxazolyl)pyrazoles.