Quantitative electron probe microanalysis for the characterization of thin carbon-boron layers in fusion devices

Summary The first wall of the fusion device TEXTOR at the Forschungszentrum Jülich has been coated in situ with an amorphous hydrogen rich carbon/boron film (a-C/B:H) which reduces plasma impurities caused by the plasma surface interaction. The results of the coating process of the 35 m² large inner wall surface have been controlled by a recently developed modification of the quantitative electron probe microanalysis, which has been applied to 12 samples from specified positions inside the tokamak. The quantification itself is based on a Monte Carlo simulation of electron trajectories providing very accurate results for X-ray intensities emitted by elements present in the electron bombarded sample. The Monte Carlo results are used in the present work to calibrate the measured X-ray intensities emitted by boron and carbon from the a-C/B:H layers deposited on pure silicon substrates. As a result the total deposited mass of the layer per area unit as well as the composition of the layers (except hydrogen) could be determined very accurately. The relative errors were less than 7%. The limit of detectability were found to be in the range of one monolayer for boron as well as for carbon.     

Analysis of semiconducting materials by high-resolution radiofrequency glow discharge mass spectrometry

The analytical capabilities of a high-resolution mass spectrometer in combination with a 13.56 MHz glow discharge ion source for the analysis of semiconducting materials (silicon carbide and gallium arsenide) were studied. It was shown that single positively charged ions of sample material have about 10 eV higher average energy than the ions of the discharge and residual gas. Therefore effective energy separation of the ions of analyte from the ions of the discharge and residual gas was achieved by adjusting the ion transfer optics (breadth and position of energy slit), which improves the analytical capabilities of the developed method.Some analytical applications are presented to illustrate the performance of r.f. GDMS for the bulk analysis of semiconducting materials. The results of the trace element analysis of gallium arsenide and silicon carbide samples are compared with data of independent methods (LIMS, ICP-AES, SIMS).Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthdayOn leave from the Institute of Inorganic Chemistry, 630090 Novosibirsk, Russia     

Banach spaces of distributions having two module structures

After a discussion of a space of test functions and the corresponding space of distributions, a family of Banach spaces (B, ∥ ∥_B) in standard situation is described. These are spaces of distributions having a pointwise module structure and also a module structure with respect to convolution. The main results concern relations between the different spaces associated to B established by means of well-known methods from the theory of Banach modules, among them B₀ and $\text{B}\text{?}$, the closure of the test functions in B and the weak relative completion of B, respectively. The latter is shown to be always a dual Banach space. The main diagram, given in Theorem 4.7, gives full information concerning inclusions between these spaces, showing also a complete symmetry. A great number of corresponding formulas is established. How they can be applied is indicated by selected examples, in particular by certain Segal algebras and the A_p-algebras of Herz. Various further applications are to be given elsewhere.     

Jetmetriken und hyperbolische Geometrie

Ohne ZusammenfassungHerrn E. Heinz zum 65. Geburtstag gewidmet     

Isotrope Unterräume rationaler quadratischer Formen

Ohne ZusammenfassungDiese Arbeit wurde während eines Aufenthaltes von Schmidt in der Bundesrepublik Deutschland als Preisträger der Alexander von Humboldt-Stiftung geschrieben.     

On the maximum cardinality search lower bound for treewidth

The Maximum Cardinality Search (MCS) algorithm visits the vertices of a graph in some order, such that at each step, an unvisited vertex that has the largest number of visited neighbours becomes visited. A maximum cardinality search ordering (MCS-ordering) of a graph is an ordering of the vertices that can be generated by the MCS algorithm. The visited degree of a vertex v in an MCS-ordering is the number of neighbours of v that are before v in the ordering. The visited degree of an MCS-ordering ψ of G is the maximum visited degree over all vertices v in ψ. The maximum visited degree over all MCS-orderings of graph G is called its maximum visited degree. Lucena [A new lower bound for tree-width using maximum cardinality search, SIAM J. Discrete Math. 16 (2003) 345-353] showed that the treewidth of a graph G is at least its maximum visited degree.We show that the maximum visited degree is of size O(logn) for planar graphs, and give examples of planar graphs G with maximum visited degree k with O(k!) vertices, for all k∈N. Given a graph G, it is NP-complete to determine if its maximum visited degree is at least k, for any fixed k?7. Also, this problem does not have a polynomial time approximation algorithm with constant ratio, unless P=NP. Variants of the problem are also shown to be NP-complete.In this paper, we also propose some heuristics for the problem, and report on an experimental analysis of them. Several tiebreakers for the MCS algorithm are proposed and evaluated. We also give heuristics that give upper bounds on the value of the maximum visited degree of a graph, which appear to give results close to optimal on many graphs from real life applications.     

On Lattices of Uniformities

We study lattice theoretical properties of lattices of uniformities such as modularity, distributive laws and the existence of (relative) complements. For this the concepts of permutable uniformities (see Definition 3.1) and independent uniformities (see Definition 4.1) are important. Moreover, we show that e.g. the lattice of all lattice uniformities on a lattice L is a closed sublattice of the lattice of all uniformities on L.     

Bias of the structural quasi-score estimator of a measurement error model under misspecification of the regressor distribution

In a structural measurement error model the structural quasi-score (SQS) estimator is based on the distribution of the latent regressor variable. If this distribution is misspecified, the SQS estimator is (asymptotically) biased. Two types of misspecification are considered. Both assume that the statistician erroneously adopts a normal distribution as his model for the regressor distribution. In the first type of misspecification, the true model consists of a mixture of normal distributions which cluster around a single normal distribution, in the second type, the true distribution is a normal distribution admixed with a second normal distribution of low weight. In both cases of misspecification, the bias, of course, tends to zero when the size of misspecification tends to zero. However, in the first case the bias goes to zero in a flat way so that small deviations from the true model lead to a negligible bias, whereas in the second case the bias is noticeable even for small deviations from the true model.