87.
Thin antimony films have been epitaxially deposited at 350K onto cleavage surfaces of mica at different residual gas pressures
between 10
−5 and 10
−9 torr, and their resistivity ∂ measured as a function of film thickness
d≦500? at temperatures
T=110K and
T=300K. The ∂(
d) characteristics of films deposited at residual gas pressures of about 10
−6 torr with condensation rates of about 1?/s showed generally decreasing slopes as film thicknesses increased, but irregularities
in detail. The ∂(
d) characteristics of films deposited at 10
−8 torr with the same condensation rate decreasing with increasing
d, too, show no such irregularities but very small regular variations of ∂(
d) with constant oscillation length Δ
d between the maxima, and decreasing amplitudes with increasing
d. These variations are better recognizable in a modified ∂(
d) graph. We tend to interprete these variations by the quantum size effect as we found oscillation lengths and amplitudes
compatibel with theory.
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