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971.
T. A. Zhakatakev 《Journal of Applied Mechanics and Technical Physics》1993,34(4):535-537
Translated from Prikladnaya Mekhanika i Tekhnicheskaya Fizika, No. 4, pp. 97–99, July–August, 1993. 相似文献
972.
A. M. Osharin 《Radiophysics and Quantum Electronics》1998,41(4):295-300
Attenuation of millimeter waves in dry snowfalls is numerically simulated with allowance for the actual shape of snowflakes.
It is shown that for moderate-intensity snowfalls the values of attenuation cross-sections averaged over the snowflake orientations
are well approximated by power-law function depending on the equivalent diameter of the snowflakes. This allows us to obtain
an analytical expression for the attenuation coefficient of a plane electromagnetic wave by snowfall for size distributions
of particles of the gamma-distribution type and its modifications.
Radiophysical Research Institute, Nizhny Novgorod, Russia. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Radiofizika,
Vol. 41, No. 4, pp. 446–455, April, 1998. 相似文献
973.
A. S. Dmitriev 《Radiophysics and Quantum Electronics》1998,41(12):1013-1021
The chaotic synchronization phenomenon is studied from the information point of view. Synchronization of a chaos receiver
by a chaos source is considered as copy recovery of the chaotic signal transmitted by the source. The main idea of this paper
is to show that the necessary condition of chaotic synchronization is not the level of physical action of one system on another
but the transmission of a certain volume of information on the chaotic process and, therefore, the capacity of the “communication
channel” between the source and the receiver.
This work was presented at the Summer Workshop “Dynamic Days” (Nizhny Novgorod, June 30–July 2, 1998).
Institute of Radioengineering and Electronics of the Russian Academy of Sciences, Moscow, Russia. Translated from Izvestiya
Vysshikh Uchebnykh Zavedenii, Radiofizika, Vol. 41, No. 12, pp. 1497–1509, December, 1998. 相似文献
974.
J.P. Contour A. Défossez D. Ravelosona A. Abert P. Ziemann 《Zeitschrift für Physik B Condensed Matter》1996,100(2):185-190
An energy model has been used to calculate the critical thickness h c of YBaCuO thin films and YBaCuO based superlattices within an isotropic or anisotropic approximation. The critical thickness of single layers calculated from the anisotropic model (16 nm) is in good agreement with the previously published experimental values which are spread out from 4 to 20 nm. In the case of superlattices, relaxation appears to be governed by the critical thickness of the elementary sub-layers and is then better evaluated through the calculation performed for YBaCuO single layers. XRD measurements on YBa2Cu3O7/PrBa2Cu3?xGaxO7 superlattices grown on {100{ SrTiO3 have evidenced a tetragonal stress in the YBaCuO ab plane which remains expanded when the YBaCuO elementary layer thickness is lower than 4.8 nm (4 YBaCuO cells). However the critical temperature of the shortest period superlattices is only slightly affected by this expanded stress in contrast to the effect of an elastic stress externally applied along the ab plane of YBaCuO thin films. 相似文献
975.
976.
V. A. Alimov 《Radiophysics and Quantum Electronics》1995,38(11):727-730
We compare the computational possibilities of the radio-wave refraction-scattering method (RWRSM) and the parabolic-equation method (PEM) in determining the statistical characteristics of radio waves in a medium with large-scale inhomogeneities. It is shown that on the whole the applicability limits of the RWRSM are similar to the corresponding limits of the PEM. However, unlike the PEM, the RWRSM makes it possible, in a number of cases, to use simple means to solve radio-wave-refraction problems in a thick layer with large-scale inhomogeneities.Radiophysical Research Institute, Nizhny Novgorod. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Radiofizika, Vol. 38, No. 11, pp. 1118–1123, November, 1995. 相似文献
977.
978.
P. V. Rogovskii S. L. Panasyuk A. A. Evstratov S. I. Kol'tsov 《Theoretical and Experimental Chemistry》1993,28(3):220-223
ESR shows that V(IV) may occur in isolated or interacting vanadium-oxygen groups on the surfaces of catalytically active P-V and Ti-V-bearing silica gels; there is a relationship between the V(IV) content and the phthalic anhydride selectivity in the oxidation of o-xylene.Translated from Teoreticheskaya i Éksperimental'naya Khimiya, Vol. 28, No. 3, pp. 277–282, May–June, 1992. 相似文献
979.
980.