全文获取类型
收费全文 | 215227篇 |
免费 | 1773篇 |
国内免费 | 627篇 |
专业分类
化学 | 117923篇 |
晶体学 | 3270篇 |
力学 | 8349篇 |
综合类 | 6篇 |
数学 | 23305篇 |
物理学 | 64774篇 |
出版年
2020年 | 1970篇 |
2019年 | 2263篇 |
2018年 | 3205篇 |
2017年 | 3113篇 |
2016年 | 4269篇 |
2015年 | 2371篇 |
2014年 | 3818篇 |
2013年 | 9260篇 |
2012年 | 6891篇 |
2011年 | 8434篇 |
2010年 | 6071篇 |
2009年 | 5921篇 |
2008年 | 8136篇 |
2007年 | 8206篇 |
2006年 | 7629篇 |
2005年 | 6936篇 |
2004年 | 6166篇 |
2003年 | 5641篇 |
2002年 | 5497篇 |
2001年 | 5939篇 |
2000年 | 4684篇 |
1999年 | 3470篇 |
1998年 | 3007篇 |
1997年 | 3033篇 |
1996年 | 2823篇 |
1995年 | 2319篇 |
1994年 | 2419篇 |
1993年 | 2450篇 |
1992年 | 2595篇 |
1991年 | 2657篇 |
1990年 | 2559篇 |
1989年 | 2533篇 |
1988年 | 2463篇 |
1987年 | 2434篇 |
1986年 | 2357篇 |
1985年 | 3037篇 |
1984年 | 3194篇 |
1983年 | 2559篇 |
1982年 | 2827篇 |
1981年 | 2703篇 |
1980年 | 2503篇 |
1979年 | 2718篇 |
1978年 | 2833篇 |
1977年 | 2856篇 |
1976年 | 2832篇 |
1975年 | 2687篇 |
1974年 | 2665篇 |
1973年 | 2810篇 |
1972年 | 1875篇 |
1967年 | 1830篇 |
排序方式: 共有10000条查询结果,搜索用时 15 毫秒
921.
The mechanism of X-ray waveguide-resonance propagation or the radiation superstream model, which can become the ground of X-ray nanophotonics, is discussed briefly. Some attention is devoted to features consideration of the simplest devices characterized by the waveguide-resonance transportation of X-ray beams. The experimental data showing the user possibilities of a simplest waveguide-resonators application for diffractometry are presented. We discuss the main reasons to improve the metrological characteristics for total reflection X-ray fluorescence (TXRF) analytical method in case when the target exciting beam is formed by a waveguide-resonator. Some problems appearing during the waveguide-resonator application are formulated. 相似文献
922.
J. Gañán J.F. González C.M. González-García A. Ramiro E. Sabio S. Román 《Applied Surface Science》2006,252(17):5988-5992
In this work the results obtained in the preparation and characterization of carbons made from almond tree pruning by non-catalytic and catalytic gasification (using K and Co) with air are analyzed and discussed. The main aim was to obtain high quality activated carbons at the lowest possible cost. The variables studied have been the temperature (190-260 °C) and the time (1-10 h) in non-catalytic gasification and the influence of the catalyst type (K and Co, 1 wt.% referred to cation, at 190 °C and 1 h) and the time (1-4 h) in catalytic gasification with Co at 190 °C. The air flow rate used in all the series was 167 cm3 min−1. In non-catalytic gasification the reaction normalized rate versus the conversion degree was maintained until a conversion value of 10% for the experiment made at 260 °C since, at lower temperatures, this rate drops quickly for low conversion values. The N2 adsorption isotherms for the carbons of this series resemble type I, although there is an increase of N2 adsorbed volume at relatively high pressures. A temperature rise produced an increase of the carbon porosity and BET specific surface (116-469 m2 g−1). The activation time has a positive effect on the N2 volume adsorbed by the carbons. The isotherms shapes were similar to those previously commented. A concentration equal to 1 wt.% was used to study the influence of the catalyst type. Under the studied experimental conditions, Co drives to a bigger porosity development than K, although with both catalysts a very similar pore size distribution is obtained. The activation time, in the gasifications catalyzed with Co, gives rise to a very important porosity development in the carbons. This produces a strong increase of the carbon specific surface area with very high values in the 4 h experiment, in which a BET specific surface of 959 m2 g−1 was obtained. 相似文献
923.
S. Christoulakis M. Suchea E. Koudoumas N. Katsarakis G. Kiriakidis 《Applied Surface Science》2006,252(15):5351-5354
Transparent zinc oxide (ZnO) thin films with a thickness from 10 to 200 nm were prepared by the PLD technique onto silicon and Corning glass substrates at 350 °C, using an Excimer Laser XeCl (308 nm). Surface investigations carried out by atomic force microscopy (AFM) and X-ray diffraction (XRD) revealed a strong influence of thickness on film surface topography. Film roughness (RMS), grain shape and dimensions correlate with film thickness. For the 200 nm thick film, the RMS shows a maximum (13.9 nm) due to the presence of hexagonal shaped nanorods on the surface. XRD measurements proved that the films grown by PLD are c-axis textured. It was demonstrated that the gas sensing characteristics of ZnO films are strongly influenced and may be enhanced significantly by the control of film deposition parameters and surface characteristics, i.e. thickness and RMS, grain shape and dimension. 相似文献
924.
925.
926.
927.
928.
929.
930.