Ordering of structural vacancies in vanadium monoxide of substoichiometric composition

The order-disorder phase transition in vanadium monoxide of substoichiometric compositions VO_y has been studied for the first time in situ by the Faraday method with a pendulum magnetic balance of the Domenically type. A minimum is found on the temperature dependence of the magnetic susceptibility of vanadium monoxide of different compositions at a temperature of about 700 K. X-ray diffraction analysis performed before and after measuring the magnetic susceptibility confirmed the change in the structure of vanadium monoxide and the possibility of atom-vacancy processes upon cooling and heating of the samples.     

In‐situ synthesis of transparent and conductive carbon nanotube networks

A method for the production of transparent carbon nanotube networks (CNTNs) over transparent substrates was developed. In this method, CNTNs were grown directly in the target surface by applying the catalyst in specific zones of the substrate through lithographic techniques. The networks can be also transferred from the original substrate to other surfaces. The newly grown carbon nanotubes have a very high aspect ratio (>50000). Thus far, networks with an optical transmittance of 94% at 550 nm and a surface resistivity of 3.6 kΩ/sq have been produced. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Realisation and metrological characterisation of thickness standards below 100 nm

High-accuracy film thickness measurements in the range below 100 nm can be made by various complex methods like spectral ellipsometry (SE), scanning force microscopy (SFM), grazing incidence X-ray reflectometry (GIXR), or X-ray fluorescence analysis (XRF). The measurement results achieved with these methods are based on different interactions between the film and the probe. A key question in nanotechnology is how to achieve consistent results on a level of uncertainty below one nanometre with different techniques.Two different types of thickness standards are realised. Metal film standards for X-ray techniques in the thickness range 10 to 50 nm are calibrated by GIXR with monochromatised synchrotron radiation of 8048 eV. The results obtained at four different facilities show excellent agreement. SiO₂ on Si standards for SE and SFM in the thickness range 6 to 1000 nm are calibrated by GIXR with monochromatised synchrotron radiation of 1841 eV and with a metrological SFM. Consistent results within the combined uncertainties are obtained with the two methods. Surfaces and interfaces of both types of standards are additionally investigated by transmission electron microscopy (TEM). PACS 61.10.Kw; 68.55.Jk; 06.20.Fn; 06.60.Mr; 07.79.Lh     

Manufacturing cell formation using similarity coefficients and a parallel genetic TSP algorithm: Formulation and comparison

Many algorithms have been proposed to form manufacturing cells from component routings. However, many of these do not have the capability of solving large problems. We propose a procedure using similarity coefficients and a parallel genetic implementation of a TSP algorithm that is capable of solving large problems of up to 1000 parts and 1000 machines. In addition, we also compare our procedure with many existing procedures using nine well-known problems from the literature.

The results show that the proposed procedure compares well with the existing procedures and should be useful to practitioners and researchers.     

A note on the complex semi‐definite matrix Procrustes problem

This note outlines an algorithm for solving the complex ‘matrix Procrustes problem’. This is a least‐squares approximation over the cone of positive semi‐definite Hermitian matrices, which has a number of applications in the areas of Optimization, Signal Processing and Control. The work generalizes the method of Allwright (SIAM J. Control Optim. 1988; 26 (3):537–556), who obtained a numerical solution to the real‐valued version of the problem. It is shown that, subject to an appropriate rank assumption, the complex problem can be formulated in a real setting using a matrix‐dilation technique, for which the method of Allwright is applicable. However, this transformation results in an over‐parametrization of the problem and, therefore, convergence to the optimal solution is slow. Here, an alternative algorithm is developed for solving the complex problem, which exploits fully the special structure of the dilated matrix. The advantages of the modified algorithm are demonstrated via a numerical example. Copyright © 2007 John Wiley & Sons, Ltd.     

Preparation and crystal structure of Na3SbO(PO4)2

The single phase compound Na₃SbO(PO₄)₂ was prepared by a solid state reaction. It crystallizes in the orthorhombic system, space group P2₁2₁2₁ with a = 6.964(1) Å, b = 9.284(2) Å, c = 12.425(2) Å, Z = 4. The structure was determined from 968 reflections collected on a Nonius CAD4 automatic diffractometer with MoKα radiation. The final R index and weighted R_w index are 0.031 and 0.039, respectively. The structure is built up from strings of corner-sharing SbO₆ octahedra to which phosphate groups are linked by two of their vertices. These chains, running parallel to the a-axis, are separated from each other by sodium atoms.