Effect of the structure of smooth copper surfaces on the accuracy of determination of the optical constants of copper

The accuracy of determination of the optical constants of smooth copper surfaces produced by different technologies is analyzed, with particular attention paid to the consideration of the influence of scattered radiation (which is ignored by many authors) on the retrieval of the optical constants of copper surfaces from reflected radiation. The neglect of scattered radiation can lead to errors as high as 50% in determining the optical constants for bulk copper. For thin films, the errors are much lower. The influence of surface oxidation during measurements in air and surface features of studied objects on the parameters to be determined is analyzed as well. It is shown that errors in determination of the constants are maximal in the plasma resonance region of copper.

     

Partially isometric dilations of noncommuting -tuples of operators

Given a row contraction of operators on a Hilbert space and a family of projections on the space that stabilizes the operators, we show there is a unique minimal joint dilation to a row contraction of partial isometries that satisfy natural relations. For a fixed row contraction the set of all dilations forms a partially ordered set with a largest and smallest element. A key technical device in our analysis is a connection with directed graphs. We use a Wold decomposition for partial isometries to describe the models for these dilations, and we discuss how the basic properties of a dilation depend on the row contraction.

     

Rain Attenuation at 103 GHz in Millimeter Wave Ranges

We have conducted a millimeter wave propagation experiment at 103 GHz (2.9 mm) on a propagation path of 390 m. The results were compared with the rain attenuation calculations from the Marshall-Palmer, Best, Joss-Thomas-Waldvogel and Weibull distributions for raindrop-size. It has been shown that the Weibull distribution has a good agreement with the experiments.     

Dielectric investigations of associate formation process in thin nitrobenzene interlayers formed between metal substrates

Studies of thickness and temperature dependencies of the dielectric susceptibility of nitrobenzene interlayers formed on conductive substrates were carried out. The obtained data were processed under the assumption of the existence of dimers (with opposite directions of molecular dipole moments) in orientationally ordered wall-adjacent layers. The results were treated on the basis of Lifshits theory.