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A high-Tc superconducting array microbolometer has been fabricated by using a YBCO film. Optical measurements gave moderate performance as individual detector, but singnificant improverment appears possible. 相似文献
153.
本文推导了包含自衍射及非线性吸收影响、用以描述空间电荷场建立过程的微分方程组,阐明了周期性的空间电荷场与光强干涉条纹之间的相位差在建立过程中所起的作用,并推导了描述条纹倾斜和弯曲的微分方程。通过数值计算找到了硅酸铋(BSO)晶体中能量转移的规律,讨论了材料特性对过程快慢的影响,提出了用CW激光来探讨瞬态过程快慢的可能性。 相似文献
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We report the effects of post-thermal treatment on the quality of 2-inch 6H-SiC wafer cut from a crystal boule grown by physical vapour transportation method. The full widths at half maximum of x-ray diffraction rocking curves measured on sites across the 2-inch wafer become narrower, indicating the quality improvement after a three-step post-thermal treatment. It is found that the most common defects such as micropipes and inclusions can be significantly reduced after the treatment. Our results show that the post-thermal treatment is an effective route to improve the quality of SiC single crystals. 相似文献
157.
Modulation Frequency Multiplexed Tunable Diode Laser Spectroscopy System for Simultaneous CO, CO2 Measurements 下载免费PDF全文
A modulation frequency multiplexed dual diode-laser system is developed for simultaneous detection of the two most common fire gas products CO and CO2. Simultaneous detection is achieved by modulating each laser at different frequencies, demodulating the signal by a pair of lock-in amplifiers for each gas. Laser beams are combined and detected by one detector after passing through an identical optical path. The experimental results show little performance degradation associated with modulation frequency multiplexing, and no cross-talk between the two multiplexed detection channels is measured. 相似文献
158.
����������ƽ������Ӣ�����ȼ�������̺� 《核聚变与等离子体物理》2006,39(3):243-248
As the ITER first wall Be/CuCrZr hot isostatic pressing (HIP) bonding intermediate transition layer, Ti/Cu layer can form a multi-layer intermediate metal phase, and defects such as cracks occur between the Ti/Cu metal phases. CuCrZr was used instead of Be, and a number of CuCrZr/Ti/Cu/CuCrZr joints were fabricated by the same HIP process as Be/CuCrZr to analyze the Ti/Cu joints. The effects of stress relief annealing on joint strength and defect distribution of the joints unannealed, annealed at 400°C and 500°C respectively were studied. The results show that three layers of Ti/Cu diffusion layers are formed on both sides of the intermediate titanium layer, namely Cu4Ti, CuTi and CuTi2. The thickness of Cu4Ti on the pure copper side is thicker than that on the CuCrZr side, so that the crack is almost entirely distributed at the junction of Cu4Ti and CuTi on the pure copper side where brittle fracture is easy to occur in the tensile samples. As the annealing temperature increases, the generation and propagation of cracks decreases. 相似文献
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