Static and dynamic detection of axial surface defects on metallic wires by conical triple laser reflection

The quality of the surface of metallic wires is relevant for different applications. The reflection of a laser beam on the surface of a metallic cylindrical wire provides an efficient way to inspect the quality of its surface. Our interest is focused in the detection of axially oriented defects, which are the most relevant for the wire drawing process. We present a simple interference-geometrical model to describe the light pattern reflected from a wire with defects. This model adequately accounts for the observed results from an industrial prototype developed for the purpose. It incorporates three-laser beams incident on the wire at equidistant locations in its perimeter, which produce three reflection cones with a CCD. This configuration permits to explore the whole perimeter of the wire. Several results are presented, both in static operation and in production line, in agreement with qualitative and quantitative predictions.     

Zur Bestimmung des St?rkegehaltes in der Gerste und in anderen Getreidearten

Ohne Zusammenfassung     

State of Atoms and Interatomic Distances in Complex Perovskite-like Oxides: XVII.1 Magnetic Dilution of La0.67Ca0.33MnO3 in LaGaO3

A magnetic susceptibility study of solid solutions of calcium-doped lanthanum manganite inlanthanum gallate showed that exchange interactions in clusters of manganese atoms do not change theircharacter with increasing temperature, unlike what is observed with solid solutions on the basis of lanthanumaluminate.     

A bicontinuous structure in some systems with cubic mesophases

A cubic structure of polymer colloid complexes is studied. The technique of the research includes i) an analysis of well-known literature SAXS data; on this basis, ii) constructing a simple model to estimate geometric structure parameters and to obtain a simulated scattering curve; and iii) comparing the model with the real structure obtained from the SAXS data, using the reconstruction of electron density distribution. A bicontinuous structure in cubic mesophases is formed. Dedicated to the memory of Alexander T. Dembo     

Robust Output Tracking Control of an Uncertain Linear System via a Modified Optimal Linear-Quadratic Method

This study investigates the robust output tracking problem for a class of uncertain linear systems. The uncertainties are assumed to be time invariant and to satisfy the matching conditions. According to the selected nominal parameters, an optimal solution with a prescribed degree of stability is determined. Then, an auxiliary input via the use of an adapting factor, connected to the nominal optimal control, is introduced to guarantee the robustness and prescribed degree of stability for the output tracking control of the uncertain linear systems. This method is very simple and effective and can reject bounded uncertainties imposed on the states. A maglev vehicle model example is given to show its effectiveness.     

Nickel as a chemical modifier for sensitivity enhancement and fast atomization processes in electrothermal atomic absorption spectrometric determination of cadmium in biological and environmental samples.

A systematic study of the efficiency of protons, Ni, Pd and Th as chemical modifiers for the determination of cadmium by electrothermal atomic absorption spectrometry (ETAAS) using fast temperature programs was made for platform atomization. A comparison was made in terms of the salt type, absorbance-time profiles and elimination of the sodium chloride interference. The results were adapted to develop a method for the ETAAS determination of cadmium in biological and environmental samples. The highest sensitivity to determine cadmium in biological and environmental samples was obtained using nickel (together with protons) as a chemical modifier. The accuracy of the method was tested by the determination of cadmium in different certified reference materials. The best detection limit and the characteristic mass of Cd were found to be 0.03 ng mL(-1) and 0.35 pg, respectively.     

Surface roughness investigation of semi-conductor wafers

Conventionally, surface roughness is predominantly determined through the use of stylus instruments. However, there are certain limitations involved in the method, particularly when a test specimen, such as a silicon wafer, has a smooth mirror-like surface. Hence, it is necessary to explore alternative non-contact techniques. Light scattering has recently been gaining popularity as an optical technique to provide prompt and precise inspection of surface roughness. In this paper, the total integrated scattering (TIS) model is modified to retrieve parameters on surface micro-topography through light scattering. The applicability of the proposed modified TIS model is studied and compared with an atomic force microscope. Experimental results obtained show that the proposed technique is highly accurate for measuring surface roughness in the nanometer range.