Fabrication and Visualization of Metal‐Ion Patterns on Glass by Dip‐Pen Nanolithography

Fluorescent self‐assembled monolayers (SAMs) are used as dip‐pen nanolithography (DPN) substrates for the fabrication of patterns of Ca²⁺ and Cu²⁺ ions. The driving force for the transfer of these ions from an atomic force microscopy (AFM) tip to the surface is their complexation to organic ligands on the monolayer. By means of fluorescent surfaces, the patterns can be visualized under a fluorescence microscope. We use a custom‐built atomic force fluorescence microscope (AFFM), a combination of atomic force and confocal fluorescence microscopes, to deposit the metal ions onto the sensing SAMs by DPN and to subsequently visualize modulations of fluorescence intensity in a sequential write–read mode.     

Fission fragment angular distributions in 16O+181Ta

Time of flight and energy of fission fragments were measured using pulsed beam. Fission fragment mass and energy integrated angular distributions were extracted. Fission fragment anisotropy was explained in the framework of saddle point model.     

"Two-Photon" coincidence imaging with a classical source

Coincidence imaging is a technique that extracts an image of a test system from the statistics of photons transmitted by a reference system when the two systems are illuminated by a source possessing appropriate correlations. It has recently been argued that quantum entangled sources are necessary for the implementation of this technique. We show that this technique does not require entanglement, and we provide an experimental demonstration of coincidence imaging using a classical source. We further find that any kind of coincidence imaging technique which uses a "bucket" detector in the test arm is incapable of imaging phase-only objects, whether a classical or quantum source is employed.