KrF准分子激光激发掺锗光纤折射率扰动的非线性过程

本文采用了一种简单的功率监测法,观察了KrF准分子激光对掺锗光纤折射率影响的非线性过程。观察到子纤芯折射率扰动过程中非稳定现象、饱和现象和折射率扰动的非线性。     

关于非线性Pochhammer-Chree方程的解

本文研究了弹性杆纵向形变方程:u_(tt)—u_(ttxx)—u_(xx)—(1/3)(u~3)xx=0的椭圆余弦波解,并用Adomian分解法,求出了其初边值问题解.     

Ga1-xInxAs/InAsyP1-y/InP异质结的MOCVD生长及表征

Ga1-xInxAs(x>0.53)材料是未来长距离低损耗光纤通信的理想光源材料和探测器材料之一.我们采用水平常压MOCVD系统,在InP衬底上成功地生长了Ga1-xInxAs(x>0.53)/InAsyP1-y/Inp异质结材料.其中InAs1-yPy为组份阶梯变化的多层结构.由样品的(400)面X光衍射结果测定了各层组份.由二次离子质谱(SIMS)得到了样品剖面组份变化结果,证明InAs1-yPy层组份为阶梯状变化的.通过对光致发光结果和X光衍射结果比较,可以看到,InAsyP1-y层通过位错和弹性畸变二种方式来释放或积累Ga1-xInxAs与InP间的失配应力,从而减少了Ga1-xInxAs中的失配位错.有效地改善了Ga1-xInxAs的质量.已获得了x高达0.94表面光亮的Ga1-xInxAs/InAs1-yPy/InP异质结材料.     

On the decomposition of Kn into complete m-partite graphs

Graham and Pollak [3] proved that n ?1 is the minimum number of edge-disjoint complete bipartite subgraphs into which the edges of K_n can be decomposed. Using a linear algebraic technique, Tverberg [2] gives a different proof of that result. We apply his technique to show that for “almost all n,” ? (n + m ?3)/(m ?1) ? is the minimum number of edge-disjoint complete m-partite subgraphs in a decomposition of K_n.     

Dependence of slow crack growth in polyethylene on butyl branch density: Morphology and theory

A theoretical equation has been developed to described the rate of slow crack growth in an ethylene-hexene copolymer in terms of the basic morphological parameters. These parameters are spacing of the butyl branches, number of tie molecules, and the thickness of the lamellar crystal. Experimentally, the thickness of the lamellae and the long period were determined as functions of the branch density. The calculation of the number of tie molecules is based on the values of the molecular weight and the long period. The model of slow crack growth is based on the rate of disentanglement of the tie molecules. The rate of disentanglement varies inversely with the number of tie molecules and directly with the number of tie molecules that are not pinned by the branches.     

牙齿化石中由辐照产生的陷阱电子的热稳定性研究

本文对周口店北京猿人遗址的动物牙齿化石进行了辐照产生的陷阱捕获电子的热稳定性研究和釉质样品及牙质样品的热稳定性对比实验。得到釉质样品中g=2.0016 ESR峰的寿命为7.1×10⁶年(20℃)。说明了取该峰进行ESR年代测定的可信性和用釉质样品进行ESR年代测定的必要性。     

N2（A）及N（2D）对IF（X）的传能研究

在微波放电系统中,对NH_3-F-F_2-CF_3I体系进行研究,结果表明,向IF(X)传能的诸多媒介中,N_2(A)及N(~2D)起着主要作用,并且这一结论在经微波激发后的N_2与CF_3I的直接反应中得到了进一步证实。