Effect of Potential on Coadsorption of Two Organic Substances in the Frumkin Model at a Maximum Possible Number of Solutions for the Relevant Set of Isotherms

Effect of the electrode potential on the coadsorption of two organic substances is studied using a set of two mixed Frumkin isotherms and a model of three parallel capacitors in conditions where in the absence of an electric field this system has seven solutions. It is shown that only four of these solutions may correspond to realizable adsorption states. Effect of the electrode potential on the number of possible solutions of the isotherm set, the number of realizable adsorption states, as well as on the composition and properties of a surface layer is considered.     

Nickel as a chemical modifier for sensitivity enhancement and fast atomization processes in electrothermal atomic absorption spectrometric determination of cadmium in biological and environmental samples.

A systematic study of the efficiency of protons, Ni, Pd and Th as chemical modifiers for the determination of cadmium by electrothermal atomic absorption spectrometry (ETAAS) using fast temperature programs was made for platform atomization. A comparison was made in terms of the salt type, absorbance-time profiles and elimination of the sodium chloride interference. The results were adapted to develop a method for the ETAAS determination of cadmium in biological and environmental samples. The highest sensitivity to determine cadmium in biological and environmental samples was obtained using nickel (together with protons) as a chemical modifier. The accuracy of the method was tested by the determination of cadmium in different certified reference materials. The best detection limit and the characteristic mass of Cd were found to be 0.03 ng mL(-1) and 0.35 pg, respectively.     

Weighted approximation of functions on the real line by Bernstein polynomials

The authors give error estimates, a Voronovskaya-type relation, strong converse results and saturation for the weighted approximation of functions on the real line with Freud weights by Bernstein-type operators.     

Investigations of Advanced Coaxial Gyrotrons at IAP RAS

Main results of experimental testing of the 140 GHz/1.5 MW coaxial gyrotron are summarized. High selective properties of the coaxial cavities and a possibility to increase considerably the efficiency of a coaxial gyrotron only by applying independently an appropriate voltage on its electrodes (without any design modification) have been confirmed. Successful uses of the two-potential connection scheme for the frequency step tuning and output power modulation in a coaxial gyrotron has been also demonstrated.     

Pointwise gradient estimates of solutions to onedimensional nonlinear parabolic equations

We present here an improved version of the method introduced by the first author to derive pointwise gradient estimates for the solutions of one-dimensional parabolic problems. After considering a general qualinear equation in divergence form we apply the method to the case of a nonlinear diffusion-convection equation. The conclusions are stated first for classical solutions and then for generalized and mild solutions. In the case of unbounded initial datum we obtain several regularizing effects for t > 0. Some unilateral pointwise gradient estimates are also obtained. The case of the Dirichlet problem is also considered. Finally, we collect, in the last section, several comments showing the connections among these estimates and the study of the free boundaries associated to the solutions of the diffusion-convection equation.     

Surface roughness investigation of semi-conductor wafers

Conventionally, surface roughness is predominantly determined through the use of stylus instruments. However, there are certain limitations involved in the method, particularly when a test specimen, such as a silicon wafer, has a smooth mirror-like surface. Hence, it is necessary to explore alternative non-contact techniques. Light scattering has recently been gaining popularity as an optical technique to provide prompt and precise inspection of surface roughness. In this paper, the total integrated scattering (TIS) model is modified to retrieve parameters on surface micro-topography through light scattering. The applicability of the proposed modified TIS model is studied and compared with an atomic force microscope. Experimental results obtained show that the proposed technique is highly accurate for measuring surface roughness in the nanometer range.