Phase diagram of multilayer magnetic structures

Multilayer ferromagnet-layered antiferromagnet (Fe/Cr) structures frustrated because of roughness of interlayer boundaries were studied by mathematical modeling methods. The phase diagram of a three-layer system (plotted as film thickness versus the degree of roughness of the interfaces) was obtained, and the order parameter distributions in each phase were determined. The character of phase transitions in this system was studied. The applicability range of the Slonczewski magnetic proximity model was determined.     

Adaptation of an echelle spectrograph to a large CCD detector

A broad range echelle spectrograph with a CCD matrix detector is developed for different applications in atomic spectroscopy. The compact optical design in combination with a dispersive entrance slit illumination offers a low stray light level and high throughput in the UV spectral region comparable only with spectrographs of higher focal length. Ray tracing calculations for typical wavelengths and the multi-line spectrum of an iron arc show the excellent overall spectrum quality. The subtraction of two partial spectra of different steel alloys demonstrates the spectra evaluation possibilities of the CCD spectrograph.     

X-ray diffraction study of 'side-on fixed' homopolysiloxanes from nematic to smectic C phases

The X-ray patterns for the nematic phase in a series of side-on fixed polysiloxanes show different kinds of diffuse elements which imply complex short range ordering. A systematic structural study of the evolution of the patterns versus two molecular parameters, namely the spacer length and the length of the terminal aliphatic tails, suggests the possible occurrence of a smectic C phase for certain values of these parameters. Taking into account these tendencies, new synthesis led to a nematic-smectic C polymorphism observed for the first time in side-on fixed polysiloxanes.     

Nonparametric decision-making models for large samples

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 9, pp. 79–83, September, 1995.     

On exact order estimates of N-widths of classes of functions analytic in a simply connected domain

In the spaces E _q(Ω), 1 < q < ∞, introduced by Smirnov, we obtain exact order estimates of projective and spectral n-widths of the classes W ^r E _p(Ω) and W ^r E _p(Ω)Ф in the case where p and q are not equal. We also indicate extremal subspaces and operators for the approximative values under consideration.     

A case for sharing

Unlike in other branches of science and technology, computer programs and algorithms are generally not fully disclosed. This leads to duplication of effort, and prevents building new knowledge rapidly on existing knowledge. To remedy this, effective patents on computer programs and algorithms should be granted. The community of authors and inventors, along with expert advice from patent attorneys, have to arrive at effective and equitable definitions of obviousness and novelty, so that the boundaries of protection on one side, and free progress on the other, can be defined. The same reasons exist for patenting and disclosing computer software knowledge as for chemistry, electrical and mechanical inventions. Patenting has protected inventors and assured progress for many decades successfully in these fields.     

Complexes in polymers IV. FTIR microscopic characterization of thin organic polymer films containing embedded transition-metal carbonyl complexes

Thin films of polystyrene (PS), poly(methyl methacrylate) (PMMA) and polystyrene-polyacrylonitrile copolymer (PS-AN), containing various embedded transition-metal complexes, have been studied by FTIR microscopy. The spatial distributions of the transition-metal carbonyl complexes throughout the thin organic polymer films have been determined by a two-dimensional IR mapping procedure. The spectral variations observed in the distribution of the metal carbonyls throughout the different polymer films are discussed. The IR data show that the technique used to prepare the organometallic-embedded thin films (viz. freeze-drying of solutions followed by hot mechanical pressing of the residues) does in general lead to homogeneous films which may eventually find industrial application, e.g. as membrane sensors for small molecules.