用XRD和ACS测量研究Y_(1-x)Eu_xBa_2Cu_3O_(7-δ)超导体的应力钉扎机制

利用X射线衍射 (XRD)和交流磁化率 (ACχ)方法系统地研究了Y1-xEuxBa2 Cu3O7-δ(x=0 .0～ 1.0 )超导体 ,研究发现Eu掺杂替代了Y晶位后引起了晶格失配 .这种晶格失配与电流密度有密切的联系 .对于不同掺杂成分样品 ,X射线衍射线形分析表明 ( 0 0 6)及 ( 0 0 7)衍射峰型随掺杂量变化 ,掺杂浓度在 30 %和 70 %附近时 ,半高宽 (FWHM)出现极大值 ,表明此时样品的晶格失配最大 .与此相对应 ,电流密度Js 也在此掺杂浓度范围内达到极大值 .我们在晶格失配应力场的钉扎模型下对实验现象进行了讨论 ,认为Y1-xEuxBa2 Cu3O7-δ超导体中由元素替代引起的晶格失配应力场是有效的钉扎中心 .     

Positronium annihilation in silica aerogel studied by a positron age-momentum correlation technique

A high-performance positron age-momentum correlation (AMOC) spectrometer was newly developed. The counting rate is increased up to 200 cps much larger than the value 20~cps reported by other international groups. And at the same time, the time resolution still keeps at the international level of 220 ps. Furthermore, positronium (Ps) annihilation in silica aerogel was investigated by AMOC, which indicates: (1) Ps annihilation between the grains dominantly undergoes pick-off process and spin conversion from o-Ps to p-Ps; (2) Annealing below 400 ℃ changes the grain surface conditions, i. e. the desorption of hydrogen and the decrease of the defect centers concentration.     

锆离子注入锆-4合金缺陷的慢正电子研究

采用慢正电子束多普勒展宽谱研究了Zr离子注入Zr-4合金产生的缺陷及其退火回复行为，发现经过大于离子注入剂量为1×10¹⁶cm^-2的样品所产生的缺陷在注入过程中已经回复，而对剂量为1×10¹⁵cm^-2样品做300℃退火处理，其缺陷基本回复，得出合金缺陷回复能较低的结论. 考虑到材料的缺陷含量越高，其抗腐蚀性能越差，在辐照环境下通过给材料保持一定温度，即可使其缺陷得到较好回复，从而提高材料的抗腐蚀性能.     

Using a LaBr3:Ce scintillator for positron annihilation lifetime spectroscopy

A LaBr₃:Ce scintillator has a high light output (~60000 p.e/MeV) and a short decay constant (<25 ns), which makes it good for time spectrometry. Compared with a BaF₂ scintillator, it can bear a much higher count rate, and can be coupled to photomultipliers without using a quartz window. In this work, a positron annihilation lifetime spectrometer (PALS) consisting of two bulks of φ25 mm×25 mm LaBr₃:Ce scintillator coupled to two XP20D0 photomultipliers, respectively, was built. A time resolution of FWHM=206 ps was measured for the PALS with a ⁶⁰Co source at the energy window for ²²Na. With this spectrometer, a reasonable lifetime value τ=221±4 ps in a pure Si sample is obtained, which means that the utilization of LaBr₃:Ce as the detector for a PALS is feasible.     

Kerr-lens mode-locked polycrystalline Cr:ZnS femtosecond laser pumped by a monolithic Er:YAG laser

We demonstrated a Kerr-lens mode-locked polycrystalline Cr:ZnS laser pumped by a narrow-linewidth linearpolarised monolithic Er:YAG nonplanar ring oscillator operated at 1645 nm. With a 5-mm-thick sapphire plate for intracavity dispersion compensation, a compact and stable Kerr-lens mode-locking operation was realised. The oscillator delivered 125-fs pulses at 2347 nm with an average power of 80 m W. Owing to the special polycrystalline structure of the Cr:ZnS crystal, the second to fourth harmonic generation was observed by random quasi-phase-matching.     

La2/3Ca1/3Mn1-xFexO3化合物铁掺杂效应的M(o)ssbauer谱研究

利用固相反应方法制备了名义成分为La2/3Ca1/3Mn1-xFexO3（0.01≤x≤0.20)的一系列样品。在整个掺杂范围内晶体结构没有明显变化。在室温下测量了各样品的Mossbauer谱,拟合结果表明＋3价高自旋态的铁离子占据锰的八面体晶体,随Fe掺杂量的增加,铁离子的3d电子出现局域化趋势,并伴随Fe-O配位体畸变程度的增强,本文对此进行了讨论。     

慢正电子束流技术在金属/合金微观缺陷研究中的应用

正电子湮没谱学技术是研究材料微观结构非常有效的一种核谱学分析方法, 主要用于获取材料内部微观结构的分布信息, 特别是微观缺陷结构及其特性等传统表征方法难以获取的微观结构信息. 近年来, 在慢正电子束流技术快速发展的基础上, 正电子湮没谱学技术在薄膜材料表面和界面微观结构的研究中得到了广泛应用. 特别是该技术对空位型缺陷的高灵敏表征能力, 使其在金属/合金材料表面微观缺陷的形成机理、缺陷结构特性及其演化行为等研究方面具有独特的优势. 针对材料内部微观缺陷的形成、演化机理以及缺陷特性的研究, 如缺陷的微观结构、化学环境、电子密度和动量分布等, 正电子湮没谱学测量方法和表征分析技术已经发展成熟. 而能量连续可调的低能正电子束流, 进一步实现了薄膜材料表面微观结构深度分布信息的实验表征. 本文综述了慢正电子束流技术应用研究的最新进展, 主要围绕北京慢正电子束流装置在金属/合金材料微观缺陷的研究中对微观缺陷特性的表征和表面微观缺陷演化行为的应用研究成果展开论述.     

A compact positron annihilation lifetime spectrometer

Using LYSO scintillator coupled on HAMAMATSU R9800 (a fast photomultiplier) to form the small size γ-ray detectors, a compact lifetime spectrometer has been built for the positron annihilation experiments. The system time resolution FWHM=193 ps and the coincidence counting rate ～8 cps/μCi were achieved. A lifetime value of 219±1 ps of positron annihilation in well annealed Si was tested, which is in agreement with the typical values published in the previous lectures.     

Evaluation of imaging protocol for ECT based on CS image reconstruction algorithm

Single-photon emission computerized tomography and positron emission tomography are essential medical imaging tools, for which the sampling angle number and scan time should be carefully chosen to give a good compromise between image quality and radiopharmaceutical dose. In this study, the image quality of different acquisition protocols was evaluated via varied angle number and count number per angle with Monte Carlo simulation data. It was shown that, when similar imaging counts were used, the factor of acquisition counts was more important than that of the sampling number in emission computerized tomography. To further reduce the activity requirement and the scan duration, an iterative image reconstruction algorithm for limited-view and low-dose tomography based on compressed sensing theory has been developed. The total variation regulation was added to the reconstruction process to improve the signal to noise Ratio and reduce artifacts caused by the limited angle sampling. Maximization of the maximum likelihood of the estimated image and the measured data and minimization of the total variation of the image are alternatively implemented. By using this advanced algorithm, the reconstruction process is able to achieve image quality matching or exceed that of normal scans with only half of the injection radiopharmaceutical dose.     

Performance evaluation of CsI screens for X-ray imaging

Cs I film has been one of the most extensively used scintillators for indirect X-ray imaging because of its needle-like micro-structure. The purpose of this paper is to investigate the imaging performance of Cs I screen as a function of thickness and radiation quality. Four multilayer scintillation screens with microcolumnar Cs I:Tl film(thicknesses of 50 μm, 100 μm, 200 μm and 300 μm) included were prepared and coupled to an optical imaging sensor. The modulation transfer function(MTF), normalized noise power spectrum(NNPS) and detective quantum efficiency(DQE) of these screens were evaluated based on the standard IEC 62220-1, and the results indicated that,in the medium spatial frequency range(1–6 lp/mm), the MTF of Cs I screens with the same thickness was lower when the incident X-ray photon energy was higher, possibly owing to scattering and K-fluorescence re-absorption effects. The NNPS in the higher spatial frequency range(above 8 lp/mm) is dominated by stochastic noise while the entrance surface air Kerma(ESAK) decreases. For 100 μm, 200 μm and 300 μm thick Cs I screens, the DQE under RQA7 and RQA9 is lower than that under RQA3 and RQA5 due to low absorption efficiency.