北京谱仪桶部簇射计数器能量响应特性研究

在北京正负电子对撞机的J/ψ和Ds能区,选择了辐射巴巴事例,并以此来研究北京谱仪的桶部簇射计数器能量响应特性.在消除了由于电子和辐射光子在桶部簇射计数器中沉积能量区域重叠的影响后,正确地得到了桶部簇射计数器在电子和光子动量小于2GeV以下的能量响应,表明在所研究能区,桶部簇射计数器的能量响应线性很好.对桶部簇射计数器微小的非线性进行修正后,重建的π0不变质量谱得到改善.     

磁控反应溅射法制备渐变折射率薄膜的模型分析

阐述了磁控反应溅射法制备渐变折射率薄膜的机理;探讨了磁控反应溅射法制备渐变折射率薄膜的理论模型,给出了渐变折射率薄膜的折射率与反应气体分压的关系,在一定的沉积参数下,由要得到的膜层折射率随膜层几何厚度的变化规律可推导出反应气体分压比随时间的变化规律;最后以制备折射率线性变化的薄膜为例说明了如何推导得到反应气体分压比随时间的变化规律. 关键词： 渐变折射率 磁控反应溅射 模型     

Wideband Antireflection Film Fabricated by Glancing Angle Deposition

Graded-index ZrO2 films has been fabricated on K9 glass by glancing angle deposition. Because the index mismatch at the interface has been reduced, the film results in wideband high-transmission antireflection. From 400nm to 1200nm, the film reflection is lower than 0.8% and the lowest value is 0.2% at 432nm.     

Antireflective characteristics of triangular shaped gratings

It is well known that conventional multi-layers are oftenused for antireflective coatings[1,2]. There are, however,only a handful of optical materials available, thus limit-ing the performance that could ideally be achieved. Onthe other hand, sub-wavelength structure surfaces, whichare surface-relief gratings with periods smaller than theincident wavelength, have been researched and foundto have antireflective properties[3,8]. Compared withstandard optical thin-film coating technologies, the h…     

Optical properties and structures of silver thin films deposited by magnetron sputtering with different thicknesses

A series of thin Ag films with different thicknesses grown under identical conditions are analyzed by means of spectrophotometer. From these measurements the values of refractive index and extinction coefficient are calculated. The films are deposited onto BK7 glass substrates by direct current (DC) magnetron sputtering. It is found that the optical properties of the Ag films can be affected by films thickness. Below critical thickness of 17 nm, which is the thickness at which Ag films form continuous films, the optical properties and constants vary significantly with thickness increasing and then tend to a stable value up to about 40 nm. At the same time, X-ray diffraction measurement is carried out to examine the microstructure evolution of Ag films as a function of films thickness. The relation between optical properties and microstructure is discussed.     

二极管伏安特性曲线测试电路的改进

指出了文献中所给出的伏安法测二级管特性曲线电路存在的问题，并给出了改进电路。     

A novel scheme based on minimum delay at the edges for optical burst switching networks

This paper proposes a novel scheme based on minimum delay at the edges (MDE) for optical burst switching (OBS) networks. This scheme is designed to overcome the long delay at the edge nodes of OBS networks. The MDE scheme features simultaneous burst assembly, channel scheduling, and pre-transmission of control packet. It also features estimated setup and explicit release (ESXR) signaling protocol. The MDE scheme can minimize the delay at the edge nodes for data packets, and improve the end-to-end latency performance for OBS networks. In addition, comparing with the conventional scheme, the performances of the MDE scheme are analyzed in this paper.     

H^＋注入锗酸铋晶体表面层的性质

Ｈ＾＋注入锗酸铋（Ｂｉ４Ｇｅ３Ｏ１２或ＢＧＯ）晶体引起某些效应，如辐射损伤，光学吸收和近表层区域的晶体分解。经Ｈ＾＋注入后，ＢＧＯ晶体的颜色变成棕色，但实验中证实不了该变化是由色心的产生所引起。此外，实验中也示观察到Ｈ＾＋注入ＢＧＯ晶体中有离子束诱发的光学活性变化。可见在注入过程中，未发生从Ｂｉ４Ｇｅ３Ｏ１２转变到Ｂｉ１２ＧｅＯ２０的结构相变，由此预见，注入过程中可能发生离子束引起的晶体分解。Ｈ＾     

任意二次型双曲面扁薄壳的基本解

本文对任意二次型双曲面扁薄壳的八阶偏微分方程采用平面波分解和小参数法导出了它的基本解。 在基本解的基础上,本文还得出边界为无限大时薄壳在集中荷载作用下的格林函数,适用于以边界积分方程法来分析具有任意边界条件的这类薄壳结构在任意荷载作用下的位移与内力,与一般有限单元法相比,它能较大的地节省计算机的内存和缩短分析时间。