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The Na absorption on Si(100) 2×1 surface is studied with quantum chemistry molecular cluster method. The calculated results show that the most favourable absorption site of Na is the cave site and the charge transfer of Na atom to Si is large when the Na coverage is smaller than 0.5 monolayer (ML). A Na chain is formed along the cave sites at the 0.5 ML Na coverage, the charge transfer then becomes small. The calculated density of states show that the Na atoms are metallic along the chain. At 1 ML coverage, the Na atoms occupy both the cave and pedestal sites and form a double-layer. There is a charge transfer of 0.5e from each Na atom to the Si surface. The calculated surface energy shows that the saturation absorption of Na on Si surface is 1 ML. 相似文献
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Role of amorphous silicon domains of Er^3+ emission in the Er—doped hydrogenated amorphous silicon suboxide film 下载免费PDF全文
An investigation on the correlation between amorphous Si (a-Si) domains and Er^{3+} emission in the Er-doped hydrogenated amorphous silicon suboxide (a-Si:O:H) film is presented. On one hand, a-Si domains provide sufficient carriers for Er^{3+} carrier-mediated excitation which has been proved to be the highest excitation path for Er^{3+} ion; on the other hand, hydrogen diffusion from a-Si domains to amorphous silicon oxide (a-SiO_x) matrix during annealing has been found and this possibly decreases the number of nonradiative centres around Er^{3+} ions. This study provides a better understanding of the role of a-Si domains on Er^{3+} emission in a-Si:O:H films. 相似文献
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PHOTOELECTRON SPECTROSCOPIC STUDY OF THE EFFECT OF Cs INTRALAYER ON THE BAND LINEUP OF Ge/InP(100) HETEROJUNCTION 下载免费PDF全文
The formation and band lineup of the Ge/InP(100) interface with or without alkali metal Cs intralayer (IL) are studied by means of X-ray photoemission spectroscopy (XPS) and ultraviolet photoemission spectroscopy (UPS). It is found that the Cs atoms do not react with or diffuse into the subatrate and the Ge overlayer. The thin Cs IL will induce an increase of the valence band offset (ΔEv) for the Ge/InP(100) heterojunction. The changes of ΔEv are proportional to the IL thickness and them saturate for IL thickness of about one half of a monolayer of Cs IL. Without the IL, ΔEv of the Ge/InP(100) heterojunction is equal to 0.70eV, and ΔEv with one half of monolayer IL is up to 0.90eV. These results show that the interface dipole plays a major role in the band lineup at the heterojunction interface. 相似文献
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合金AgAuZn2具有一个与郝斯勒合金同晶型结构的β″相,这个β″相存在于一个相当广阔的成分范围里。事实上,β″相就是β′有序结构的超结构。伴随着,β″结构的形成晶格发生突然的收缩。关于Ag-Au替换对于原子分布的影响,也作了系统的观察。在Ag-Au替换过程中,Au和Ag的替换或多或少是无规律性的,但Zn原子则仍保持它们的适宜位置,而不受到影响。当成分偏离于理想化学式AgAuZn2时,有序度的减小不仅仅是由于化学成分的乖异,而且Ag-An替换也产生了一些无序的排列。高温观察的结果指出:Ag多合金的β′-β转变温度随着Au含量的增加而升高,而β相只能在高温度存在。少量的Au大大地提高了由淬炼而得到的β′相的稳定度。但是Au多的合金无论是在室温和高温都是具有β′结构的。 相似文献
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在化学元素周期表中,已观察到许多元素在硅中能形成电子能级.它们作为硅中的杂质,其物理行为目前只有很少数的几种(例如B,P,As等)为人们所了解,而对周期表中的绝大多数元素在硅中的物理性质研究得还远远不够. 本文根据现有的工作,论述一些杂质在硅中的物理行为. 一、Ⅲ族(B,Al,Ga)及V族 (P,As,Sb)元素 众所周知,Ⅲ,V族元素是硅中最重要的杂质.它们在硅中分别是受主和施主杂质,并在硅禁带中引入浅能级:受主能级比价带顶高上EA,施主能级则比导带底低 ED 表1列出了硅中Ⅲ,V族杂质电离能的测量值.实验测量表明,Ⅲ,V族杂质在硅中的电离能… 相似文献
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读了《物理》杂志34卷第9期吴自勤和阎守胜两位同志写的关于N.F.Mott教授的纪念文章,很有感触,这使我回忆起Mott教授的一些往事.从这些往事中我深受教育,所以多年来未能忘怀。 相似文献