Highly transparent ceramics for the spectral range from 1.0 to 60.0μm based on solid solutions of the system AgBr-AgI-TlI-TlBr

The article is devoted to the technology for obtaining optical ceramics of Ag Br-Tl I and Ag Br-Tl Br_0.46I_0.54 systems and manufacturing samples with different compositions.The new heterophase crystal ceramics are transparent without absorption windows in the spectral range from 1.0 to 60.0μm.In the ceramics’transparency spectra based on the Ag Br-Tl I and Ag Br-Tl Br_0.46I_0.54 systems fusibility diagrams,with an increase in the thallium halides mass fraction,as well as the replacement of the bromine ion with iodine,the maximum transparency shifts to a long infrared region.     

填充式方钴矿化合物CeOs4Sb12近藤相互作用的非弹性中子散射研究

CeOs4Sb12晶体中由于导电电子与Ce3+ 4f1电子之间存在c-f杂化作用导致费米面附近存在能量间隙.这种c-f近藤相互作用和能量间隙是理解CeOs4Sb12物理性质,如近藤绝缘体行为、Ce3+磁矩在低温下猝灭以及重费米性等电、磁性质的关键.当用LAM-D中子谱仪对粉末CeOs4Sb12进行测量时,可以得到不同温度下CeOs4Sb12的非弹性中子散射谱.结果表明CeOs4Sb12中存在近藤相互作用,其作用强度为3.1 meV,证实了CeOs4Sb12为近藤绝缘体.中子测量得出CeOs4Sb12德拜温度为317 K.     

纳米复合超硬薄膜中与界面有关的弛豫现象

利用内耗技术研究了TiSiN系列纳米复合超硬薄膜的结构弛豫和硬化机理.当共振频率大约在100 Hz时在230～280 ℃范围内观察到一个弛豫型的内耗峰.计算出激活能为0.7～1.0 eV,弛豫时间指数前因子为10-10～10-12秒.对比一系列样品,发现硬度越高内耗峰越低,在硬度高于50 GPa的薄膜中没有内耗峰.内耗峰随退火温度升高而不断降低,直至600～750 ℃退火时消失, 并且杨氏模量开始增加,这跟样品退火后硬度增长是一致的.结果表明内耗峰来源于样品中界面的弛豫过程.     

剑桥导游太阳系

本书以最新的视角描述了行星和月亮。开始用短短的篇幅介绍行星的观测和发现历史，然后介绍行星及其卫星的共同特点、演化过程和状况。在各章节中讲述各个行星和太阳系其它天体，包括新近的多种空间任务，从阿波罗探月到近期的木星和火星探测。书中充满了至关重要的事实和信息，以及极其精美的彩色照片。     

填充式方钴矿化合物CeOs4Sb12近藤相互作用的非弹性中子散射研究

CeOs₄Sb₁₂晶体中由于导电电子与Ce³⁺ 4f¹电子之间存在c-f杂化作用导致费米面附近存在能量间隙.这种c-f近藤相互作用和能量间隙是理解CeOs₄Sb₁₂物理性质，如近藤绝缘体行为、Ce³⁺磁矩在低温下猝灭以及重费米性等电、磁性质的关键.当用LAM-D中子谱仪对粉末CeOs₄Sb₁₂进行测量时，可以得到不同温度下CeOs₄Sb₁₂的非弹性中子散射谱.结果表明CeOs₄Sb₁₂中存在近藤相互作用，其作用强度为3.1 meV，证实了CeOs₄Sb₁₂为近藤绝缘体.中子测量得出CeOs₄Sb₁₂德拜温度为317 K. 关键词： 非弹性中子散射 填充式方钴矿 近藤绝缘体     

A Convenient and Efficient Procedure fox Oxime Ethers

Acetophenone oxime and benzaldehyde oxime were converted to oxime ethers in the presence of alkyl halide or methyl sulfate and KOH in aqueous DMSO in 5 to 70 min. The yields of oxime ethers were 70-96%.     

THE -PROBLEM FOR HOLOMORPHIC (0,2)-FORMS ON PSEUDOCONVEX DOMAINS IN SEPARABLE HILBERT SPACES AND D.F.N. SPACES

51. IntroductionL. H5.m.nd..l3] solved the 0problem by using the L2-estimates for partial differentialoperators in C'.. J. Kajiwara[4] studied infinite dimensional generalizations of the poten-tial kernel. Concerning the 0-problem in infinite dimensional spaces, P. ffeb.i.lll] investi-gated the a-equation for coc (o, 1)-forms in arbitrary pseudoconvex open subsets of separableHilbert spaces without growth condition. J. F. Colombeau and B. Perr.t[l1 showed that aCoc solution u of 0u = w ca…     

赝能隙导致的YBa2(Cu1-xMx)3O7-δ(M=Co,Zn)薄膜的输运性质异常

报道了两类典型元素替代的超导Y123相体系-YBa2(Cu1-xCox)3O7-δ(x=0.01,0.02)和YBa2(Cu1-yZny)3O7-δ(y=0.005,0.010)薄膜的电阻率-温度特性(ρ(T))和Hall效应(RH (T)).研究表明,Co掺杂的Y123相体系十分类似于氧欠掺杂的情况,对Co掺杂的薄膜样品,由电阻率-温度特性定义的赝能隙打开的温度T*分别为193和225K.而Zn掺杂的样品没有观察到赝能隙打开对电阻率-温度特性的影响.由Hall效应的测量和Hall角(cotθH)定义了另一个特征温度T 0,介于Tc与T*之间,这一特征温度与核磁共振(NMR)给出的赝能隙打开温度相近,说明可能源于电子自旋自由度上的能隙打开.在室温到Tc范围内,电阻率-温度特性和Hall效应分别定义了两类不同的转变温度(T*和T 0),可能分别源于电子电荷和自旋通道上的赝能隙的打开,预示着电荷和自旋自由度分别进入某种基态.     

催化剂薄层内甲烷水蒸气重整反应强化管内对流换热的数值模拟

本文以竖直圆管内壁催化剂薄层内发生甲烷水蒸气重整反应强化对流换热作为研究对象,对其进行了数值模拟．结果发现,催化剂薄层内的吸热化学反应可以有效地强化对流换热,降低流体和壁面温度,从而对壁面起到保护作用;极限热流密度的大小与流体的入口温度有关,存在最佳入口温度使极限热流密度最大．     

Ionic Conductivity and Dielectric Properties of the PAN-Ion Conducting Polymers

1 Results In this work, the ion conducting films of polyacrylonitrile (PAN) containing lithium triflate (LiCF3SO3) and sodium triflate (NaCF3SO3) were prepared by the solution casting technique. The ionic conductivity measurements were carried out using impedance spectroscopy. The room temperature conductivity for pure polyacrylonitrile film is 1.51×10-11 S·cm-1. The room temperature conductivity for the highest conducting film in the PAN-LiCF3SO3 and PAN-NaCF3SO3 systems is 1.51×10-5 and 7.99×10-6 S·cm-1, respectively. The conductivity-temperature studies were performed in the temperature range between 303 and 373 K. The results for the variation of the conductivity with temperature obeys the VTF law. The increase and decrease in the number of ions can be implied from the plots of dielectric constant, εr-frequency and dielectric loss, εi-frequency.