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ELDRS and dose-rate dependence of vertical NPN transistor 总被引:1,自引:0,他引:1
The enhanced low-dose-rate sensitivity (ELDRS) and dose-rate dependence of vertical NPN transistors are investigated in this article. The results show that the vertical NPN transistors exhibit more degradation at low dose rate, and that this degradation is attributed to the increase on base current. The oxide trapped positive charge near the SiO2-Si interface and interface traps at the interface can contribute to the increase on base current and the two-stage hydrogen mechanism associated with space charge effect can well explain the experimental results. 相似文献
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针对电子元器件屏蔽封装材料的屏蔽效果评估方法及理论计算在器件屏蔽封装中应用的问题,本文通过理论计算一种屏蔽材料对1.0MeV电子的屏蔽效果,以及对应的实验验证,指出此种屏蔽材料有很好的屏蔽电子辐射作用.研究证明了理论与实验相互验证的方法能很好的评估屏蔽材料的屏蔽效果,同时指出理论计算的结果能在屏蔽材料设计中作为依据. 相似文献
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利用光纤光栅传感法,对压电陶瓷/618环氧树脂、压电陶瓷/9110T有机硅树脂、压电陶瓷/9110B有机硅树脂和压电陶瓷/HASUNCAST有机硅树脂四种1-3-2型压电复合材料进行实时温度弯曲形变测试,并对其相关温度稳定性电参数进行测试分析。结果表明,压电陶瓷/9110T有机硅树脂和压电陶瓷/HASUNCAST有机硅树脂压电复合材料的介电损耗极大;压电陶瓷/9110B有机硅树脂与压电陶瓷/618环氧树脂相比,其温度弯曲形变及频率常数、相对介电常数的温度变化率小,温度稳定性更高,是提高现行压电陶瓷/618环氧树脂压电复合材料高温耐受性的良好替代材料。 相似文献
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