An experimental method for measurement of subpixel microdisplacements of speckle structure based on the parameters of the linear phase shift in the field of the complex spatial spectrum of the displaced structure is proposed and experimentally implemented. The phase shift is determined when a phase shift of spectrum is numerically added and the correlation analysis of the resulting linear phase shift in the spatial spectrum of specklegrams is performed. The method provides additional possibilities in the measurements using digital speckle photography when the period of interference fringes formed in the total spatial spectrum of specklegrams is significantly greater than the spectral width.
相似文献The influence of the numerical aperture of a light beam probing an object on the value measured with a confocal interference microscope when determining the thickness of layered object has been theoretically and experimentally investigated. The dependence of the measured value on the numerical aperture in the form of an analytical formula is obtained. It is established that the measured value is determined by the average longitudinal spatial frequency of the field probing the object. The results of experimental verification of the dependence obtained allow us to conclude that it is possible to increase the measurement accuracy of geometrical thickness and refractive index of layered micro-objects by the methods of confocal microscopy.
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