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利用低温扫描电子显微镜(LTSEM),我们对高温超导 YBaCuO 外延膜的临界电流密度J_c 和临界温度 T_c 的分布进行了观察.低温扫描电镜是目前可以观察超导薄膜中 J_c、T_c 分布情况的仪器,本文详细说明了利用 LTSEM 来观察超导薄膜 J_c、T_c 分布情况的原理,以及如何将 SEM 改装为 LTSEM.实验结果表明 YBaCuO 外延膜表面临界电流密度 J_c 和临界温度 T_c 的分布是不均匀的,但其不均匀性比多晶膜小得多,而且其分布情况与膜的表面形貌有关. 相似文献
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THE ELECTRON-BEAM IRRADIATION ON THE HIGH TEMPERATURE SUPERCONDUCTING THIN FILMS: A NUMERICAL SIMULATION OF THE LOW TEMPERATURE SCANNING ELECTRON MICROSCOPY 下载免费PDF全文
Low-temperature scanning electron microscopy (LTSEM) is a promising measuring technique for probing the spatial distribution of the superconducting properties of the high-temperature superconducting (HTS) thin films. A theoretical analysis of the electron-beam irradiation on the HTS thin films in the LTSEM has been carried out. An inhomogeneously distributed grain array model has been applied in the analysis, and some numerical sim-ulations have been carried out on the electron-beam induced voltage (EIV) signals in the LTSEM experiments. The comparisons of our numerical results with the LTSEM experi-mental data indicate that it is quite reasonable to use a two-dimensional Josephson junction array for stimulating the inhomogeneous HTS thin film sample. Our numerical results also show that the EIV signals are influenced by the electron-beam power used in the LTSEM, and a reduction of the electron-beam power is suggested in order to eliminate the errors in estimating the local values of critical temperature Tc and critical current Ic by the sample temperature and the bias current at which the first EIV signal occurs. 相似文献
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Manipulating surface plasmon waves by transformation optics:Design examples of a beam squeezer,bend,and omnidirectional absorber 下载免费PDF全文
We present several design examples of how to apply transformation optics and curved space under coordinate transformation to manipulating the surface plasmon waves in a controlled manner.We demonstrate in detail the design procedure of the plasmonic wave squeezer,in-plane bend and omnidirectional absorber.We show that the approximation method of modifying only the dielectric material of a dielectric-metal surface of the plasmonic device could lead to acceptable performance,which facilitates the fabrication of the device.The functionality of the proposed plasmonic device is verified using three-dimensional full-wave electromagnetic simulations.Aiming at practical realization,we also show the design of a plasmonic in-plane bend and omnidirectional absorber by an alternative transformation scheme,which results in a simple device structure with a tapered isotropic dielectric cladding layer on the top of the metal surface that can be fabricated with existing nanotechnology. 相似文献
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Manipulating surface plasmon waves by transformation optics: Design examples of beam squeezer, bend, and omnidirectional absorber 下载免费PDF全文
We present several design examples of how to apply the transformation optics and curved space under coordinate transformation to manipulating the surface plasmon waves in a controlled manner. We demonstrate in detail the design procedure of the plasmonic wave squeezer, in-plane bend and omnidirectional absorber. We show that the approximation method of modifying only the dielectric material of a dielectric-metal surface of the plasmonic device could lead to acceptable performance, which facilitates the fabrication of the device. The functionality of the proposed plasmonic device is verified using three-dimensional full-wave electromagnetic simulations. Aiming at practical realization, we also show the design of plasmonic in-plane bend and omnidirectional absorber by an alternative transformation scheme, which results in simple device structure with a tapered isotropic dielectric cladding layer on the top of the metal surface that can be fabricated with the existing nanotechnology. 相似文献
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高温超导薄膜的微波性能受制备工艺和衬底材料性能的影响,常常出现空间不均匀分布,因此,无损检测大面积超导薄膜及衬底材料的微波性能,研究影响局域微波性能的因素,是高温超导微波器件应用研究中的一个重要方面.我们设计和制造了一套同轴谐振腔型微波近场扫描显微镜,利用该显微镜研究了金属薄膜样品微波表面电阻和介质材料的介电常数的空间分布,给出了其空间分辨率并分析了影响空间分辨率的因素.利用这套微波近场扫描显微镜,对大面积LaAlO3单晶衬底材料介电常数的空间分布进行了测量,并分析了其测量精度.最后,利用这套微波近场扫描显微镜,研究了YBaCuO薄膜平面微波器件的微波表面电阻的分布情况,对影响其局域微波性能的因素做了初步分析 相似文献
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