X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C60 films

The influence of 200 MeV Au ion irradiation on the surface properties of polycrystalline fullerene films has been investigated. The X-ray photoelectron and X-ray Auger electron spectroscopies are employed to study the ion-induced modification of the fullerene, near the surface region. The shift of C 1s core level and decrease in intensity of shake-up satellite were used to investigate the structural changes (like sp² to sp³ conversion) and reduction of π electrons, respectively, under heavy ion irradiation. Further, X-ray Auger electron spectroscopy was employed to investigate hybridization conversion qualitatively as a function of ion fluence.     

The interaction between vapor-deposited Al atoms and methylester-terminated self-assembled monolayers studied by time-of-flight secondary ion mass spectrometry,X-ray photoelectron spectroscopy and infrared reflectance spectroscopy

The deposition of 2 Å of Al metal onto a monolayer of methylester-terminated alkanethiolate (HS(CH₂)₁₅CO₂CH₃) self-assembled on polycrystalline Au(111) was studied using time-of-flight secondary ion mass spectrometry (ToF-SIMS), X-ray photoelectron spectroscopy (XPS) and infrared reflectance spectroscopy (IRS). The deposited Al was found to be highly reactive with the oxygen atoms in the self-assembled monolayer terminal functional group. No reactivity between Al and the methylene backbone of the monolayer was observed, nor was any Al observed at the monolayer/Au interface. However, the deposition of Al does induce some chain disordering.     

Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy

We describe two NIST databases that can be used to characterize thin films from Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) measurements. First, the NIST Electron Effective-Attenuation-Length Database provides values of effective attenuation lengths (EALs) for user-specified materials and measurement conditions. The EALs differ from the corresponding inelastic mean free paths on account of elastic-scattering of the signal electrons. The database supplies “practical” EALs that can be used to determine overlayer-film thicknesses. Practical EALs are plotted as a function of film thickness, and an average value is shown for a user-selected thickness. The average practical EAL can be utilized as the “lambda parameter” to obtain film thicknesses from simple equations in which the effects of elastic-scattering are neglected. A single average practical EAL can generally be employed for a useful range of film thicknesses and for electron emission angles of up to about 60°. For larger emission angles, the practical EAL should be found for the particular conditions. Second, we describe a new NIST database for the Simulation of Electron Spectra for Surface Analysis (SESSA) to be released in 2004. This database provides data for many parameters needed in quantitative AES and XPS (e.g., excitation cross-sections, electron-scattering cross-sections, lineshapes, fluorescence yields, and backscattering factors). Relevant data for a user-specified experiment are automatically retrieved by a small expert system. In addition, Auger electron and photoelectron spectra can be simulated for layered samples. The simulated spectra, for layer compositions and thicknesses specified by the user, can be compared with measured spectra. The layer compositions and thicknesses can then be adjusted to find maximum consistency between simulated and measured spectra, and thus, provide more detailed characterizations of multilayer thin-film materials. SESSA can also provide practical EALs, and we compare values provided by the NIST EAL database and SESSA for hafnium dioxide. Differences of up to 10% were found for film thicknesses less than 20 Å due to the use of different physical models in each database.     

Dynamic secondary ion mass spectrometry and X-ray photoelectron spectroscopy on artistic bronze and copper artificial patinas

To prevent the natural processes of decay and to develop and improve the treatments of conservation and restoration of artistic bronzes meaning statues and sculptures, it is important understanding the patination processes and the knowledge of artificially corroded surfaces. Chemical and physical characterization of artificial patinas obtained on artistic bronzes and coppers by using the 19th century Western traditional patination techniques and recipes by means of SEM-EDS, light microscopy and ATR/FT-IR has been done in previous studies [I.Z. Balta, L. Robbiola, Characterization of artificial black patinas on artistic cast bronze and pure copper by using SEM-EDS and light microscopy, in: Proceedings of the 13th European Microscopy Congress, 22-27 August 2004, Antwerp, Belgium, EMC 2004 CD-Rom Conference Preprints; I.Z. Balta, L. Robbiola, Traditional artificial artistic bronze and copper patinas—an investigation by SEM-EDS and ATR/FT-IR, in: Proceedings of the 8th International Conference on Non Destructive Investigations and Microanalysis for the Diagnostics and Conservation of the Cultural and Environmental Heritage, 15-19 May 2005, Lecce, Italy, ART’05 CD-Rom Conference Preprints]. Differences in morphology (structure, thickness, porosity, adherence, compactity, uniformity, homogeneity) and also in composition, on both artistic cast bronze and pure copper patinas, were clearly evidenced. Further in-depth investigation is required to be carried out in order to better understand the patinas mechanisms of formation and the layers kinetics of growth. The elemental and chemical analysis, either on a surface monolayer or in a depth profile, by using the Secondary Ion Mass Spectrometry (SIMS) and X-ray Photoelectron Spectroscopy (XPS) techniques, can provide this kind of information, unique at trace-level sensitivity. SIMS has proved to be a suitable analytical technique for analyzing small amounts of material with high atomic sensitivity (ppm or even ppb) and high depth/lateral resolution in the micron and sub-micron range [R.G. Wilson, F.A. Stevie, C.W. Magee, Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis, Wiley & Sons, New York, 1989; M. Dowsett, A. Adriaens, The role of SIMS in cultural heritage studies, Nucl. Instr. Meth. Phys. Res. B 226 (2004) 38-52]. XPS has the ability to provide detailed chemical information on virtually each kind of solid sample, and elemental identification is therefore possible due to the core level photoemission. The most important advantage is the high surface sensitivity of the chemical information (a few monolayers) [E. Ciliberto, G. Spoto, Modern Analytical Methods in Art and Archaeology, John Wiley & Sons, Inc., New York, 2000]. In addition elements’ relative abundance can be made semi-quantitative or quantitative and information on chemical bonds can be derived.The aim of the present work is to highlight the advantages and the limits of XPS and Dynamic SIMS surface analytical techniques for the characterization of artistic bronze and copper artificial patinas. The results obtained on the analyzed samples allowed the distribution of the main elements in the corrosion patinas layers and the contribution of each elements present in bronze matrix to the color of the resulting patinas to be precisely revealed. This information could be used for comparative studies between artificial and natural patinas, and also for provenience and authentication studies for artistic and archaeological bronzes.     

Surface characterization of oxygen-functionalized multi-walled carbon nanotubes by high-resolution X-ray photoelectron spectroscopy and temperature-programmed desorption

Multi-walled carbon nanotubes were exposed either to nitric acid or to an oxygen plasma to synthesize oxygen-containing functional groups which were characterized by high-resolution X-ray photoelectron spectroscopy (XPS). The C 1s spectra revealed that the treatment with nitric acid mainly resulted in the formation of carboxylic (COOR) and phenolic (COR) groups, whereas the plasma treatment led to a higher amount of carbonyl (CO) groups. Furthermore, the nitric acid treatment yielded a 60% higher surface oxygen concentration compared to the plasma treatment, and created a minor amount of nitrogen-containing functional groups. Thus, the nitric acid treatment was found to be more effective in creating acidic functional groups. The presence and the thermal stability of these groups was also investigated by temperature-programmed desorption (TPD). The release of carbon dioxide was detected at about 350 and 450 °C, indicating the decomposition of COOR groups. The CO groups were more stable decomposing even above 600 °C. In addition, ammonia was adsorbed as probe molecule followed by TPD to derive the amount and the acidity of the carboxylic and phenolic groups.     

The adsorption of methyl iodide on uranium and uranium dioxide: Surface characterization using X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES)

The adsorption of methyl iodide on uranium and on uranium dioxide has been studied at 25 °C. Surfaces of the substrates were characterized before and after adsorption by X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). The XPS binding energy results indicate that CH₃I adsorption on uranium yields a carbide-type carbon, UC, and uranium iodide, UI₃. On uranium dioxide the carbon electron binding energy measurements are consistent with the formation of a hydrocarbon, —CH₃-type moiety. The interpretation of XPS and AES spectral features for CH₃I adsorption on uranium suggest that a complex dissociative adsorption reaction takes place. Adsorption of CH₃I on UO₂ occurs via a dissociative process. Saturation coverage occurs on uranium at approximately two langmuir (1 L = 10^?6 Torr s) exposure whereas saturation coverage on uranium dioxide is found at about five langmuir.     

Weathering properties of treated southern yellow pine wood examined by X-ray photoelectron spectroscopy, scanning electron microscopy and physical characterization

In this study the weathering behavior of southern yellow pine (SYP) wood samples pretreated in different solutions has been examined using X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and various types of physical characterization regarding material loss and discoloration. The treatment solutions include water as a control, a commercially available water repellent (WR) wood treating additive and polyethylene glycol (PEG) products including PEG PLUS™, PEG 8000 solutions and Compound 20M in varying concentrations. All contained the wood preservative chromated copper arsenate (CCA). One sample was treated with a CCA solution only. The treatments were carried out at 20 °C and 150 psig for 1/2 h after exposure to vacuum (28 mmHg) for 15 min. Simulated weathering was achieved in an Atlas 65-W Weather-Ometer for 2000 h with both light and dark periods and rain. The temperature ranged from 23 °C during the dark cycle to 35 °C during the light cycle. With weathering the XPS O/C ratios increase due to oxidation of the surface. Exposure to UV light results in bond breakage and reaction with oxygen in the presence of air to form organic functional groups such as , , CO and/or O-C-O. These oxidized products can protect the underlying wood from deterioration if they are insoluble in water and remain on the surface as a protective coating. If soluble, rain washes the compounds away and assists in the degradation. Correlated changes are observed in the XPS O/C ratios, the high-resolution XPS C 1s spectra, the SEM micrographs and physical measurements including thickness alteration, weight loss, and discoloration by yellowing or whitening of the weathered wood. The PEG treatments are effective in protecting wood with the 2% PEG PLUS treatment providing the best weathering behavior similar to that of the CCA treatment. The WR and water treatments yield the poorest weathering properties.     

Lead deposition onto a polycrystalline platinum surface: I. Study by Auger electron spectroscopy and line of sight mass spectroscopy

Progressive lead deposition onto a platinum substrate at 300 K (as analysed by Auger electron spectroscopy and thermal desorption) corresponds to a two-stage mechanism. The most probable explanation is an adsorption of lead atoms in the first “layer” (almost covering the surface), followed by a lead-rich platinum alloy formation. These two types of surface present different catalytic properties, as it will be shown in following papers.     

In situ characterization of liquid network structures at high pressure and temperature using X-ray absorption spectroscopy coupled with the Paris-Edinburgh press

ABSTRACT

We review recent progress in studying structural properties of liquids using X-ray absorption spectroscopy coupled with the Paris-Edinburgh press at third-generation synchrotron facilities. This experimental method allows for detecting subtle changes in atomic arrangements of melts over a wide pressure–temperature range. It has been also employed to monitor variations of the local coordination environment of diluted species contained in glasses, liquids and crystalline phases as a function of the pressure and temperature. Such information is of great importance for gaining deeper insights into the physico-chemical properties of liquids at extreme condition, including the understanding of such phenomena as liquid–liquid phase transitions, viscosity drops and various transport properties of geological melts. Here, we describe the experimental approach and discuss its potential in structural characterization on selected scientific highlights. Finally, the current ongoing instrumental developments and future scientific opportunities are discussed.     

Study of nitrogen ion implantation and diffusion phenomena on thin chromium layers followed by the atomic force microscopy and secondary ion mass spectroscopy techniques characterization

This research investigates the effect of ion implantation dosage level and further thermal treatment on the physical characteristics of chromium coatings on Si(1 1 1) substrates. Chromium films had been exposed to nitrogen ion fluencies of 1 × 10¹⁷, 3 × 10¹⁷, 6 × 10¹⁷ and 10 × 10¹⁷ N⁺ cm⁻² with a 15 keV energy level. Obtained samples had been heat treated at 450 °C at a pressure of 2 × 10⁻² Torr in an argon atmosphere for 30 h. Atomic force microscopy (AFM) images showed significant increase in surface roughness as a result of nitrogen ion fluence increase. Secondary ion mass spectroscopy (SIMS) studies revealed a clear increased accumulation of Cr₂N phase near the surface as a result of higher N⁺ fluence. XRD patterns showed preferred growth of [0 0 2] and [1 1 1] planes of Cr₂N phase as a result of higher ion implantation fluence. These results had been explained based on the nucleation-growth of Cr₂N phase and nitrogen atoms diffusion history during the thermal treatment process.     

Surface segregation of aluminum atoms on Cu-9 at.% Al(1 1 1) studied by Auger electron spectroscopy and low energy electron diffraction

Auger electron spectroscopy (AES) and low energy electron diffraction (LEED) were applied to investigate the segregation of aluminum atoms on a Cu-9 at.% Al(1 1 1) surface. We observed that the Al concentration in the top layer ranged between about 9 and 36 at.% after the sample we used was annealed at different temperatures. The phenomenon of Al atoms segregating on the surfaces was explained well by considering the diffusion length of Al atoms in bulk Cu. LEED measurements showed that R30° structures grew as the concentration of Al atoms increased. The segregation phenomena on surfaces resulted in a stable two-dimensional Cu₆₇Al₃₃ alloy phase in the top layer.