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本文对全息焊点检测的原理作了简要的介绍,针对检测中遇到的具有复杂背景的干涉图,提出了计算机自动处理与判别方法;完成了图像的背景抑制、噪声去除、平滑、细化及条纹的自动识别,获得了较好的结果. 相似文献
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高精度全息干涉计量—相移技术的应用 总被引:2,自引:1,他引:1
本文介绍了一种精确的全息干涉相位测量系统。采用双曝光、双参考光束,并引入相移技术,能够同时获得全场256×256个点的相位变化值;相位测量的重复性优于2%,全场处理时间少于2分钟。 相似文献
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本文报道了一项称为载波相移全息干涉计量的自动相位估算的新技术。该技术的主要特点是不同相移的条纹图案可用双曝光全息重视。这样即可用来对与时间相关的问题进行自动相位估算。 相似文献
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本文介绍了全息干涉术用于材料无损检测的基本原理、实用工业领域和实验技术,以及国外在全息无损检测中所采用的新器件、新技术、新方法。 相似文献
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电子学全息干涉术用于温度场测量 总被引:7,自引:4,他引:7
探讨了用电子学全息干涉术(双称数字全息干涉术)测量温度场分布及其变化的可行性,利用所设计的全息干涉实验光路,对一电烙铁头部周围温度场分布进行了实时全息记录,进而利用一维快速傅里叶变换及数字滤波处理再现出了反映温度场分布的全息干涉条纹图样,实验结果表明,与传统的光学全息干涉术相比,电子学全息干涉术借助于高分辨率CCD记录及高速计算机数字处理技术,从而可实现光学全息图的数字化记录、存储和重现。同时,利用再现物场相位倍增原理还可实现对干涉条纹数目的倍增,或利用物场相位分布的直接计算精确获取任意两点间的相位差,从而提高测量精度。此外,由于能够在不改变光路的前提下以较高的重复频率完成光学全息图的记录,电子学全息干涉术可以用于记录三维物场的变化并接近实时地再现和测量三维物场的变化规律,因此是一种极有发展前途的新型实时全息干涉计量技术。 相似文献
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介绍了一种新的重构三维折射率场的方法。该方法利用一个共焦检测系统对被测对象的像面全息干涉图进行三维扫描,并记录干涉强度,通过对强度数据的处理,可以重构出三维折射率场。这种方法原理简单,不需要进行多方向的全息干涉记录和复杂的重构过程。给出了初步的试验结果,证明该方法是可行的。 相似文献
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以傅里叶变换为基础,提出了低倍率放大重构像全息干涉条纹的具体方法,它不仅光路简单,放大倍率可以人为选择,而且由此得到的全息干涉条纹效果很好. 相似文献
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针对光纤传输和干涉成像阵列中的相位误差, 提出了一种基于特殊光子晶体的全息相位校正方法。首先分析了光纤干涉阵列成像的基本原理和相位信息的传输过程, 以一维线性阵列建立成像系统相位误差模型, 通过对参考光束和探测器前的快门交替打开和闭合, 来分别实现在晶体上写入由光纤阵列的出射光束与参考光束干涉形成的含有相位误差的光栅函数, 和光纤中出射光束被该光栅衍射和相位偏移以消除相位误差, 从理论上分析了上述基于光子晶体的全息法相位校正原理。最后采用所建立的含有相位误差的干涉阵列进行成像仿真, 对未加校正、采用本文方法和采用冗余基线校正的结果进行了对比分析。 相似文献
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本文提出一种检测柱透镜象差的全息干涉法。文中详细介绍了全息干涉法的原理,具体实验以及有关调整问题。整个过程操作方便,光路按排简单。 相似文献
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A method for generating a high visibility digital speckle shearing fringe pattern is proposed. A three-step phase shifting technique which involves the introduction of arbitrary phases is utilized. The phase shifting technique is carried out using a rotating mirror and a theoretical model which involves a linear correlation algorithm is discussed. Experimental results showing correlation fringe patterns and a deformation phase map are presented. 相似文献
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Comparative analysis of actual fringe patterns, which are induced by combined implementing the hole drilling method and reflection hologram interferometry for residual stresses determination, is presented. Involved considerations are related to plane thin-walled structural elements. A set of interferograms of perfect (ideal) form is selected proceeding from one-side measurements. A base for recognising each specific ideal configuration is a fine coincidence between actual interferograms and analogous reference fringe patterns constructed for the same stress state. Perfect (ideal) both actual and reference fringe patterns are defined as a response of pure membrane 2D stress field on through hole drilling between exposures. Main principles of creating the regular catalogue of reference fringe patterns inherent in through hole drilling in thin-walled components are formulated. Emphasis is made on a careful collecting and classifying actual interferograms with clear indications of bending stress presence in total residual stress field. Evidences needed for a reliable classification of the type of residual stresses field of interest are established and verified. A response of superimposed residual stress field, which consists of both membrane and bending components, is characterised by various deviations of each specific fringe pattern from an ideal form. More deep analysis of fringe patterns related to superimposed residual stress field is based on specially designed technique. The main essence of the approach developed is simultaneous measurements of through hole distortions in two principal strain directions on opposite sides of thin plane specimen. These sides are faces of the drill entrance and exit. Sophisticated optical set-up that is capable of obtaining high-quality fringe patterns in the course of two-side measurements is developed and implemented. Typical set of fringe patterns obtained for single probe hole on opposite specimen faces is presented. 相似文献