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1.
Air, liquid and solid sample interferometric gaps of the same thickness and simultaneously enclosed in a wedge interferometer are used to produce fringes of equal chromatic order. A mica sample of dimensions 2×5 mm2 and an immersion liquid of the same refractive index are used. A single shot interferogram containing fringes in the three gaps is sufficient to deduce the needed experimental data. Locations of fringe maxima are introduced in a numerical procedure to retrieve the sample and liquid refractive indices across the visible spectrum. The numerical procedure is based on a simple dispersion function of wavelength and wavenumber. A modified two-term Sellmeier dispersion formula has been used for fitting the experimental data and deducing the needed dispersion parameters.  相似文献   

2.
Fringes of equal chromatic order are produced in air, immersion liquid and mica sample interferometric gaps. The three gaps are of the same thickness and simultaneously enclosed in a wedge interferometer. A single-shot interferogram contains fringes in the three gaps is sufficient to deduce the needed experimental data. A non-numerical procedure is used for determining the refractive indices of the immersion liquid and mica sample across the visible spectrum. There is no need for any numerical fitting stage nor for the application of any theoretical model concerning the dispersion behavior of the sample under test. A modified two-term Sellmeier dispersion formula has been used for fitting the experimental data and deducing the needed dispersion parameters.  相似文献   

3.
Fringes of equal chromatic order in transmission across a thin liquid or a thin solid sample inside a wedge interferometer, followed with a grating spectrograph, are produced. A single-shot interferogram of the air and sample regions is recorded. Locations of fringes maxima in the air region are fitted in a numerical procedure based on Cauchy's dispersion function. Then it is used for measuring the interferometric gap thickness. The order of interference in the sample region is represented by a third-order polynomial in the wavenumber for deducing the sample group refractive index. An error analysis of the measured group refractive index is given. The method is applied for measuring the group refractive index of water and mica samples across the visible spectrum. The method measures both the sample thickness and its group refractive index. It is static with no moving parts and suitable for thin liquid or solid samples without immersion liquids.  相似文献   

4.
A new application of the Paul wavelet algorithm was presented to determine the refractive index dispersion of a dielectric film from transmittance spectrum in the visible and near infrared region. The developed algorithm was tested by simulated data and experimentally applied to a sample of mica. The obtained refractive index dispersion determined by the Paul wavelet algorithm was compared with the refractive index values determined by the envelope and fringe counting methods, and also with the established result. It was shown that the degree of the Paul wavelet has a major effect on the outcome of a refractive index determination. The noise immunity of the presented method was shown by the simulation study.  相似文献   

5.
A spectral-domain technique based on tandem interferometry is used for measuring the group dispersion of optical samples over a wide wavelength range. The technique utilizes a tandem configuration of a Michelson interferometer and an unbalanced Mach–Zehnder interferometer with a sample inserted into its test arm. First, the theoretical background of the technique is presented and then experiments with individual interferometers and their tandem configuration are specified. In all the experiments the spectral signals are recorded to measure the equalization wavelength as a function of the path length difference, or equivalently the group dispersion. We measure the group refractive index as a function of wavelength for a glass sample of known thickness and for a quartz crystal as well.  相似文献   

6.
强度调制型光纤折射率传感器的设计与研究   总被引:2,自引:1,他引:1  
苏辉  黄旭光  邬怡婷 《光子学报》2008,37(4):713-716
研制了一种基于菲涅耳反射原理的测量液体折射率的光纤传感器.该传感器采用普通FC/PC尾纤插头作为传感头.整个实验系统需要的元件少、光路简单.讨论了测量的基本原理和数据处理方法.采用相对强度的数据处理方法,有效地消除了光源不稳定性和光路中各种损耗所带来的误差,提高了系统的测量准确度.实验结果表明,测量准确度能够达到10-4 量级,并且适合微量液体的测量.该测量方法还可扩展到固体、气体和其它与折射率相关参量的测量.  相似文献   

7.
为了得到云母波片的相位延迟量和双折射率随波长的变化关系,利用椭偏光谱仪连续测量了云母波片在400~770nm光谱范围内的延迟量.在对云母波片进行校准后,测量的数据被光电探测器收集并输送到计算机,根据输出的数据可以得到云母波片的相位延迟量随波长的变化.利用测得的延迟量计算出了云母波片在一定光谱范围内的双折射率,得到了云母波片的双折射率色散曲线,并通过拟合得到了双折射率色散公式.该方法能测量任意波片的相位延迟量,并且具有测量方便、周期短、精度高等特点.  相似文献   

8.
对目前实验教科书中研究棱镜色散规律常用的方法具有数据多、用时长及技巧性强的不足,提出了一种比较简洁直观的测量棱镜折射率的方法,即直接测量光线的入射角和不同频率光的出射角,用折射定律即可算得各色光的折射率.通过与传统的实验方法相比较,结果表明在准确度上二者是一致的.最后用Matlab拟合出棱镜的色散曲线及公式.  相似文献   

9.
用干涉原理测定液体折射率的新方法   总被引:3,自引:0,他引:3  
雷华  鲁阳  潘勤敏 《光学技术》2001,27(5):441-443
介绍了一种利用干涉原理测定液体折射率的新方法。其基本特点是不需要取样 ,直接无干扰地测定平行平板液池内介质的折射率 ,在适当控制实验条件的情况下 ,测量精度可以达到小数点后 5位。对如何简化计算并消除池壁参数的影响以提高测量精度等问题进行讨论 ,给出了分析结果。以水为检测对象 ,进行了实验验证  相似文献   

10.
We present a simple method to measure the refractive index dispersion over a broad wavelength range (0.6-1.6 μm). In a first step, the optical group indices are obtained by measuring the time-retardation of tunable 150 fs laser pulses within a sample relative to air. The refractive index dispersion is then calculated using a Sellmeier equation that describes the measured group index dispersion. We show that our experimental data agree with previously published results to within 2 × 10−4 for a 3 mm thick sample of fused silica and to within 3 × 10−3 for the index n1 of a 2 mm thick crystal of the highly dispersive and anisotropic organic crystal 4-N,N-dimethylamino-4′-N′-methyl stilbazolium tosylate (DAST).  相似文献   

11.
泄漏波导法精确测量薄膜参数的理论和实验研究   总被引:5,自引:5,他引:0  
肖丙刚  宋军  何赛灵 《光子学报》2005,34(4):586-589
对泄漏波导法测量薄膜折射率和厚度的实验方法做了介绍,基于四层介质结构的理论模型,通过严格的电磁场理论推导出了测量方法依据的本征色散方程,并使用了Newton-Raphson方法求解复传播常数,保证了测量的精确与快捷.以等离子增强化学气相沉积法生长的SiO2薄膜为例,对其折射率和厚度进行了测定.实验证明,本文方法与传统方法相比,不仅具有更高的测量精度,而且数据处理更加快捷,完成一片样品测试,仅花费机时60 ms.  相似文献   

12.
The chromatic dispersion for conventional and Er-doped fibers using the refractive index approximation is examined. A first, analytical method for investigation of dispersion in step index triple clad optical fiber is used. To design of zero-dispersion shifted fiber for optical communication purpose manipulation of the refractive index and radius of the core are considered. We show that in presence of the Si-NC-Er ions, zero-dispersion wavelength is displaced and the dispersion quantity is increased. In this work, we try to optimize system parameters to obtain minimum dispersion and dispersion shifted fiber with control of the doping levels of Er ions and Si-NC as well as doping profiles. For especial case, we assumed the Gaussian inhomogeneous core refractive index for zero-dispersion wavelength and dispersion managements.  相似文献   

13.
侯蕊  关昕  蒋同春 《光学技术》2017,43(2):118-121
提出了一种无损检测眼镜镜片基底折射率的方法。该方法通过测量眼镜镜片在可见光区域内的反射比数据,采用高斯牛顿迭代法拟合反射比曲线来检测镜片基底折射率,并用Cauchy模型分析了镜片折射率的色散现象。检测结果表明,镜片折射率的相对误差不超过2%,可基本满足对镜片折射率区间的判定。  相似文献   

14.
用迈克尔逊干涉仪测量全息干板膜厚度   总被引:4,自引:2,他引:2       下载免费PDF全文
蒋礼  罗少轩  阳艳  杨科灵 《应用光学》2006,27(3):250-253
全息干板膜的厚度是全息干板的重要参数之一。使用迈克尔逊干涉仪和白光光源对2种全息干板膜厚度进行测量,并对测量结果误差进行分析,给出了测量误差与膜厚及折射率之间的关系以及此方法的适用范围。研究结果表明:在膜厚从8μm增至41μm的过程中,测量结果的绝对误差≤2μm且变化很小,相对误差则从14.1%降到了2.2%。随着膜厚的增加,相对误差明显降低;折射率n也参与了误差传递,其值与测量误差呈类似反比关系;当n值在1.5附近时,为保证测量的准确性,所测膜厚≥40μm。最后指出,迈克尔逊干涉仪在测量全息干板膜等较厚的薄膜时,具有测量范围大,结果较准确等优点。  相似文献   

15.
Multiple-beam interference fringes of equal chromatic order are produced in air and liquid sample interferometric gaps. The two gaps are of the same thickness and simultaneously enclosed in a wedge interferometer. A single shot interferogram containing fringes in the two gaps is sufficient to deduce the needed experimental data. Locations of the fringe maxima, in the two gaps, are introduced in a non-numerical procedure for determining the gap thickness and the liquid-phase refractive indices across the visible spectrum. The method has been used for measuring the phase refractive indices of human blood-serum, saliva, sweat, urine and water liquids. A third-order polynomial dispersion relation is applied for fitting the measured phase indices. Group refractive indices have been derived and fitted to the same dispersion formula.  相似文献   

16.
A new dielectric slab waveguide with a left-handed material (LHM) cover and substrate is proposed. The dispersion relations and normalized effective thickness of the asymmetric LHM slab waveguide are investigated, in view of the normalized parameters. A number of unusual properties are found, for example, the fundamental and first-order modes do not exist and higher-order modes have double degeneracy. The propagation modes are absent at the low normalized frequency, and the cutoff frequencies of some LHM slab waveguide modes decrease with increase in the asymmetry measure. Unlike traditional slab waveguides, the V –H curves of the LHM slab waveguides are in one-to-one correspondence. Both TE and TM modes are discussed; in addition, the dispersion relations and normalized effective thicknesses of the TM modes are discussed in detail, when the difference in refractive indices of the film and the substrate is small. The results show that the region of mode coexistence taking place near the cutoff frequency becomes narrower with increase in the difference in refractive indices of the film and the substrate. The influence of this difference on the normalized effective thickness curves is different, and becomes smaller and smaller with increase in the value of the asymmetry measure, if different values of the refractive indices are employed.  相似文献   

17.
针对云母晶体材料本身性质所决定的双折射率色散关系不一致性,给波片设计带来非常不利的影响,提出偏光干涉法研究云母的色散特性.即由分光光度计测量出云母晶体的偏光干涉谱,通过对干涉谱极值点所对应波长的精确判断,准确计算出极值点的最大双折射率,获得从紫外至近红外光波段云母晶体的双折射率色散曲线,经多项式拟合数据处理,得到任意波长的双折射率色散公式.为求解不同温度任意波长的云母晶体双折射率提供了一种精确简单的方法,对云母晶体器件的设计与使用有重要的理论依据和参考价值.  相似文献   

18.
史文俊  易迎彦  黎敏 《物理学报》2016,65(16):167801-167801
目前半导体锗在吸收边附近(1550 nm)的压力-折射率系数在实验和理论上并未研究清楚.本文通过测量在不同压力下镀在光纤端面的高结晶度锗薄膜的反射率,来计算得到锗在吸收边附近的压力-折射率系数.本文的实验结果显示,锗在吸收边附近出现反常色散现象,即折射率随能量变化呈正相关,并且其压力-折射率系数出现反常,为正值,这是由于多晶结构中的激子吸收所引起.通过引入描述激子色散的临界点模型,得到锗在吸收边附近的反常色散范围和压力-折射率系数呈正值的范围.本文的结果将有助于基于锗薄膜的通信C波段光学器件的研究.  相似文献   

19.
In this paper, we describe a novel waveguide surface plasmon resonance sensing structure, which consists of a symmetric structure and a planar waveguide. The core component is the symmetric structure of the metal layer, tested sample, and metal layer. The refractive index matching condition of this structure can be adjusted through the thickness of the sample. The planar waveguide is used to excite the surface plasmon wave, and then the parameters are tested and analyzed. The surface plasmon wave is excited when glycerin solutions with concentrations of 0%–70% are used to detect at thicknesses of 300 and 500 nm. The problem that the effective refractive index of the ion exchange planar waveguide is large and using this index to excite the surface plasmon wave between the metal and dielectric for detection is difficult to achieve can be countered by appropriately choosing the thickness of the dielectric in order to be able to measure different refractive indices.  相似文献   

20.
熊芬  胡中文  姜明达 《应用光学》2012,33(1):148-152
常用的测量折射率的方法如偏向角法、自准直法、临界角法、 V棱镜法等,这些方法通常需特制三棱镜与待测件。待测样品不一致且过程复杂,测试定标周期长,难于自动化。为了保证待测材料的完整及实现自动化测量,进行了基于平行平板的折射率非接触测量的尝试。运用该方法进行折射率的测量,不需特制三棱镜并且待测件与待测样品一致。分析表明,通过选择合适的测量角度,该方法旋转角度精度为a=0.003(即10),导轨精度为L=0.000 8 mm,平行平板厚度测量精度为d=0.001 mm。  相似文献   

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