Thermal conductivity and specific heat of bulk amorphous chalcogenides Ge20Te80−xSex (x = 0,1,2,8)

Bulk amorphous chalcogenide samples of Ge₂₀Te_80−xSe_x (x = 0, 1, 2, 8) have been prepared using a melting-quench method, and characterized by the differential scanning calorimetry, X-ray powder diffraction, high-resolution transmission electron microscopy, specific heat and thermal conductivity measurements. The low temperature specific heat measurements identified some localized low-frequency oscillation modes (Einstein modes) in conjunction with a Debye-like behavior. It was found that with increasing Se concentration the characteristic Debye temperature did not change whereas the Einstein temperature slightly decreased. The lattice thermal conductivity of all Ge₂₀Te_80−xSe_x samples exhibited typical amorphous heat conduction behavior, which has been discussed in connection with the phonon mean free path and in the context of a phenomenological model of heat conduction for highly disordered system.     

Stability of amorphous SETE mixtures under pressure

A sharp semiconductor-metal transition is observed for a-Se₈₀Te₂₀ mixture at about 90 kbar. The resistance for the specimen which experiences the semiconductor-metal transition is recovered after releasing pressure. The sharp semiconductor-metal transition is reproducible in the second compression. X-ray diffraction measurements reveal that the amorphous specimen is transformed into the crystal with layer structure on the transition to metallic state and on releasing pressure the specimen is transformed again into the amorphous state. A brief comment is given for the interesting phenomena that the high-pressure crystalline phase can be recovered to the amorphous phase on releasing pressure.     

Composition dependence of photoconductivity of Al20AsxTe80−x glasses

The time dependent photocurrent of Al₂₀As_xTe_80−x glasses has been studied at low temperatures. It is found that the photocurrent of all the Al₂₀As_xTe_80−x samples studied does not decrease appreciably during illumination, which is consistent with the behavior of other narrow band gap amorphous chalcogenides. Further, the photosensitivity is found to be maximized for the composition x=25, which can be associated with rigidity percolation.     

Structure, electrical, optical and thermal properties of Ge4Sb4Tex (x = 8, 9 and 10) thin films

The crystalline samples of Ge₄Sb₄Te₁₀, Ge₄Sb₄Te₉, and Ge₄Sb₄Te₈ were prepared and their amorphous semiconducting thin films obtained by flash evaporation. Their sheet resistance decreased slowly with temperature up to 147–160 °C with activation energy of electrical conductivity ΔE = 0.40–0.44 eV. Above these temperatures, the sheet resistance drops abruptly by several orders due to crystallization. The drop of resistivity proceeds in two steps. Two steps of phase change were also found on curves of DSC and on the temperature dependence of index of refraction. It pays for slow heating rates, crystallization induced by short (≈30 ns) laser pulses proceeds probably in one step only for all studied samples (as it follows from X-ray diffraction), not only for Ge₂Sb₂Te₅ in which a single phase formation was confirmed. The crystallization temperatures are increasing slightly with decreasing Te content in the series Ge₄Sb₄Te₁₀–Ge₄Sb₄Te₉–Ge₄Sb₄Te₈ from 147 to 160 °C. The X-ray diffractograms revealed that in laser crystallized samples can be found only cubic modification of Ge₂Sb₂Te₅ type (a = 0.6 nm), while the samples annealed (230 °C, 2 h) or annealed after the crystallization with laser pulse, contain also small amounts of hexagonal phase.     

The neutron diffraction study of liquid GeTe and As2Te3

The radial distribution analyses for GeTe and As₂Te₃ are made at temperatures above the melting point in the range of momentum transfer between 0.7 and 10.0 Å^?1 by the neutron diffraction technique. Furthermore, the local order in amorphous GeTe is determined by analyzing the intensity data of the electron diffraction of its thin film. The result for the amorphous film indicates that the local distribution of atoms in amorphous GeTe is not characteristic of the structure of its crystalline state. The shape of the peaks of the intensity curve for liquid GeTe differs from that for the amorphous and crystalline states. However, the short bond length and the small coordination number determined from liquid RDF suggest that the covalent-like bonding between nearest-neighbor atoms remains unbroken when melting. The general form of the structure factor for liquid As₂Te₃ is similar to that for the amorphous material reported previously. The position of the first peak of RDF in the liquid state is observed to be shifted to a shorter distance than the average of nearest-neighbor atoms in crystalline As₂Te₃. The structure of GeTe differs considerably between the crystalline, amorphous and liquid states, whereas the local order in the liquid As₂Te₃ is similar to that in the amorphous state but not in the crystalline state.     

Crystallization kinetics of amorphous Se60S20Te20

The temperature and the time dependence of the electrical conductivity (6) of a-Se₆₀S₂₀Te₂₀ are investigated. Conductivity anomalies are observed during the crystallization growth from both the amorphous solid and supercooled liquid phases. The changes of 6 during different isothermal annealing of a-Se₆₀S₂₀Te₂₀ samples with time are used to determine the ratio transformed from amorphous to crystalline. A value of 0.97±0.16 eV has been obtained for the activation energy of the crystal growth in the temperature range of 120–170°C.     

Crystallization process on amorphous GeTeSb samples near to eutectic point Ge15Te85

One of most important properties of some tellurium-based chalcogenide glasses is the optical and electrical switching between two states: the glass and the crystalline state. The understanding in these systems of the glass to crystal transition and its transformation kinetics is essential for their application in non-volatile memories. GeTeSb and GeTe amorphous samples of compositions close to the eutectic point Ge₁₅Te₈₅ were obtained by rapid solidification from the liquid state employing melt spinning technique. The glass forming ability of this system, for this cooling technique, is restricted to a small composition range nearby the binary eutectic. The crystallization kinetics of the samples was studied by means of differential scanning calorimetry (DSC) under both isothermal and continuous heating regimes. The quenched samples and the crystallization products have been characterized by X-ray diffraction with Cu(Kα) radiation. The crystallization temperature, activation energy, crystallization enthalpy and the dependence of these properties on concentration are reported. The crystallization study of Ge₁₅Te₈₅ glasses shows: a primary crystallization of Te superimposed with a secondary crystallization of GeTe. The addition of Sb (5 at.%) to the eutectic point Ge₁₅Te₈₅ modifies this behavior: the crystallization of Ge₁₃Sb₅Te₈₂ glasses consists on the crystallization of Te and Ge₂Sb₂Te_5. The crystallization of the ternary glasses was modeled.     

Structural change of laser-irradiated Ge2Sb2Te5 films studied by electrical property measurement

Sheet resistance of laser-irradiated Ge₂Sb₂Te₅ thin films prepared by magnetron sputtering was measured by the four-point probe method. With increasing laser power the sheet resistance undergoes an abrupt drop from 10⁷ to 10³ Ω/□ at about 580 mW. The abrupt drop in resistance is due to the structural change from amorphous to crystalline state as revealed by X-ray diffraction (XRD) study of the samples around the abrupt change point. Crystallized dots were also formed in the amorphous Ge₂Sb₂Te₅ films by focused short pulse laser-irradiated, the resistivities at the crystallized dots and the non-crystallized area are 3.375 × 10^?3 and 2.725 Ω m, sheet resistance is 3.37 × 10⁴ and 2.725 × 10⁷ Ω/□ respectively, deduced from the I–V curves that is obtained by conductive atomic force microscope (C-AFM).     

Electrical switching in As-Te-Ag system-composition and temperature dependence

The current-voltage characteristics related to switching phenomena in silver doped arsenic telluride glasses, As₂₀Te_80−xAg_x and As₄₀Te_60−xAg_x, have been investigated over a wide composition range (4?x?14). The samples are found to show threshold switching behavior with the number of switching cycles withstood by the samples depending on the ON state current. The switching voltages are found to decrease with increase in silver content and a sharp minimum is seen at the composition x=12 for the As₂₀Te_80−xAg_x glasses and x=11 for the As₄₀Te_60−xAg_x glasses. An effort has been made to understand the observed composition dependence on the basis of increase in the conductance of the samples with silver addition and local structural effects.     

Structural study of amorphous Al0.20As0.50Te0.30, Al0.10As0.40Te0.50 and Al0.10As0.20Te0.70 by X-ray diffraction (II)

A spherical-shaped model of Al_0.20As_0.50Te_0.30, Al_0.10As_0.40Te_0.50 and Al_0.10As_0.20Te_0.70 amorphous alloys has been performed by the random Monte Carlo method. These models describe quite well the experimental radial distribution functions and abide by the expected coordination numbers apart from the threefold coordinated Te, of which an excess has appeared. The structures are formed, basically, of distorted tetrahedra around the Al atoms whose corners are occupied by As or Te atoms. Also, a separated phase model for Al_0.10As_0.20Te_0.70 alloy has been built taking into account the results of thermodynamical study on this amorphous alloy system. The fitting of this model was better than that of the model generated under the hypothesis of a continuous phase.     

Low-temperature specific heat of amorphous and crystalline Te0.81Ge0.15As0.04

We have measured the specific heats of amorphous and crystalline specimens of Te_0.81Ge_0.15As_0.04 between 0.2 and 20 K, and of crystalline Te_0.93As_0.07 between 1 and 20 K. Amorphous Te_0.81Ge_0.15As_0.04 shows a low-temperature linear specific heat anomaly whose magnitude, 0.027 mJ/mol-K², is similar to that of other amorphous insulators. Crystalline Te_0.81Ge_0.15As_0.04 exists as a two-phase material comprised of GeTe and As-doped Te. The specific heat of this material is analyzed in terms of a weighted average of the properties of its two constituents.     

ESR study of Mn2+ in GeTe and GeTeSi glasses

The electron spin resonance spectra of Mn²⁺ ions have been studied in Ge_xTe_100?x with x = 15, 17.5 and 20, and Ge_20?xTe₈₀Si_x with 0 ?x? 20. All samples are found to exhibit six hyperfine lines centered at g = 4.3 with hyperfine interaction constant A = 56 × 10^?4cm^?1. The g = 4.3 line is interpreted as being caused by Mn²⁺ ions incorporated in the amorphous network and surrounded by four Te atoms in an arrangement of orthorhombic symmetry. Some of the samples of GeTe show a g = 2.0 line. This line also appears after heat treatment in air at temperatures above the glass transition temperature. It is concluded that the g = 2.0 line is caused by Mn²⁺ ions in phase separated microcrystalline or concentrated regions of MnO in the glass.     

Multiple phase-transition in Ge2Sb2Te5 based phase change memory cell by current–voltage measurement

A Ge₂Sb₂Te₅ based phase change memory (PCM) cell was fabricated by a standard 0.18 μm complementary metal–oxide-semiconductor technology, combined with subsequent special lift-off process. Through current–voltage measurements, the phase change from the amorphous state (high resistance state) to the face-centered cubic crystalline state and the hexagonal close-packed crystalline state (two kinds of different low resistance states) was observed. In addition to the typical phase-transition, where the PCM cell changes from initial amorphous state directly into final crystalline state, intermediate resistance states were observed during the phase changes from the high resistance state to the low resistance state.     

Signatures of Ge2Sb2Te5 film at structural transitions

Ge₂Sb₂Te₅ (GST) films, one of the most suitable Chalcogenide alloys for Phase change Random Access Memory applications are studied for changes in sheet resistance, optical transmission, morphology and surface science by annealing at various transition temperatures. The crystallization leads to an increase of grain size and roughness in the films and the resistance changes to three orders of magnitude. Optical studies on GST films show distinct changes during phase transitions and the optical parameters are calculated. An increase of Tauc parameters B^1/2 indicates a reduction in disorder during phase transition. It is confirmed from XPS studies that Ge-Te, Sb-Te bonds are present in both amorphous and crystalline phases whereas Sb-Ge, Te-Te, Sb-Sb bonds are absent.     

Crystalline–amorphous and amorphous–amorphous transitions in phase-change materials

The transition from the crystalline state to amorphous state and back has been studied in the particular case of the GeSb₂Te₄ phase-change material by a computer simulation procedure. Modelling at the nanoscale indicates specific structural characteristics, especially the multiplicity of the amorphous phase as opposite to the uniqueness of the crystalline phase. In the particular case of the Si₁₂Ge₁₀As₃₀Te₄₈ switching glass two types of ordering have been pointed out and characterized.     

Electrical conductivity of GeTe glasses under hydrostatic pressure

The electrical conductivity of some GeTe bulk glasses has been measured between 10 and 80°C under hydrostatic pressure up to 3000 bar. The electrical conductivity (σ) of as-prepared, amorphous samples can be expressed by an equation: σ = A exp (?B/kT). For Ge₁₇Te₈₃ glass, the pressure dependences of the constants, A and B, are: (d ln A/dp) = ?3.2 × 10^?4 bar^?1 and (dB/dp) = ? 2.1 × 10^?5 eV · bar^?1. The results are analysed in terms of the low-mobility band model of Mott-CFO for amorphous semiconductors.     

Effects of Ge addition on the optical and electrical properties of eutectic Sb70Te30 films

The aim of this work is to study the influence of Ge addition on the optical and electrical properties in eutectic SbTe thin films (with the compositions: Sb₇₀Te₃₀, Ge₂Sb₇₀Te₂₈, Ge₅Sb₇₀Te₂₅ and Ge₁₀Sb₆₅Te₂₅) using visible optical reflectance, ellipsometry measurements, near infrared transmittance spectra, and four probe electrical resistivity measurements. From near infrared transmittance measurements the optical band gap was determined using Tauc’s expression for amorphous materials, a value of about 0.47 eV was obtained without any clear dependence on the Ge content. All amorphous films have approximately the same reflectance value, however the contrast ratio between the crystalline and amorphous phases decrease with increase of Ge. Using in situ four probe measurements versus temperature the dependence of the activation energy of conductance and the onset of the crystallization temperature have been determined for different materials. Four probe measurements have shown that the resistivity of amorphous films increases with increase of Ge. The results obtained have shown that optical and electrical properties of SbTe films with near eutectic composition change with the Ge content and depending on the application, in either optical or electrical memory devices, the most suitable composition needs to be determined.     

Structural change of liquid Si15Te85 and Si20Te80 with temperature: Ab initio molecular dynamics simulations

Using ab initio molecular dynamics simulations, the structural and electronic properties of liquid Si₁₅Te₈₅ and Si₂₀Te₈₀ at two temperatures were studied respectively. Compared with available experimental data, the calculated structure factors are acceptable. From symmetry arguments, the calculated partial bond-angle distribution functions suggest that with increasing temperature the extensive tetrahedral network structures persist longer in liquid Si₂₀Te₈₀ than those do in liquid Si₁₅Te₈₅. Our results indicate that the local tetrahedral structure around Si atoms and the Peierls-like distorted local atomic structure around Te atoms both play important roles in the structural change of liquid Si₂₀Te₈₀ and Si₁₅Te₈₅, which also suggest that the mechanisms of the structural change upon cooling in liquid Si₂₀Te₈₀ and Si₁₅Te₈₅ are of no essential difference. The results of DOS and LDOS indicate that the variation of the dip in DOS at E_F mainly results from the change of Te p orbitals.     

Structural study of amorphous Al0.20As0.50Te0.30, Al0.10As0.40Te0.50 and Al0.10As0.20Te0.70 by x-ray diffraction (I)

An analysis of the atomic radial distribution function of Al_0.20As_0.30Te_0.30, Al_0.10As_0.40Te_0.50 and Al_0.10As_0.20Te_0.70 amorphous alloys obtained from quenching of the molten mixture of the elements was performed. A structure in which all the Al atoms are tetrahedrally bonded to the other types of atoms in the material, would satisfy the requirements of the experimental curve. Tetrahedral groups might be linked to each other by As and Te atoms, or directly through a Te or As atom belonging to more than one tetrahedra.     

Chemical shifts of the K-absorption discontinuities of germanium and selenium in some amorphous systems

In the present investigation the chemical shifts of the K-absorption discontinuities of germanium and selenium have been studied in their amorphous chemical compounds Ge₁₀Se₉₀, Ge₃₀Se₇₀, Ge₁₀Se₈₀Te₁₀ and Ge_33.3Se₄₀Te_26.7 using a 1 m Cauchois type bent crystal (mica) X-ray spectrograph. A graph of the chemical shift ΔE in binary compounds against the effective charge q on the absorbing atoms has been plotted. This plot is helpful in determining the effective charges in ternary compounds in which they cannot be calculated theoretically.