An accurate dynamical electron diffraction algorithm for reflection high-energy electron diffraction

The conventional multislice method (CMS) method, one of the most popular dynamical electron diffraction calculation procedures in transmission electron microscopy, was introduced to calculate reflection high-energy electron diffraction (RHEED) as it is well adapted to deal with the deviations from the periodicity in the direction parallel to the surface. However, in the present work, we show that the CMS method is no longer sufficiently accurate for simulating RHEED with the accelerating voltage 3–100 kV because of the high-energy approximation. An accurate multislice (AMS) method can be an alternative for more accurate RHEED calculations with reasonable computing time. A detailed comparison of the numerical calculation of the AMS method and the CMS method is carried out with respect to different accelerating voltages, surface structure models, Debye–Waller factors and glancing angles.     

Ultrafast electron diffraction

Ultrafast electron diffraction(UED) technique has proven to be an innovative tool for providing new insights in lattice dynamics with unprecedented temporal and spatial sensitivities. In this article, we give a brief introduction of this technique using the proposed UED station in the Synergetic Extreme Condition User Facility(SECUF) as a prototype. We briefly discussed UED's functionality, working principle, design consideration, and main components. We also briefly reviewed several pioneer works with UED to study structure-function correlations in several research areas. With these efforts,we endeavor to raise the awareness of this tool among those researchers, who may not yet have realized the emerging opportunities offered by this technique.     

Compression of subrelativistic space-charge-dominated electron bunches for single-shot femtosecond electron diffraction

We demonstrate the compression of 95 keV, space-charge-dominated electron bunches to sub-100 fs durations. These bunches have sufficient charge (200 fC) and are of sufficient quality to capture a diffraction pattern with a single shot, which we demonstrate by a diffraction experiment on a polycrystalline gold foil. Compression is realized by means of velocity bunching by inverting the positive space-charge-induced velocity chirp. This inversion is induced by the oscillatory longitudinal electric field of a 3 GHz radio-frequency cavity. The arrival time jitter is measured to be 80 fs.     

Weissenberg reflection high-energy electron diffraction for surface crystallography

The principle of a Weissenberg camera is applied to surface crystallographic analysis by reflection high-energy electron diffraction. By removing inelastic electrons and measuring hundreds of patterns as a function of sample rotation angle phi, kinematical analysis can be performed over a large volume of reciprocal space. The data set is equivalent to a three-dimensional stack of Weissenberg photographs. The method is applied to analysis of an Si(111)-square root of 3 x square root of 3-Ag surface, and the structural data obtained are in excellent agreement with the known atomic structure.     

Surface studies by electron diffraction

The problems in the analysis of surface structures by means of electron diffraction, particularly at low energy, are reviewed. A brief introduction is given to the basic scattering and diffraction phenomena occurring at a solid surface after which the nature of the experimental diffraction data is described. The theoretical interpretation of the diffracted intensity by various kinematical and dynamical methods is outlined and the present difficulties in obtaining a complete surface structure determination are examined. The different types of ordered and disordered layers which may be formed on a surface—usually by adsorption of foreign species—are discussed and the interpretation of the corresponding diffraction patterns is illustrated by some examples.     

Photo-triggered pulsed cavity compressor for bright electron bunches in ultrafast electron diffraction

Temporally resolved observation of microscopic structural dynamics of solids with ultrafast electron diffraction (UED) requires extremely short pulsed, highly charged, monoenergetic electron beams with sufficient transverse coherence length of several unit cells of the investigated samples. However, Coulomb repulsion defeats these parameters in free propagation of an electron pulse initially bright on the photo cathode. We demonstrate a new electron pulse compressor design based on a simple and compact RF structure incorporating a pair of gallium arsenide photoconductive semiconductor switches that are triggered by femtosecond laser pulses, thereby providing a longitudinal voltage gradient of up to 20?V/ps. Our proof of principle experiment achieved compression of bunches containing 26,000 electrons to a duration of below 750?fs and a beam diameter of 300???m in the temporal and spatial focus of the device while maintaining the good beam collimation required for time resolved electron diffraction experiments. The simplicity of the compressor provides a strong incentive for its further development toward practical implementation in sub-relativistic UED experiments requiring the highest possible source brightness.     

Finite unified models

We present phenomenologically viableSU (5) unified models which are finite to all orders before the spontaneous symmetry breaking. In the case of two models with three families the top quark mass is predicted to be 178.8 GeV.     

超快电子衍射装置的束流能量反馈控制

上海交通大学的超快电子衍射（UED）装置由一台电子直线加速器作为驱动,电子枪为一台光阴极微波电子枪。加速器在运行中电子枪会偶尔打火,腔体失谐,造成束流损失,束流能量产生变化,束流需要很长时间才能恢复到初始状态,影响了用户的使用。为此,对低电平控制器（LLRF）的幅度相位控制环路进行了改进,增加了能量反馈,代替了幅度反馈,通过对束流的中心位置进行实时的反馈以控制低电平控制器输出信号的幅度,保证了电子束流的能量稳定和电子枪加速场强的稳定。长时间的稳定性测试表明,电子枪在打火产生时,束流能量可以很快恢复,能量抖动由4.293 3×10⁻⁴（RMS）提高到2.855 7×10⁻⁴（RMS）,实现了束流能量的长期稳定。     

Isolated attosecond electron wave packet diffraction

Wave-particle duality is one of the most fundamental and mysterious natures of matters.Here,we present an interesting scheme of isolated electron wave packet diffraction with a few-cycle laser pulse and an extreme ultraviolet (XUV) pulse.The diffraction fringes are clearly present in the laser dressed XUV photoelectron spectra,strongly resembling the Airy diffraction pattern of optical waves.This phenomenon suggests a great potential of attosecond diffractometry.According to this scheme we also propose a simple method to determine the XUV pulse duration from the photoelectron spectra with a rather high resolution.     

电子双缝衍射的计算机模拟

根据电子双缝衍射强度分布函数,利用Visual Basic编程,实现了电子双缝衍射的计算机模拟.该模拟不仅生动再现了电子衍射图像,而且通过控制电子产生的速度,能让电子逐个打到屏上,能加深电子是概率波的认识.程序语言简单易学,利于进一步开发.     

Atomic resolution three-dimensional electron diffraction microscopy

We report the development of a novel form of diffraction-based 3D microscopy to overcome resolution barriers inherent in high-resolution electron microscopy and tomography. By combining coherent electron diffraction with the oversampling phasing method, we show that the 3D structure of a nanocrystal can be determined ab initio at a resolution of 1 A from 29 simulated noisy diffraction patterns. This new form of microscopy can be used to image the 3D structures of nanocrystals and noncrystalline samples, with resolution limited only by the quality of sample diffraction.     

Medium energy electron diffraction on aluminum

Measurements of the specular beam intensity in the medium range of energy (645 eV and 980 eV) are presented for the aluminum (001) and (110) surfaces. They have been performed with a LEED goniometer allowing to achieve high accuracy in the determination of the angular parameters of the diffraction experiment. The experimental results are displayed in the form of iso-intensity maps in (θ, φ) coordinates at a constant primary beam energy. θ denotes the colatitude angle of incidence and is varied in the range 30° to 80°. φ denotes the azimuth and is varied between 0° and 360°. Sections of the maps at constant angle of incidence are known as rotation diagrams. A model calculation ignoring intra-layer multiple scattering, but incorporating inter-layer multiple scattering processes shows the prominent role of the latter, in many cases, and the non-negligible contribution of the former in other cases. Sections of the maps at constant azimuth are called incidence-profiles. They are very sensitive to the azimuth and very hard to compute. Using the preceding model calculation, average incidence profiles have been computed, using as input parameters the refractive and absorptive potentials and the surface normal relaxation parameter obtained by a pseudo-kinematic analysis of experimental average incidence profiles as explained in another paper. The peak position and width have been compared to those obtained from the pseudo-kinematic calculation. From the result, it is shown that if averaging is performed according to a specific set of restrictive rules, the pseudokinematic analysis of the data has a semi-quantitative meaning.     

Unsupported lead clusters and electron diffraction

A beam of Pb clusters is produced with the inert gas aggregation method and probed by electron diffraction. Analysis of the diffraction patterns indicates that average cluster size can vary between 3 and 7 nm, according to nucleation conditions. The diffraction patterns from beams with larger average cluster size are very similar to patterns calculated from model decahedron clusters, while those for smaller cluster size do not appear to have simple geometrical face-centred cubic, decahedral, or icosahedral structure. Received 30 November 2000     

Perspectives for surface structure analysis with low energy electron diffraction

The two main methods for surface structure determination, X-ray diffraction and low energy electron diffraction, are briefly compared and two areas are discussed where the application and further development of LEED seems promising. One field is the measurement of thermal vibration with LEED and the second is the analysis of substrate induced distortions in adsorbed organic molecules. As a test case for the analysis of thermal vibrations the results of a temperature dependent LEED I(V) analysis of Cu(1 1 0) is presented showing that LEED is sensitive enough to measure anisotropic vibration amplitudes. As example for organic molecules the results of a LEED I(V) analysis of thiouracil on Ag(1 1 1) are presented and compared to the results of a previous X-ray study. The differences in the structural details can be related to the different diffraction geometries of surface X-ray diffraction and LEED.     

Quasiparticle bandstructures of covalent semiconductors and their surfaces

The exchange-correlation self-energies and quasiparticle shifts are calculated for band states of covalent materials (diamond, silicon) and their (001) 2×1 surface in order to solve the bulk and surface band-gap problem of the LDA. The screening properties are described by a model dielectric function taking into account the spatial nonlocality in the surface case assuming specular electron reflection. The wave functions are expanded in terms of localized orbitals. The quasiparticle bandstructures obtained are in reasonable agreement with experimental results.     

超声TOFD检测的有限元分析及其试验验证

超声衍射时差法（Ultrasonic TOFD）通过接收衍射波信号对缺陷进行测深定高,分析超声波在检测对象中的传播对于提高检测效力具有重要作用。本研究采用有限元方法模拟超声TOFD检测过程,探讨了缺陷衍射波的产生及传播特性,并通过试验对模型结果进行了验证。研究表明：有限元建模能够直观显示超声TOFD检测的声波传播过程,模拟结果与试验具有较好的一致性;实际检测过程中涉及的要素,如：探头优化布置、衍射波传播方式、幅度分布、缺陷端部形状对衍射过程的影响均能较好地体现在仿真模型中;超声TOFD检测的有限元模型可实现检测过程可视化,并可为工程检测人员提供一种新的检测方案设计和结果分析的手段。     

Order in amorphous polystyrenes as revealed by electron diffraction and diffraction microscopy

Ordered regions ranging in size between 15 and 45 Å have been established in several atactic polystyrenes of various molecular weights (4800; 51,000; and 1,800,000) as well as in an amorphous isotactic polystyrene by means of electron diffraction and high-resolution diffraction microscopy. The order is due to long-chain polymer molecules which tend to align more-or-less parallel to one another with a constant average spacing. The orderly chain packing can be disturbed upon cross-linking by electron irradiation, the disturbance being manifested in the irreversible changes in the d spacing and broadening of one of the diffuse rings which is inter-molecular in origin. From the results obtained, the high-resolution diffraction microscopy technique appears to have the potential for resolving the question regarding the presence of order in unoriented amorphous polymers. The technique can also differentiate between a broadened diffuse ring due to small crystallites and another due to paracrystals containing numerous defects.