An electrochemical enrichment procedure for the determination of heavy metals by total-reflection X-ray fluorescence spectroscopy

An electrolytic separation and enrichment technique was developed for the determination of trace elements by total-reflection X-ray fluorescence spectroscopy (TXRF). The elements of interest are electrodeposited out of the sample solution onto a solid, polished disc of pure niobium which is used as sample carrier for the TXRF measurement. The electrochemical deposition leads to a high enrichment of the analytes and at the same time to a removal of the matrix. This results in substantially improved detection limits in the lower picogram per gram region. The deposited elements are directly measured by TXRF without any further sample preparation step. The homogeneous thin layer of the analytes is an ideal sample form for TXRF, because scattered radiation from the sample itself is minimized. The proposed sample preparation method is useful particularly for the analysis of heavy metals in liquid samples with for TXRF disturbing matrices, e.g. sea water.     

XRF and TXRF techniques for multi-element determination of trace elements in whole blood and human hair samples

XRF and TXRF were established as useful techniques for multi-element analysis of whole blood and human head hair samples. Direct-XRF with different collimation units and different X-ray excitation modes was successfully used for the determination of S, P, K, Ca, Fe, and Br elements in blood samples and K, Ca, Mn, Fe elements in human hair samples. Direct analysis by TXRF was used for the determination of Rb and Sr in digested blood and human hair samples, respectively, while, the co-precipitation method using APDC for TXRF analysis was used for the determination of Ni, Cu, Zn, and Pb elements in both matrices. As a result, the improved XRF and TXRF methods were applied for multi-element determination of elements in whole blood and human hair samples in non-occupational exposed population living in Damascus city. The mean concentrations of analyzed elements in both matrices were on the reported range values for non-occupational population in other countries.     

Nanoliter deposition unit for pipetting droplets of small volumes for Total Reflection X-ray Fluorescence applications

A nanoliter droplet deposition unit was developed and characterized for application of sample preparation in TXRF. The droplets produced on quartz reflectors as well as on wafers show a good reproducibility, also the accuracy of the pipetted volume could be proved by a quantitative TXRF analysis using an external standard. The samples were found to be independent of rotation of the sample carrier. Angle scans showed droplet residue behavior, and the fluorescence signal is relatively invariant of the angle of incidence below the critical angle, which is useful for producing standards for external calibration for semiconductor surface contamination measurements by TXRF. Further it could be demonstrated that the nanoliter deposition unit is perfectly able to produce patterns of samples for applications like the quantification of aerosols collected by impactors.     

Vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry for metallic contamination analysis on Ge wafers

Ge substrates are recently being reconsidered as a candidate material for the replacement of Si substrates in advanced semiconductor devices. The reintroduction of this material requires reengineering of the standard IC processing steps. In this paper, we present the extension of the methodology of vapor phase decomposition–droplet collection–total reflection X-ray fluorescence spectrometry (VPD–DC–TXRF) for metallic contamination analysis towards Ge substrates. A first step that asked for adaptation was the collection chemistry as the Ge wafers surface is not hydrophobic after the VPD treatment. The contact angle could be significantly increased using a concentrated HCl solution. This chemistry has been proved to perform well in the collection of metals from intentionally contaminated Ge wafers. A second step that needed optimization was the matrix removal method as a sample preparation step prior to the TXRF analysis. First, the upper limits of TXRF on Ge containing solutions have been characterized. The accuracy of TXRF is found to be acceptable for Ge contents lower than 1×10¹⁴ atoms (250 ppb in 50 μL) but decreases systematically with higher Ge contents. Fortunately, Ge can be volatilized at low temperatures as GeCl₄ by the addition of HCl. The parameters within this method have been investigated with respect to the removal of Ge and the recovery of metal traces. Finally, the full VPD–DC–TXRF method has been applied on intentionally contaminated Ge wafers and proved to be very accurate.     

Determination of trace elements in macrozoobenthos samples by total reflection X-ray fluorescence analysis

The paper describes the analysis of a set of metals in macrozoobenthos samples from a river in Western Austria by using total reflection X-ray fluorescence analysis (TXRF). Metal concentrations in aquatic insect larvae from an industrially contaminated site are significantly higher than in larvae from a reference site. Furthermore, species-specific differences in metal accumulation were found. TXRF allows multi-element analysis of very low metal concentrations in very small sample masses (e.g. single aquatic insect larvae with a dry weight of only a few milligrams). Due to its multi-element capability and high sensitivity total reflection X-ray fluorescence analysis is a valuable tool for biomonitoring studies of metal contamination in aquatic ecosystems.     

Optimized sample preparation procedures for the analysis of solid materials by total-reflection XRF

The total reflection X-ray fluorescence (TXRF) method has been used for the analysis of various types of solid materials of biological, geological and environmental origin. The sample preparation step prior to TXRF measurements has been optimized for the various solid samples, including their decomposition by applying both a microwave oven and a PTFE bomb. Complete procedures for the optimized decomposition from the point of view of speed and completeness of digestion, as well as of the overall precision and accuracy are presented.     

Analytical approaches for Hg determination in wastewater samples by means of total reflection X-ray fluorescence spectrometry

At present, there is a considerable interest in Hg monitoring in wastewater samples due to its widespread occurrence and the high toxicity of most of its compounds. Hg determination in water samples by means of total reflection X-ray fluorescence spectrometry (TXRF) entails some difficulties due to the high vapor pressure and low boiling point of this element that produce evaporation and loss of Hg from the surface of the reflector during the drying process, commonly used for sample preparation in TXRF analysis.The main goal of the present research was to develop a fast and simple chemical strategy to avoid Hg volatilization during the analysis of wastewater samples by TXRF spectrometry. Three different analytical procedures were tested for this purpose: (i) increasing the viscosity of the wastewater sample by adding a non-ionic surfactant (Triton^® X-114), (ii) Hg immobilization on the quartz reflectors using the extractant tri-isobutylphosphine (Cyanex 471X) and (iii) formation of a stable and non-volatile Hg complex into the wastewater sample. The best analytical strategy was found to be the formation of a Hg complex with thiourea (pH = 10) before the deposition of 10 μL of sample on the reflector for following TXRF analysis. Analytical figures of merit such as linearity, limits of detection, accuracy and precision were carefully evaluated. Finally, the developed methodology was applied for the determination of Hg in different types of wastewater samples (industrial effluents, municipal effluents from conventional systems and municipal effluents from constructed wetlands).     

Investigation of element distribution and homogeneity of TXRF samples using SR-micro-XRF to validate the use of an internal standard and improve external standard quantification

Total reflection X-ray fluorescence analysis (TXRF) offers a nondestructive qualitative and quantitative analysis of trace elements. Due to its outstanding properties TXRF is widely used in the semiconductor industry for the analysis of silicon wafer surfaces and in the chemical analysis of liquid samples. Two problems occur in quantification: the large statistical uncertainty in wafer surface analysis and the validity of using an internal standard in chemical analysis. In general TXRF is known to allow for linear calibration. For small sample amounts (low nanogram (ng) region) the thin film approximation is valid neglecting absorption effects of the exciting and the detected radiation. For higher total amounts of samples deviations from the linear relation between fluorescence intensity and sample amount can be observed. This could be caused by the sample itself because inhomogeneities and different sample shapes can lead to differences of the emitted fluorescence intensities and high statistical errors. The aim of the study was to investigate the elemental distribution inside a sample. Single and multi-element samples were investigated with Synchrotron-radiation-induced micro X-ray Fluorescence Analysis (SR-μ-XRF) and with an optical microscope. It could be proven that the microscope images are all based on the investigated elements. This allows the determination of the sample shape and potential inhomogeneities using only light microscope images. For the multi-element samples, it was furthermore shown that the elemental distribution inside the samples is homogeneous. This justifies internal standard quantification.     

Determination of trace elements in bee honey,pollen and tissue by total reflection and radioisotope X-ray fluorescence spectrometry

Multielemental determinations in samples of various types of bee honey, pollen and bee tissue have been carried out using total reflection X-ray fluorescence spectrometry (TXRF) and radioisotope excited X-ray fluorescence spectrometry (XRF). The objective was to establish whether the elemental content of bee honey, in particular, correlates with any useful information about the environment, variety of honey, etc. An attempt has also been made to determine the X-ray techniques' ability to compete with atomic absorption spectrometry (AAS) and inductively coupled plasma-atomic emission spectrometry (ICP-AES), with regard to elemental sensitivity, accuracy, sample preparation procedures, and in particular, economic performance, which is very important in selecting an appropriate technique for the analysis of large numbers of samples. The results confirm the advantages of the TXRF method for trace element analysis, but only when utilising monochromatic excitation and selecting a proper sample preparation procedure. The radioisotope XRF technique, which does not require any sample preparation, is still very competitive in analysis of elements with concentrations above a few ten ppm. Preliminary results also confirm some correlations between the elemental content of honey and the status of the environment, and encourage further work in this direction     

Total reflection X-ray fluorescence analysis of fly ash from Bulgarian coal-fired power plants

The contents of Cl, Ca, K, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, As, Se, Rb, Sr, Ba and Pb in raw coal fly ash from five Bulgarian power plants were determined by total reflection X-ray fluorescence (TXRF), using gallium as the internal standard. The samples were analysed as in slurry form in Triton? X-114. The experimental parameters, such as grain size, concentrations of fly ash slurry and excitation time were optimised. For validation of the method, the certified reference material BCR-176R fly ash was used. The precision of the results obtained is characterised by a relative standard deviation of approximately 10%. The resulting data confirm the suitability of TXRF for the simultaneous determination of major, minor and trace elements in coal fly ash samples. Further advantages provided by TXRF are easy sample preparation (no sample dissolution) and the small sample amount required for analysis.     

Elemental Analysis of Copper-Zinc Ores by Total Reflection X-Ray Fluorescence using Nonaqueous Suspensions

Novel rapid determination of copper-zinc ore elemental composition by total reflection X-ray fluorescence (TXRF) is proposed. Approaches for solid state sample analysis by TXRF are provided. The sample preparation is chosen to obtain the suspensions in ethylene glycol. The optimum suspension preparation conditions (sample mass, volume of dispersion medium) and the measurement conditions (internal standard element, spectra acquisition time) were determined. The sedimentation stability of suspensions was studied. It was found that the suspensions remain stable for approximately 2?min, which is sufficiently long for the sampling the suspension. The proposed technique allows determining the elemental composition of solid ore samples without sample digestion. The sample preparation time takes approximately 20?min. The relative standard deviation of the analytical results did not exceed 10%.     

Sapphire sample carriers for silicon determination by total-reflection X-ray fluorescence analysis

Sapphire is presented as a new sample carrier material for total-reflection X-ray fluorescence spectrometry (TXRF). A comparison with conventional sample carrier materials such as quartz glass, Perspex®, glassy carbon and boron nitride demonstrates that sapphire has all the physical and chemical properties required for TXRF micro and trace analysis. Moreover, sapphire sample carriers allow the determination of silicon in many matrices in a comparatively simple way. Especially for airborne particulate matter, acid digestion can be avoided by cool-plasma ashing of suitable filter materials directly on the sample carrier. This technique has been successfully applied to environmental samples.     

Sample pretreatment strategies for total reflection X-ray fluorescence analysis: A tutorial review

In the last years, there has been a revival of total reflection X-ray fluorescence spectrometry (TXRF), which was firstly applied for analytical purposes in the late 80s. The aim of this work is to discuss and compare the current approaches for sample pretreatment including in situ microdigestion, slurry preparation, acid digestion, extraction, etc. prior to TXRF analysis. Advantages and drawbacks inherent to each of those procedures are considered. A comprehensive revision in the period January 2008–July 2013 about different sample preparation strategies prior to TXRF analysis apart from early pioneering reports dealing with sample pretreatment are included in the review. Non-conventional sample pretreatment approaches such as microflow online preconcentration, lab-on-a-chip, etc., are also discussed.Finally, future prospects in sample preparation prior to TXRF analysis are outlined.     

Possibilities and limitations of the total reflection X-ray fluorescence spectrometry for the determination of low Z elements in biological samples

The analytical capability of the laboratory scale vacuum total reflection X-ray fluorescence (TXRF) spectrometer (Wobistrax) was studied for the determination of the Z elements (Na, Mg, P, S, K and Ca) in different biological matrices represented by the following certified reference materials: MURST-ISS-A2 Antarctic krill, IAEA-331 spinach, NIST 1577a bovine liver, and SERONORM™ Trace Elements Serum Level 1.First, the stability of the response factors (relative sensitivity) against Ti internal standard was checked in the concentration range of 1 to 1000 mg/L in a diluted nitric acid matrix. It has been found that the upper limit of the analytical concentration range for K and Ca can be as high as 1000 mg/L; on the other hand, the remaining elements cannot be determined above a concentration of some tens mg/L.The established response factors were used for the elemental analysis of the four certified reference materials after normal-volume microwave assisted acid digestion. In the case of the serum sample, different preparation methods were compared as follow: direct analysis, microwave assisted acid digestion in normal-volume and micro-vessels, as well as the vapor-phase digestion directly on the TXRF carrier plates.On the basis of the results, the normal-volume digestion results in rather high dilution of the samples; thus, elements at low concentration could not be detected in some of the samples. On the other hand, this method offers the highest rate of both organic matrix decomposition and inorganic matrix dilution; thus, the background and the standard deviation of the results were the lowest. In general, this method was found to be useful for the analysis of samples with high dissolved (organic + inorganic) content if the analytes are present at a concentration considerable above the quantification limit.In the case of the microscale and the vapor-phase digestion, both the organic and inorganic matters remain at elevated concentration; thus, higher background and self-absorption of the fluorescent radiation occurred, deteriorating the analytical performance.     

Microanalytical method development for Fe, Cu and Zn determination in colorectal cancer cells

Microanalytical methods suitable for the determination of Fe, Cu in HT-29 (human colon adenocarcinoma) cells treated with different iron compounds (Fe(II) sulfate, Fe(III) chloride, Fe(III) citrate and Fe(III) transferrin) and cultured in medium supplemented or not with 10% (v/v) fetal calf serum (FCS) by total reflection X-ray fluorescence spectrometry (TXRF) and simultaneous graphite furnace atomic absorption spectrometry (GF-AAS) were developed. The developed TXRF method was also suitable for Zn determination in the samples. The main advantage of the proposed methods is the execution of all sample preparation steps following incubation and prior to the elemental analysis in the same Eppendorf tubes. Sample preparation was performed at microscale (115 μL sample volume) with 65% nitric acid and 30% hydrogen peroxide. According to scanning electron microscopic measurements, the organic matrix of the cell samples could be eliminated to the extent that accurate results were obtained for Cu and Fe by analyzing the same samples by TXRF and GF-AAS. Concerning the iron uptake, HT-29 cells incubated in FCS-free medium contained Fe in cca. 5-50 times higher amounts compared to cells cultured in FCS supplemented medium. Pronounced differences in the iron uptake compared to the iron supply (inorganic vs. organic chelated as well as iron(II) vs. iron(III)) were observed in the case of cell lines incubated in FCS-free medium.     

Determination of calcium, potassium, manganese, iron, copper and zinc levels in representative samples of two onion cultivars using total reflection X-ray fluorescence and ultrasound extraction procedure

The chemical characterization of onion cultivar samples is an important tool for the enhancement of their productivity due to the fact that chemical composition is closed related to the quality of the products. A new sample preparation procedure for elemental characterization is proposed, involving the acid extraction of the analytes from crude samples by means of an ultrasonic bath, avoiding the required digestion of samples in vegetable tissue analysis. The technique of total reflection X-ray fluorescence (TXRF) was successfully applied for the simultaneous determination of the elements Ca, K, Mn, Fe, Cu and Zn. The procedure was compared with the wet ashing and dry ashing procedures for all the elements using multivariate analysis and the Scheffé test. The technique of flame atomic absorption spectrometry (FAAS) was employed for comparison purposes and accuracy evaluation of the proposed analysis method. A good agreement between the two techniques was found when using the dry ashing and ultrasound leaching procedures. The levels of each element found for representative samples of two onion cultivars (Yellow Granex PRR 502 and 438 Granex) were also compared by the same method. Levels of K, Mn and Zn were significantly higher in the 438 Granex cultivar, while levels of Ca, Fe and Cu were significantly higher in the Yellow Granex PRR 502 cultivar.     

Metal content in mosses from the Metropolitan Area of the Toluca Valley: a comparative study between inductively coupled plasma optical emission spectrometry (ICP-OES) and total reflection X-ray fluorescence spectrometry (TXRF)

The comparison between inductively coupled plasma optical emission spectrometry (ICP-OES) and total reflection X-ray fluorescence spectrometry (TXRF) for simultaneous determination of metal content (Cr, Cu, Fe, Mn, Pb and Zn) in mosses from the Metropolitan Area of the Toluca Valley was performed. Epiphytic mosses (Fabriona ciliaris and Leskea angustata) were collected in two sampling campaigns and were digested with HNO₃, HCl and HF for ICP-OES method and HNO₃ and HCl for TXRF method. The certified reference material (IAEA-336, Lichen) and the Standard Reference Material (SRM-1573, tomato leaves) were used for the quality control and to evaluate trueness and precision. Linearity, detection and quantification limits were also determined. Results show an ICP-OES and TXRF trueness mean of 101 ± 5% and 97 ± 9%, respectively; the relative standard deviation (RSD percent) was less than 17% in both methods. The moss samples exhibit a satisfactory precision (RSD ≤ 20%), because the RSD percent for ICP-OES, from 2% to 15%, and that for TXRF, from 1% to 17%, were obtained. One factor experimental design and simple regression analysis (α = 0.05) were used to compare the ICP-OES and TXRF metal concentrations. The statistical results do not show significantly different values for Cu, Mn, Pb and Zn in both the sample campaigns. In addition, the average results for Cr in the first sample campaign (30.3 ± 11.4 mg/kg for ICP-OES and 18.6 ± 9.8 mg/kg for TXRF) and Fe values in the second sample campaign (10,810 ± 2980 mg/kg for ICP-OES and 8380 ± 2350 mg/kg for TXRF) were significantly different in both methods. These differences are attributed to an incomplete sample digestion in the TXRF sample preparation. The results of the simple regression analyses show p-value less than 0.05, which indicates an equivalent and significant relation between ICP-OES and TXRF.     

Iodine determination in dietary supplement products by TXRF and ICP-AES spectrometry

About two-thirds of the Hungarian population is living in areas where drinking water contains less than 0.025 mg/L I₂. Iodine is an essential element required for the synthesis of thyroid hormones. The recommended daily allowance (RDA) is 0.150 mg for adults (WHO [17]). In the case of iodine deficiency mineral water containing iodine and seaweed products could serve as the natural source of this element. In the present study, the capability and limitations of total reflection X-ray fluorescence (TXRF) and inductively coupled plasma atomic emission (ICP-AES) spectrometry for the determination of iodine are discussed, in the case of commercially available dietary supplements and differently processed seaweed (kelp) products. Multi-mineral tablets and kelp samples were digested using concentrated nitric acid before analysis. Extraction using a 25% ammonia solution was proved to be effective as an alternative sample preparation procedure for seaweed and dietary supplement tablets containing iodine. Precipitation of silver iodide, as a sample preparation step of mineral water, was applied to prevent loss of volatile iodine during solvent evaporation. ICP-AES measurement was found to be seriously affected by spectral line coincidence between the prominent line of iodine and the adjacent phosphorus line. TXRF was proved to be line coincidence free and suitable for iodine analysis. TXRF determination of iodine in mineral water, in seaweed samples and in dietary supplement tablets has not been reported yet.     

Elemental analysis of airborne dust samples with TXRF: Comparison of oxygen-plasma ashing on sapphire carriers and acid digestion for sample preparation

The concentrations of 13 elements (As, Ca, Co, Cd, Cr, Fe, Ga, Ni, Pb, Pt, Ti, V and Zn) were determined in air particulate matter using total reflection X-ray fluorescence spectrometry (TXRF). For silicon analysis synthetic sapphire was chosen as a new sample carrier material – it is silicon-free, resistant to oxygen-plasma, microwaves and concentrated acids. The dust samples were collected on cellulose acetate filters. The decomposition of the filters was carried out by oxidation in a microwave-generated low-pressure oxygen-plasma directly on the TXRF sample carriers. The recovery of the investigated elements was verified with the standard reference material SRM 1648 (urban particulate matter) and ranged from 90 to 97%. The oxygen-plasma method was compared with conventional sample preparation by acid digestion. Received: 9 April 1999 / Revised: 18 May 1999 / Accepted: 3 June 1999