Trace element determination in thorium oxide using total reflection X-ray fluorescence spectrometry

Applicability of Total Reflection X-ray Fluorescence (TXRF) spectrometry for the determination of trace metals at concentration of µg/g level in thorium oxide was studied. The TXRF spectrometer was calibrated using a multielement standard solution and the method was validated by analyzing another multielement standard solution. Sample preparation conditions were optimized for the TXRF determinations of trace metals in thorium oxide. The elements K, Ca, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Sr, Y, Ba and Pb present in thorium oxide standards were determined after dissolving them in HNO₃/HF mixture and separating the bulk matrix, thorium, by solvent extraction using tri-n-butyl phosphate (TBP) and tri-n-octyl phosphine oxide (TOPO) as extractants. A comparison of TXRF determined concentrations of trace elements Ca, V, Cr, Mn, Fe, Ni and Cu with the certified values shows that TXRF determined concentrations have an RSD of 20% (1 s for n = 4) and are within an agreement of 20% of the certified values in most of the cases.     

Cold plasma ashing improves the trace element detection of single Daphnia specimens by total reflection X-ray fluorescence spectrometry

The recently developed dry method for the element determination of single freshwater microcrustacean specimens (Daphnia) using total reflection X-ray fluorescence (TXRF) spectrometry showed that inhomogeneities of the biological material on the glass carriers resulted in some cases in high background and hampered the detection of certain trace elements (e.g. Cr, Ni). The aim of this study was to test how inhomogeneities of the biological material can be reduced using cold plasma ashing (CPA) techniques. For that, single specimens of the microcrustacean Daphnia pulex prepared according to the dry method were measured by TXRF before and after CPA. To determine the efficiency of the removal of organic matrix, the background and signal-to-background relationship of 28 samples were analyzed. The results showed (1) a highly significant reduction of the background by CPA fluctuating between 26 and 46% (all elements) and (2) a significant increase of the signal-to-background relationship by the factor 1.5–2.5 (all elements) and a much better detection of Cr, Pb, As and Se. The element concentrations (with exception of Cr, Ni and Pb) after ashing were in the same range or slightly higher than that before ashing. No significant differences between the two treatments were observed for Mn, As, Pb, Se (November), Sr (November), Cr (March) and Pb (March). The element concentration of P, K, Ca, Cu, Zn, Cr (November), Fe and Rb were significantly higher after ashing. In general, they increased by 1.5–13.6% and were highest for Rb (March) and P (November). In contrast, the element concentration of Ni and Cr (only March) decreased significantly after ashing (Ni: 91.6–92.1%, Cr: 91.3%). We recommend the use of CPA for biological material in the microgram-range as a routine method for TXRF analysis, especially when trace elements in minute concentrations are of interest.     

Measurement of trace element concentration in a metal matrix using total reflection X-ray fluorescence spectrometry

Total reflection X-ray fluorescence spectroscopy (TXRF) has been used in combination with synchrotron radiation in order to determine detection limits and lowest limits of concentration of trace elements in metal matrices. Two applications on irradiated material are described, where the TXRF method has some advantages, as compared to other detection methods, because only few micrograms of material is needed for the measurements. The first application is devoted to radiation damage studies on first wall material of future fusion reactors. Therefore, metal foils were irradiated with 590 MeV protons at PSI and the transmutational elements produced in the foils were measured. The second application is the assessment of radiation damage of core components in a nuclear power plant, e.g. the reactor pressure vessel. This is performed by the determination of the fast neutron fluence on the components using an activation reaction of ⁹³Nb which is a trace element in most reactor steels. Detection limits of a few picograms have been found in the experiments.     

Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis

Total reflection X-ray fluorescence spectrometry (TXRF) is presented as a genuine surface analytical technique. Its low information depth is shown to be the characteristic feature differentiating it from other energy dispersive X-ray fluorescence methods used for layer and surface analysis. The surface sensitivity of TXRF and its analytical capability together with the limitations of the technique are discussed here using typical applications including the contamination control of silicon wafers, thin layer analysis and trace element determination. For buried interfaces and implantation depth profiles in silicon a combination of TXRF and other techniques has been applied successfully. The TXRF method has the particular advantage of being calibrated without the need for standards. This feature is demonstrated for the example of the element arsenic.     

Uranium determination in seawater by total reflection X-ray fluorescence spectrometry

A study regarding uranium determination in seawater by total reflection X-ray fluorescence (TXRF) spectrometry is reported. Uranium, present in seawater in concentration of about 3.3 ng/mL, was selectively extracted in diethyl ether and determined by TXRF after its preconcentration by evaporation and subsequent dissolution in a small volume of 1.5% suprapure HNO₃. Yttrium was used as an internal standard. Before using diethyl ether for selective extraction of uranium from seawater, its extraction behavior for different elements was studied using a multielement standard solution having elemental concentrations in 5 ng/mL levels. It was observed that the extraction efficiency of diethyl ether for uranium was about 100% whereas for other elements it was negligible. The detection limit of TXRF method for uranium in seawater samples after pre-concentration step approaches to 67 pg/mL. The concentrations of uranium in seawater samples determined by TXRF are in good agreement with the values reported in the literature. The method shows a precision within 5% (1σ). The study reveals that TXRF can be used as a fast analytical technique for the determination of uranium in seawater.     

Direct determination of trace elements in boron nitride powders by slurry sampling total reflection X-ray fluorescence spectrometry

The use of slurry sampling total reflection X-ray fluorescence spectrometry (SlS-TXRF) for the direct determination of Ca, Cr, Cu, Fe, Mn and Ti in four boron nitride powders has been described. Measurements of the zeta potential showed that slurries with good stabilities can be obtained by the addition of polyethylenimine (PEI) at a concentration of 0.1 wt.% and by adjusting the pH at 4. For the optimization of the concentration of boron nitride in the slurries the net line intensities and the signal to background ratios were determined for the trace elements Ca and Ti as well as for the internal standard element Ga in the case of concentrations of boron nitride ranging from 1 to 30 mg mL⁻¹. As a compromise with respect to high net line intensities and high signal to background ratios, concentrations of 5 mg mL⁻¹ of boron nitride were found suitable and were used for all further measurements. The limits of detection of SlS-TXRF for the boron nitride powders were found to range from 0.062 to 1.6 μg g^– 1 for Cu and Ca, respectively. Herewith, they are higher than those obtained in solid sampling and slurry sampling graphite furnace atomic absorption spectrometry (SoS-GFAAS, SlS-GFAAS) as well as those of solid sampling electrothermal evaporation inductively coupled plasma optical emission spectrometry (SoS-ETV-ICP-OES). For Ca and Fe as well as for Cu and Fe, however, they were found to be lower than for GFAAS and for ICP-OES subsequent to wet chemical digestion, respectively. The universal applicability of SlS-TXRF to the analysis of samples with a wide variety of matrices could be demonstrated by the analysis of certified reference materials such as SiC, Al₂O₃, powdered bovine liver and borate ore with a single calibration. The correlation coefficients of the plots for the values found for Ca, Fe and Ti by SlS-TXRF in the boron nitride powders as well as in the before mentioned samples versus the reference values for the respective samples over a concentration range from 2.5 to 1470 μg g^– 1 were found to be 0.995, 0.991 and 0.997, respectively.     

A novel total reflection X-ray fluorescence procedure for the direct determination of trace elements in petrochemical products

A total reflection X-ray fluorescence (TXRF) procedure was developed for the determination of metal traces in petrochemical end products or intermediates for surfactant synthesis. The method combines a fast and straightforward sample preparation, i.e. deposition on the sample holder and evaporation of the sample matrix, with an efficient quantification method based on internal standardization (organic gallium standard). The method developed showed detection limits below 0.05 μg g^-1 and in most cases below 0.005 μg g^-1. Fifteen elements (Ca, Cd, Co, Cr, Cu, Fe, Mn, Mo, Ni, Pb, Rh, Sn, Sr, V and Zn) were determined in matrices such as paraffins, n-olefins, linear alkylbenzenes, long-chain alkyl alcohols and esters: typical metal contents were below 1 μg g^-1. The results were compared with the reference method ASTM D5708 (test method B) based on inductively coupled plasma optical emission spectroscopy: advantages and drawbacks of the two procedures were critically evaluated. The TXRF method developed showed comparable precision and absence of bias with respect to the reference method. A comparison of the performances of the two methods is presented.     

A wavelength-dispersive arrangement for wafer analysis with total reflection X-ray fluorescence spectrometry using synchrotron radiation

Currently, the only apparent means to enhance the detection power of the TXRF technique would be to increase the intensity of the primary beam. Using synchrotron radiation, the most powerful X-ray source available, unfortunately, not only the fluorescence signal of the contaminant elements is increased, but also in equal measure, the intensities of the Si–K radiation from the wafer together with the scattered radiation. This results in an overloading of the energy-dispersive Si (Li) detector systems used hitherto, with the effect that the available primary intensity cannot be fully exploited. Wavelength-dispersive systems are free of such problems; they generate less detector background and can withstand higher count rates. Due to their small angle of acceptance, however, their detection efficiency is quite low. In this contribution we propose a wavelength-dispersive TXRF solution, which is optimized with regard to higher efficiency on the basis of large area multilayer mirrors in combination with a position-sensitive detector. The count rates in relation to energy-dispersive instruments and the energy resolution of the new system have been calculated using ray-tracing techniques.     

Monitoring of the environmental pollution by trace element analysis in tree-rings using synchrotron radiation total reflection X-ray fluorescence

This paper aims to study the environmental pollution in the tree development, in order to evaluate its use as bioindicator in urban and country sides. The sample collection was carried out in Piracicaba city, São Paulo State, which presents high level of environmental contamination in water, soil and air, due to industrial activities, vehicles combustion, sugar-cane leaves burning in the harvesting, etc. The species Caesalpinia peltophoroides (“Sibipiruna”) was selected because it is widely used in urban forestation. Synchrotron Radiation Total Reflection X-ray Fluorescence technique (SR-TXRF) was employed to identify and quantify the elements and metals of nutritional and toxicological importance in the wood samples. The analysis was performed in the Brazilian Synchrotron Light Source Laboratory, using a white beam for excitation and a Si(Li) detector for X-ray detection. In several samples, P, K, Ca, Ti, Fe, Sr, Ba and Pb were quantified. The K/Ca, K/P and Pb/Ca ratios were found to decrease towards the bark.     

Determination of fluorine by total reflection X-ray fluorescence spectrometry

There is a growing interest in determination of low Z elements, i.e. carbon to phosphorus, in various samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as a suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon).     

Investigation of polyelectrolytes by total reflection X-ray fluorescence spectrometry

Water soluble polyelectrolyte samples containing mono-, bi- and trivalent metal ions were investigated without any pretreatment. Acid digestion of linear polymers may lead to a product insoluble in water so the digestion has to be avoided. The determination of analytical characteristics and limitations of the total reflection X-ray fluorescence (TXRF) analysis for poly(vinylalcohol-vinylsulfate) copolymers containing the following cations: Cs⁺; Ba²⁺; Cu²⁺ and La³⁺ are presented in this communication. On the basis of our results efficiency of ion-exchange during preparation of polyelectrolytes and stoichiometry of the end-product were determined. TXRF results were compared with data gained by inductively coupled plasma atomic emission spectrometry (ICP-AES) measurements except in the case of Cs⁺, which has poor sensitivity in ICP-AES. Good agreement was found between the results of the two techniques and calculations from titrimetric data. Concentration of Li⁺ and Mg²⁺ in polymer samples was measured only by ICP-AES.     

A method for trace element determination of marine periphyton communities on discs of float glass (without sample preparation) using total-reflection X-ray fluorescence spectrometry

A quick method for trace element determination of marine periphyton communities on soda float glass discs is presented. After addition of an internal standard, the community is measured by total-reflection X-ray fluorescence (TXRF) spectrometry. No sample preparation is required except a gentle wash with distilled water. The soda glass disc on which the periphyton community grows is used directly as the sample reflector in TXRF. The method was evaluated by the analysis of a certified reference material of plankton (CRM 414) and by comparison to a wet digestion method. Recovery rates for 13 and 130 μg-samples of CRM 414 are reasonable: between 0.6 and 1.4 for the elements K, Ca, Mn, Fe, Ni, Cu, Zn, As, Rb and Sr. Relative standard deviations for 130 μg-samples are 10% or less for most of these elements. In the comparison to wet digestion, natural periphyton samples were used and the two methods showed a good agreement.The different steps used in the quantification, such as accounting for the contribution from the glass to the TXRF spectrum, and the calculation of the sample mass from the spectrum, are described. It is shown that complicating factors, such as the required water wash and the influence of an inhomogeneous spatial distribution of the periphyton on the glass disc, do not adversely affect the quantification.     

Recent trends in total reflection X-ray fluorescence spectrometry for biological applications

This review is focused on the application of total reflection X-ray fluorescence (TXRF) spectrometry in the field of biological research. In the last decade, most papers were published by authors who applied laboratory-scale TXRF equipments. The application of synchrotron radiation as excitation source (SR-TXRF) shows a slowly increasing tendency. In the cited papers the micro-, trace and multielement capability of these TXRF techniques was demonstrated in the clinical and medical laboratory practice, as well as in various plant physiological studies. For speciation of elements in biological matrices, the TXRF was used as element specific detector following an off-line separation step (e.g., thin layer chromatography, high performance liquid chromatography), however, these off-line methods are not competitive with the on-line coupled HPLC-inductively coupled plasma mass spectrometry.     

Multilayer mirror as a substrate for total reflection X-ray fluorescence spectrometry

X-ray field intensity generated over a multilayer surface during a strong Bragg reflection condition has been used to analyze the particulate matter deposited on its surface, for the average particles size distribution and detection sensitivity of various elements. The elemental detection sensitivities achieved at Bragg reflection condition are compared to those obtained at incidence angles below critical angle, under total external reflection condition. The results obtained indicate that when big size particles (> 1 μm) are distributed over a large surface area, the observed fluorescence yields deteriorate by 15–18% in the total external reflection condition, due to strong sample absorption effects. In such a case, use of a multilayer mirror as a sample carrier and fluorescence excitation under Bragg reflection condition provides better fluorescence yield and hence improved detection sensitivity for an element.     

Analytical approaches for Hg determination in wastewater samples by means of total reflection X-ray fluorescence spectrometry

At present, there is a considerable interest in Hg monitoring in wastewater samples due to its widespread occurrence and the high toxicity of most of its compounds. Hg determination in water samples by means of total reflection X-ray fluorescence spectrometry (TXRF) entails some difficulties due to the high vapor pressure and low boiling point of this element that produce evaporation and loss of Hg from the surface of the reflector during the drying process, commonly used for sample preparation in TXRF analysis.The main goal of the present research was to develop a fast and simple chemical strategy to avoid Hg volatilization during the analysis of wastewater samples by TXRF spectrometry. Three different analytical procedures were tested for this purpose: (i) increasing the viscosity of the wastewater sample by adding a non-ionic surfactant (Triton^® X-114), (ii) Hg immobilization on the quartz reflectors using the extractant tri-isobutylphosphine (Cyanex 471X) and (iii) formation of a stable and non-volatile Hg complex into the wastewater sample. The best analytical strategy was found to be the formation of a Hg complex with thiourea (pH = 10) before the deposition of 10 μL of sample on the reflector for following TXRF analysis. Analytical figures of merit such as linearity, limits of detection, accuracy and precision were carefully evaluated. Finally, the developed methodology was applied for the determination of Hg in different types of wastewater samples (industrial effluents, municipal effluents from conventional systems and municipal effluents from constructed wetlands).     

Characterization of nuclear materials by total reflection X-ray fluorescence spectrometry

Nuclear energy is one of the available energy options for long term energy security of world. In order to produce electricity using this mode of energy generation in an efficient and safe manner, it is necessary that the materials used for such energy generation comply with the specifications assigned. The major and trace composition of these materials is an important specification for their quality control. Different analytical techniques are used for such quality control. Total reflection X-ray fluorescence (TXRF) is a comparatively new technique having several features well suited for trace and major element determinations in nuclear materials. However, this technique has not been used so far extensively for characterization of nuclear materials. The present paper gives a brief introduction of TXRF, its suitability for nuclear material characterization and some details of the TXRF studies made in our laboratory for the characterization of nuclear materials.     

Element determination in natural biofilms of mine drainage water by total reflection X-ray fluorescence spectrometry

Human impacts like mining activities lead to higher element concentration in surface waters. For different pollution levels, the consequences for aquatic organisms are not yet investigated in detail. Therefore, the aim of this investigation is to determine the influence of mining affected surface waters on biofilms.Elements like heavy metals can be absorbed on cell walls and on polymeric substances or enter the cytoplasm of the cells. Thus, they are important for the optimization of industrial biotechnological processes and the environmental biotechnology. Beyond this, biofilms can also play an important role in wastewater treatment processes and serve as bioindicators in the aquatic environment.The presented total reflection X-ray fluorescence spectroscopic investigation was performed to compare the element accumulation behavior of biofilms grown on natural or on artificial materials of drainage water affected by former copper mining activities. A high salt and heavy metal pollution is characteristic for the drainage water. For an assessment of these results, samples from stream Schlenze upstream the confluence with the drainage water, a small tributary of the Saale River in central Germany, were analyzed, too.     

Determination of trace elements in Syrian medicinal plants and their infusions by energy dispersive X-ray fluorescence and total reflection X-ray fluorescence spectrometry

X-ray fluorescence (XRF) and total-reflection X-ray fluorescence (TXRF) techniques suited well for a multi-element determination of K, Ca, Mn, Fe, Cu, Zn, Rb, and Sr in some Syrian medicinal plant species. The accuracy and the precision of both techniques were verified by analyzing the Standard Reference Materials (SRM) peach-1547 and apple leaves-1515. A good agreement between the measured concentrations of the previously mentioned elements and the certified values were obtained with errors less than 10.7% for TXRF and 15.8% for XRF. The determination of Br was acceptable only by XRF with an error less than 24%. Furthermore, the XRF method showed a very good applicability for the determination of K, Ca, Mn, Fe, Cu, Zn, Rb, Sr, and Br in infusions of different Syrian medicinal plant species, namely anise (Anisum vulgare), licorice root (Glycyrrhiza glabra), and white wormwood (Artemisia herba-alba).     

Surface analysis for Si-wafers using total reflection X-ray fluorescence analysis

Summary Total Reflection X-Ray Fluorescence Analysis is presented as a novel analytical tool for the determination of metal impurities on Si-Wafer surfaces [1]. This method allows accurate quantification of surface coverages down to 10¹¹ atoms/cm² in a non-destructive way. The technique uses a molybdenum tube, a Si(Li) detector, and instrumentation for the exact control of the angle of incidence which must be set to a particular value below the cricitical angle for total reflection with an accuracy better than 0.1 mrad. Advantages are the lack of sample preparation and vacuum. Standards for quantification can be easily produced. Repeatability tests on three different wafers show good variability even for low concentrations.

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Oberflächenanalyse für Si-Wafer mit Hilfe streifend einfallender Röntgenstrahlen

     

Trace analysis of high-purity iron by total reflection X-ray fluorescence spectrometry

Summary A combined procedure enabling simultaneous multielement analysis of trace impurities in high-purity iron is presented. After removal of the iron matrix by solvent extraction with methyl isobutyl ketone, the trace elements Ti, V, Cr, Mn, Ni, Cu, Pb and Bi are determined by means of total reflection X-ray fluorescence analysis. Detection limits are found in the range of 100 ng/g. The reliability of the method is verified by the analysis of commercial high-purity iron and by the comparison of analytical data obtained by ICP-AES.