Profiling band structure in GaN devices by electron holography

Electron holography in a field emission gun transmission electron microscope has been used to profile the inner potential V₀ across GaN/x nm In_0.1Ga_0.9N/GaN/(0 0 0 1) sapphire samples (x=10, 40 nm) grown by molecular beam epitaxy and viewed in cross-section. Results are presented which suggest a decrease in V₀ of 3–4 V across the InGaN layer in the [0 0 0 1] direction. It is proposed that the results can be explained by charge accumulation across the InGaN layer and that the opposing contributions due to piezoelectric and polarisation fields are effectively masked by Fermi level pinning.     

Impedance spectroscopy analysis of AlGaN/GaN HFET structures

For HFET application a series of samples with 30 nm Al_xGa_1−xN (x=0.02–0.4) layers deposited at 1040°C onto optimised 2 μm thick undoped GaN buffers were fabricated. The Al_xGa_1−xN/GaN heterostructures were grown on c-plane sapphire in an atmospheric pressure, single wafer, vertical flow MOVPE system. Electrical properties of the Al_xGa_1−xN/GaN heterostructures and thick undoped GaN layers were evaluated by impedance spectroscopy method performed in the range of 80 Hz–10 MHz with an HP 4192A impedance meter using a mercury probe. The carrier concentration distribution through the layer thickness and the sheet carrier concentration were evaluated. A non-destructive, characterisation technique for verification of device heterostucture quality from the measured C–V and G–V versus frequency characteristics of the heterostructure is proposed.     

A greener synthetic route to monodisperse CdSe quantum dots with zinc-blende structure

A much cheaper and greener route to monodisperse CdSe quantum dots (QDs) with zinc-blende structure has been developed. The N,N-dimethyl-oleoyl amide was chosen as the solvent, eliminating the needs of air-sensitive and toxic trioctylphosphine (TOP) or tributylphosphine (TBP), and cadmium oxide and elemental selenium as sources. The as-prepared CdSe QDs show an apparent blue-shift in the ultraviolet and visible (UV–vis) absorption peaks. The emission peak of the QDs can be tuned by changing synthesis time only.     

Spectrally resolved electroluminescence microscopy and μ-electroluminescence investigation of GaN-based LEDs

We have studied the luminescence properties of GaN LEDs by electroluminescence microscopy (ELM) and micro-electroluminescence (μ-EL) spectroscopy. Spatial inhomogeneity in the deep level region of the spectra is observed in spectrally resolved ELM images. Room temperature μ-EL spectra measured from 5×5 μm² regions show anti-correlation of the defect-related recombination (E=1.95–2.45 eV) with the band-edge emission (E=3.18 eV).     

Effect of grain size on the electrical properties of ultraviolet photodetector with ZnO/diamond film structure

Highly c-axis-oriented ZnO films were successfully deposited on the nucleation sides of freestanding diamond films by RF reactive magnetron sputtering. I–V characteristics of ultraviolet (UV) photodetectors with ZnO/diamond structure were studied and a significant photoresponse was observed under UV light illumination. The dark-current and the photocurrent of the ZnO photodetectors were relative to the grain size and the quality of ZnO films. For the photodetector with a bigger grain size, a weaker dark current and a stronger photocurrent were obtained under 10 V bias voltage. The photocurrent rise and decay process confirmed the carrier-trapping effect.     

A comparison of commercial sources of epitaxial material for GaN HFETs fabrication

This paper describes a comparison of material and device results obtained from AlGaN/GaN epitaxial HFET wafers from three commercial sources. Although all three sources supplied material to the same nominal specification, X-ray diffraction, Hall effect and C–V profiling revealed significant differences between them. Wafers from two of the suppliers showed poor inter-device isolation characteristics, indicative of a conducting buffer layer. Wafers from the third supplier showed excellent inter-device isolation, but C–V measurements showed that the AlGaN was about twice as thick as specified, resulting in devices with high pinch-off voltages (−16 V). For the wafers with poor buffer isolation, RF measurements on 1.2 μm gate length devices gave values of f_T 5.0 GHz and values of f_max from 8.0 to 11.7 GHz (exact values depending on DC bias conditions), while for the wafer with over-thick AlGaN the corresponding values were 8.0 and 20.0 GHz.     

Effect of lattice oxygen on optical absorption, radiation hardness and thermally stimulated luminescence of BaF2 crystal

The influence of the presence of BaO impurity on the optical absorption, radiation hardness and thermally stimulated luminescence of BaF₂ has been investigated. The presence of oxygen impurity gives rise to three absorption bands in the UV region, peaking around 220, 280 and 335 nm. Further, the impurity is found to be detrimental to crystal hardness against ionizing radiations. The thermally stimulated luminescence (TSL) has been studied from gamma-irradiated crystals containing different fractions of BaO impurity. Four prominent glow peaks around 100°C (peak I), 150°C (peak II), 220°C (peak III) and 290°C (peak IV) are observed for crystals containing BaO impurity concentrations lower than 0.5% (by wt). For crystals containing higher impurity concentrations, two additional peaks around 75°C and 260°C are also observed. The kinetics of TSL emission is observed to be of first order, implying that the absorption and the emission centers responsible for TSL are the same. The normalized TSL output for peak I is found to vary linearly with the concentration of oxide impurity. This fact can be utilized to detect the presence of minute amounts of oxygen in BaF₂ lattice, which is crucial to the growth of crystals exhibiting high radiation hardness.     

Hydrothermal growth of single-crystal CaV6O16·3H2O nanoribbons

CaV₆O₁₆·3H₂O nanoribbons have been prepared by the hydrothermal method in the presence of sodium dodecyl sulfate (SDS) at 160°C for 10 h. X-ray diffraction pattern indicates that the sample is monoclinic phase of CaV₆O₁₆·3H₂O with the lattice contents a=12.18 Å, b=3.598 Å, c=18.39 Å, β=118.03°. Field emission scanning electron microscopy shows that the nanoribbons have widths in the range of 150–500 nm, thicknesses of 30–60 nm and lengths of 500 mm X-ray photoelectron spectrum measurements further confirm the formation of the CaV₆O₁₆·3H₂O phase. The formation of CaV₆O₁₆·3H₂O nanoribbons is a self-assembling process, in which surfactant SDS plays the role of soft template.     

Growth of NaBi(WO4)2 crystal by modified-Bridgman method

NaBi(WO₄)₂ (NBW) crystals have been grown for the first time by modified-Bridgman method. Influences of some factors on the crystal growth process are discussed. X-ray powder diffraction experiments show that the unit cell parameters of NBW crystal are a=b=0.5284 nm, c=1.1517 nm, and V=0.3215 nm³. The differential thermal analysis shows that the NBW crystal melts at 923°C.     

Combustion synthesis and luminescence properties of Dy-doped MgO nanocrystals

MgO nanocrystals doped with Dy³⁺ have been synthesized by a combustion method. The synthesized sample is characterized by X-ray diffraction, transmission electron micrograph, Fourier transform infrared, and photoluminescence spectroscopy. The as-prepared MgO nanocrystals appear to be single cubic crystalline phase and the diameter is in the range of 20–25 nm. The hypersensitive transition (⁴F_9/2→⁶H_13/2 of Dy³⁺) emission is prominent in the emission spectra resulting from the low-symmetry local site at which Dy³⁺ ions locate. In addition, the dependence of the luminescence intensity on Dy³⁺ concentration is also discussed.     

Charge transfer in CdTe at 200 and 300 K

Using a perfect single crystal sample of CdTe grown using PVT method, the electronic charge transfer in the II–VI compound semiconductor CdTe at 200 and 300 K has been evaluated using two different approaches: (1) by solving a quadratic equation involving the observed structure factors of h+k+l=4n+2 type reflections; and (2) by a graphical approach in which the observed and calculated atomic form factors are extrapolated to sinθ/λ=0, to determine the transferred charge. Precise X-ray structure factors collected using MoK radiation have been used for the analysis. The results obtained are reasonable and clearly indicate the ionicity by which charge is transferred from Cd to Te in CdTe.     

Influence of ambient gases on the morphology and photoluminescence of ZnO nanostructures synthesized with nickel oxide catalyst

The morphology and luminescence properties of ZnO nanowires synthesized using NiO catalyst in a chemical vapor deposition system under different growth ambient have been studied. ZnO nanostructures were prepared in nitrogen, ammonia and hydrogen ambient and characterized using X-ray diffraction, scanning electron microscopy, transmission electron microscopy and photoluminescence. Growth in nitrogen ambient yields ZnO nanoneedles while growth with ammonia and hydrogen ambient ends up with ZnO nanowires. Presence of the Ni tip at the end in either morphology indicated the involvement of vapor–liquid–solid growth mechanism. Enhanced green emission in ZnO nanowires implies the presence of a high density of oxygen vacancies. Influence of the ambient gases on the morphology and optical properties of ZnO nanostructures is discussed.     

InSeI单晶的制备及其结构与性能研究

利用化学气相传输法(CVT)制备了InSeI单晶。该晶体为黄色的针状物,晶体较脆。在室温下进行X射线衍射分析发现,其属于四方晶系,晶胞参数为a=b=1.864 3(5) nm,c=1.012 0(3) nm,V=3.517 2 nm³,空间群为I4₁/a。紫外可见光吸收光谱、光致发光光谱等结果显示该晶体的禁带宽度是2.48 eV,在一定波段光的激发下,InSeI单晶在600 nm左右有较宽的发射峰,表明该晶体的发光方式为缺陷态发光。介电温谱表明InSeI单晶在440 K时其四方相的结构发生了相变。     

Synthesis and characterization of PbSe and PbSe/PbS core–shell colloidal nanocrystals

A new colloidal procedure, for the synthesis of PbSe and PbSe/PbS core–shell semiconductor nanocrystals (NCs), is reported. The synthesis includes the reaction between tributyl-phosphine selenium and lead 2-ethyl-hexanoate, under inert gas at room temperature. High-resolution transmission electron microscopy (HRTEM), X-ray energy dispersive spectroscopy (EDS), absorption and photoluminescence (PL) spectroscopy were used to characterize the samples. The EDS and HRTEM confirmed the existence of rock-salt cubic structures of the PbSe. Furthermore, the HRTEM showed the formation of PbSe/PbS core–shell structures, with epitaxial shell layer with thickness varying between 1 and 4 ML. The absorption spectra of these materials exhibited distinct transitions, related to the e1–h1, e2–h2 and e2–h3 and e2–h1 transitions. These bands are blue shifted with decrease in the NCs diameter. However, the e1–h1 is slightly red shifted with increase in the PbS shell thickness. The last effect can be due to an electronic mixing of the PbSe and PbS conduction states. The PL measurements showed a substantial increase of the exciton emission in the core–shell structures, arising by an efficient chemical passivation of the PbSe core.     

Energy transfer and annealing behavior of luminescence in Dy-doped PbWO4 single crystal

The Dy³⁺: PWO single crystal was subsequently annealed in air atmosphere at a temperature of 500°C, 550°C, 600°C, 700°C, 800°C, 900°C, and 1000°C, respectively. X-ray excited luminescence spectra were measured before and after each step of annealing. Annealing experiments confirmed the energy transfer-taking place from PbWO₄ (PWO) host to Dy³⁺ ions, followed by the enhancing characteristic emission of Dy³⁺ ions. In the process of annealing, the luminescence of PWO host was significantly reduced while that of Dy³⁺ was increased simultaneously. Annealing at a temperature below 700°C suppressed the blue luminescence of the PWO host and enhanced its green components, while the emission of Dy³⁺ is increased to some extent. Further annealing at higher temperature strongly reduced the luminescence of the PWO host, while the emission of Dy³⁺ was greatly increased. Interstitial oxygen O_i could play an important role in the luminescence. Annealing could modify the luminescence of Dy³⁺ ions in PWO, which may be useful in terms of some application purposes.     

Growth of Eu-doped GaN by gas source molecular beam epitaxy and its optical properties

Eu-doped GaN with various Eu concentrations were grown by gas source molecular beam epitaxy, and their structural and optical properties were investigated. With increasing Eu concentration from 0.1 to 2.2 at%, deterioration of the structural quality was observed by reflection high-energy electron diffraction, atomic force microscopy and X-ray diffraction. Such a deterioration may be caused by an enhancement of island growth and formation of dislocations. On the other hand, room temperature photoluminescence spectra showed red emission at 622 nm due to an intra-atomic f–f transition of Eu³⁺ ion and Fourier transform infrared spectra indicated an absorption peak at about 0.37 eV, which may be due to a deep defect level. The intensity of the red luminescence and the defect-related absorption peak increased with increasing Eu concentration, and a close correlation in the increasing behavior was observed between them. These results suggest that the deep defect level plays an important role in the radiative transition of Eu³⁺ ion in GaN and the optical process for the luminescence at 622 nm was discussed with relation to the defect.     

Growth and characterization of CdSe single crystals by modified vertical vapor phase method

Good quality, large single crystals of CdSe were grown by the modified growth method (i.e., vertical unseeded vapor phase growth with multi-step purification of the starting material in the same quartz ampoule without any manual transfer between the steps). Lower temperature gradients (8–9°C/cm) at the growth interface were used for the crystal growth. As-grown CdSe crystals was characterized by X-ray diffraction, scanning electron microscopy, energy dispersive analyzer of X-rays, high-resistance instrument measurement, and etch-pit observation. It is found that there are two cleavage faces of (1 0 0) and (1 1 0) orientations on the crystal, the resistivity is about 10⁸ Ω cm, and the density of etch pits is about 10^3–4/cm². The crystal was cut into wafers and was fabricated into detectors. The detectors were tested using an ²⁴¹Am radiation source. γ-ray spectra at 59.5 keV were obtained. The results demonstrated that the quality of the as-grown crystals was good. The crystals were useful for fabrication of room-temperature-operating nuclear radiation detectors. Therefore, the modified growth technique is a promising, convenient, new method for the growth of high-quality CdSe single crystals.     

Anomalous temperature-dependent photoluminescence characteristic of as-grown GaInNAs/GaAs quantum well grown by solid source molecular beam epitaxy

The photoluminescence (PL) mechanisms of as-grown GaInNAs/GaAs quantum well were investigated by temperature-dependent PL measurements. An anomalous two-segmented trend in the PL peak energy vs. temperature curve was observed, which has higher and lower temperature-dependent characteristics at low temperature (5–80 K) and high temperature (above 80 K), respectively. The low and high-temperature segments were fitted with two separate Varshni fitting curves, namely Fit_low and Fit_high, respectively, as the low-temperature PL mechanism is dominated by localized PL transitions while the high-temperature PL mechanism is dominated by the e1–hh1 PL transition. Further investigation of the PL efficiency vs. 1/kT relationship suggests that the main localized state is located at 34 meV below the e1 state. It is also found that the temperature (80 K) at which the PL full-width at half-maximum changes from linear trend to almost constant trend correlates well with the temperature at which the PL peak energy vs. temperature curve changes from Fit_low to Fit_high.     

Electric field induced percolation

The I–V characteristics of heat-treated polyacrylonitrile (PAN) thin film samples obtained by pyrolysis at temperatures T_p up to 550°C are considered. The effect of iodine-doping is investigated by comparison with undoped material. The I–V characteristics of doped samples exhibit linear behaviour at low voltage then a strong increase of conductivity. The bend shifts down to low voltages when the pyrolysis temperature T_p is increased. Experimental results are interpreted with the help of two randomly distributed phases in the medium in which doping involves an electric field aided percolation phenomenon.     

Growth of semi-insulating InP by GSMBE

Fe doped semi-insulating InP layers have been grown by gas source MBE with a solid iron source. Structure as n-i-n, p-i-n and p-n-i-n were characterized by I(V) measurements and secondary ion mass spectroscopy profiling (SIMS). As shown by SIMS, uniform Fe doping and abrupt transitions are achieved for the different structures studied. Resistivities as high as 1.5×10⁹ Ω cm are determined from I(V) curves for Fe concentrations in the 10¹⁷ cm^-3 range. Lasers with semi-insulating layers have been realized for the first time by gas source MBE. Preliminary results show power emission of 43 mW, without antireflecting coating, comparable to state-of-the-art characteristics.