Thermal annealing effect of on optical constants of vacuum evaporated Se75S25−xCdx chalcogenide thin films

Chalcogenide glasses are interesting materials due to their infrared transmitting properties and photo induced effects exhibited by them. Thin films with thickness of 3000 Å of the glasses Se₇₅S_25−xCd_x with x=6, 8 and 10 at% prepared by melt quench technique were evaporated by thermal evaporation onto glass substrates under a vacuum of 10⁻⁶ Torr. The optical constants (absorption coefficient, refractive index and extinction coefficient) of as-prepared and annealed films have been studied as a function of photon energy in the wave length region 400-1000 nm. Analysis of the optical absorption data shows that the rule of non-direct transitions predominates. It has been found that the absorption coefficient and optical band gap increase with increasing annealing temperatures. The refractive index (n) and the extinction coefficient (k) were observed to decrease with increasing annealing temperature.     

Optical band gap and optical constants in a-Se80Te20−xPbx thin films

The optical constants (absorption coefficient, refractive index, extention coefficient, real and imaginary part of dielectric constant) have been studied for a-Se₈₀Te_20−xPb_x (where x = 0, 2, 6, 10) thin films as a function of photon energy in the wave length range (500–1000 nm). It has been found that the optical band gap increases while the refractive index and the extinction coefficient (k) decreases on incorporation of lead in Se–Te system. The value of absorption coefficient (α) and the extinction coefficient (k) increases, while the value of refractive index (n) decreases with incident photon energy. The results are interpreted in terms of the change in concentration of localized states due to the shift in fermi level.     

Dispersive optical constants of a-Se100−xSbx films

Thin films of amorphous Se_100−xSb_x (x=5,10 and 20 at%) system are deposited on a silicon substrate at room temperature (300 K) by thermal evaporation technique. The optical constant such as refractive index (n) has been determined by a method based on the envelope curves of the optical transmission spectrum at normal incidence by a Swanpoel method. The oscillator energy (E_o), dispersion energy (E_d) and other parameters have been determined by the Wemple–DiDomenico method. The absorption coefficient (α) has been determined from the reflectivity and transmitivity spectrum in the range 300–2500 nm. The optical-absorption data indicate that the absorption mechanism is a non-direct transition. We found that the optical band gap, E_g^opt, decreases from 1.66±0.01 to 1.35±0.01 eV with increase Sb content.     

Laser-induced changes on optical band gap of amorphous and crystallized thin films of Se75S25−xAGx

Optical band gap of amorphous, crystallized, laser induced amorphous and laser induced crystallized films of Se₇₅S_25−xAg_x (x=4, 6 and 8) glassy alloys was studied from absorption spectra. The amorphous and crystallized films were induced by pulse laser for 10 min. After laser irradiation on amorphous and crystalline films, optical band gap was measured. It has been found that the mechanism of the optical absorption follows the rule of indirect transition. The amorphous thin films show an increase in the optical band gap, while the crystallized (thermally annealed) thin films show a decrease in the optical band gap by inducing laser irradiation. Crystallization and amorphization of chalcogenide films were accompanied with the change in the optical band gap. The change in optical energy gap could be determined by identification of the transformed phase. These results are interpreted in terms of concentration of localized states due to shift in Fermi level.     

Influence of composition on electrical and optical properties of new chalcogenide thin films from Ge-Se-Tl system

Bulk Ge₂₀Se_80−xTl_x (x ranging from 0 to 15 at%) chalcogenide glasses were prepared by conventional melt quenching technique. Thin films of these compositions were prepared by thermal evaporation, on glass and Si wafer substrates at a base pressure of 10⁻⁶ Torr. X-ray diffraction studies were performed to investigate the structure of the thin films. The absence of any sharp peaks in the X-ray diffractogram confirms that the films are amorphous in nature. The optical constants (absorption coefficient, optical band gap, extinction coefficient and refractive index) of Ge₂₀Se_80−xTl_x thin films are determined by absorption and reflectance measurements in a wavelength range of 400-900 nm. In order to determine the optical gap, the absorption spectra of films with different Tl contents were analyzed. The absorption data revealed the existence of allowed indirect transitions. The optical band gap showed a sharp decrease from 2.06 to 1.79 eV as the Tl content increased from 0% to 15%. It has been found that the values of absorption coefficient and refractive index increase while the extinction coefficient decreases with increase in Tl content in the Ge-Se system. These results are interpreted in terms of the change in concentration of localized states due to the shift in Fermi level. DC electrical conductivity of Ge₂₀Se_80−xTl_x thin films was carried out in a temperature range 293-393 K. The electrical activation energy of these films was determined by investigating the temperature dependence of dc conductivity. A decrease in the electrical activation energy from 0.91 to 0.55 eV was observed as the Tl content was increased up to 15 at% in Ge₂₀Se_80−xTl_x system. On the basis of pre-exponential factor, it is suggested that the conduction is due to thermally assisted tunneling of the carriers in the localized states near the band edges.     

Optical characterization of xTiO2-(60 − x)SiO2-40Na2O glasses: II. Absorption edge, Fermi level, electronic polarizability and optical basicity

In the present work different optical properties of xTiO₂-(60 − x)SiO₂-40Na₂O (wt%) optical glasses are determined. The characterization is done over a wide energy range, 0.41-6.2 eV. The refractive index and the extinction coefficient data are used to measure the absorption coefficient of the different glass compositions. Studying the UV-absorption edge, both direct and indirect allowed transitions with their optical energy gaps are carried out. In the same time, the Urbach energy is evaluated. From the extinction coefficient data, the Fermi energy of the glasses is calculated. The molar refraction, electronic polarizability and the optical basicity are obtained using the measured glass refractive indices.     

The structural, electronic and optical properties of CdxZn1 − xSe ternary alloys

The structural, electronic, and optical properties of Cd_xZn_1 − xSe alloys are investigated using the first-principles plane-wave pseudopotential method within the LDA approximations. In particular, the lattice constant, bulk modulus, electronic band structures, density of state, and optical properties such as dielectric functions, refractive index, extinction coefficient and energy loss function are calculated and discussed. Our results agree well with the available data in the literature.     

Novel optical film sensor design based on p-polarized reflectance

A new scheme of optical film sensor is presented. The sensor is based on p-polarized reflectance, consisting of a sensing coated substrate, is easily optimized for maximum sensitivity in different applications. The resolutions of refractive index n_f, extinction coefficient k_f and thickness h_f of the sensitive films are predicted to be 10⁻⁷, 10⁻⁵ and 10⁻³ nm, respectively. Experimentally, we selected the sol–gel derived SnO₂ films as gas-sensitive films and conducted preliminary gas-sensing test. The results indicate that novel optical film sensor scheme has higher sensitivity, and the detection sensitivity is available to 10⁻¹ ppm on the condition of optimum optical parameters and incident angle.     

Dispersive optical constants of glassy AsSe1−xTex system

The compositional dependence of the optical constants, the refractive index n, and the absorption index k, of the AsSe_1−xTe_x thin films with 0<x<1.0 were determined in the spectral range of 400–2500 nm. The maximum value of the refractive index n, is shifted toward the long wavelength by increasing the Te content in the examined system. The values of the forbidden energy gap of the system have been determined and were correlated with the type and the amount of chemical bonds formed by the increasing Te content in the AsSe_1−xTe_x glassy system. The value of the dispersion energy E_d exhibits low value at the composition containing the same atomic percent of Se and Te.     

Optical properties of AsSe1.5−xTex glassy system

Thin AsSe_1.5−xTe_x films with 0x<1.5 have been prepared by a thermal vacuum evaporation technique onto quartz and glass substrates kept at room temperature (300 K). The optical constants, the refractive index, n, and the absorption index, k, of the films were determined for the investigated compositions of different thickness values (100–300 nm) using spectrophotometric measurements of the transmittance, T, and the reflectance, R, at normal incidence in the spectral range 400–2500 nm. The obtained values of both n and k were found to be independent of the film thickness within the above mentioned thickness range. The estimated indirect and direct optical energy gap decreased as tellurium content increased in the parent sample AsSe_1.5. The values of dispersion energy, E_d, and lattice dielectric constant, _L, of the system have been determined and correlated with the type and amount of chemical bonds and the relative proportion of the constituent elements in the examined compositions.     

Optical investigation of vacuum evaporated Se80−xTe20Sbx (x = 0, 6, 12) amorphous thin films

Amorphous thin films of Se_80−xTe₂₀Sb_x (x = 0, 6, 12) chalcogenide glasses has been deposited onto pre-cleaned glass substrate using thermal evaporation technique under a vacuum of 10⁻⁵ Torr. The absorption and transmission spectra of these thin films have been recorded using UV spectrophotometer in the spectral range 400–2500 nm at room temperature. Swanepoel envelope method has been employed to obtain film thickness and optical constants such as refractive index, extinction coefficient and dielectric constant. The optical band gap of the samples has been calculated using Tauc relation. The study reveals that optical band gap decreases on increase in Sb content. This is due to decrease in average single bond energy calculated using chemical bond approach. The values of urbach energy has also been computed to support the above observation. Variation of refractive index has also been studies in terms of wavelength and energy using WDD model and values of single oscillator energy and dispersion energy has been obtained.     

Spectral features of Ge50−ySbxTe50−x+y alloys where 0x15 and 0y30 in thin film state

Optical spectral features of Ge_50−ySb_xTe_50−x+y alloys where 0x15 and 0y30 in the thin film state were measured. The transmittance and reflectance have been measured at normal incidence at room temperature in the spectral range 190–2500 nm for all compositions with different thicknesses. Refractive index and extinction coefficient have been evaluated in the above spectral range. Band tail width and the band edge parameter were almost constant for all samples with different compositions. Absorption band spectrum on the basis of the imaginary parts of the dielectric constant, ε₂, was applied in evaluating the optical band gap.     

Effect of In-content on the optical properties of a-Se films

The optical transmission spectra of amorphous (a-) Se_1−xIn_x films, with x = 0.0, 0.05, 0.18 and 0.35, that prepared by thermal evaporation from their corresponding bulk ingots, are recorded over the spectral region of 500–2500 nm. A simple straight forward procedure proposed by Swanepeol has been applied to determine the two components of the complex refractive index (). The dispersion of is examined in terms of the Wemple and DiDomenico model and is discussed in terms of In-content. An estimation of various optical parameters such as, the optical energy gap (E_g = 1.96–1.33 eV), single oscillator energy (E_o = 3.95–3.16 eV), oscillator dispersion energy (E_d = 22.6–31.6 eV), lattice oscillator strength (E_l = 0.38–0.61 eV) and wavelength at zero material dispersion (λ_c = 2.0569–2.0879 μm) have been given and discussed in relation to the coordination number, hydrostatic density and formed chemical bonds that are introduced in the network of a-Se with the introduction of up to 35 at.% In.     

Parametric Frequency Converters Based on New Nonlinear Crystals

Results of investigations into the physical properties of a number of new nonlinear crystals are presented. The parameters of frequency converters manufactured on their basis are compared, and second-harmonic generation of CO₂ lasers first excited by frequency conversion in LiInSe₂, AgGa_{1– x} In_xSe₂, Ag_xGa_xGe_xS_{2(1 + x)}, and Hg_1–x Cd_xGa₂S₄ crystals is investigated. The superiority of HgGa₂S₄, Hg_1–x Cd_xGa₂S₄, and AgGa_1–x In_xSe₂ over the well-known crystals has been demonstrated for frequency conversion both within the middle-IR range and from the visible range to the middle-IR range. Advantages of LiInSe₂ and AgGa_1–x In_xSe₂ crystals are demonstrated for the direct frequency conversion of femtosecond laser radiation to the middle-IR range compared to the cascade frequency conversion and direct frequency conversion in LiInS₂ crystals.     

Analyses of intrinsic inhomogeneity and metal segregation in samples of Ag–Ge–Se glasses

Ge_ySe_(1−y) glasses are semiconductors but when Ag is added above certain threshold concentration, Ag_x[Ge_ySe_(1−y)]_(100−x) glasses behave as fast ionic conductors [Ureña et al., Solid State Ionics 176 (2005) 505]. This peculiar behavior may be attributed to the intrinsically inhomogeneous nature of these glasses where zones rich in metals coexist with zones of the host material. The conductivity transformation may be ascribed to the percolation of the Ag rich phase [Pradel et al., J. Phys.: Condens. Matter 15 (2003) S1561].Ag_x[Ge_0.25Se_0.75]_(100−x) glasses either massive or as films were obtained by melt quenching and pulsed laser deposition (PLD), respectively, in compositions belonging to the Se rich corner of the ternary phase diagram. Their amorphous nature and intermediate range order was checked employing X-ray diffractometry (XRD), the short range order was characterized by extended X-ray absorption fine structure (EXAFS) (Ge and Se K absorption edge) and their microstructure was characterized by scanning electron microscopy (SEM) and small angle X-ray scattering (SAXS).     

Nonlinear optical responses of Sudan IV doped liquid crystal by z-scan and moiré deflectometry techniques

The nonlinear optical properties of a nematic liquid crystal doped with an azo dye were investigated. The magnitude and the sign of the third-order nonlinear refractive index, n₂, were measured using both single-beam z-scan and moiré deflectometry techniques. The measurements were performed at 532 nm using a Nd:Yag CW laser. The positive sign showed that sample which was studied possess a self-focusing optical nonlinearity. Rather close agreement was found between the values for n₂ obtained by z-scan and by moiré deflectometry. The nonlinear refractive index was found to be in the order of 10^− 6 (cm²/W) and the nonlinear absorption coefficient to be β = 0.171 (cm/W).     

Structural and optical studies of thermally evaporated CoPc thin films

The structure of the thermally evaporated cobalt phthalocyanine (CoPc) thin film in the β-form is investigated, and shows a single strong peak indicating preferential orientation in the (1 0 0) direction. Some structural parameters such as crystallite grain size, dislocation density and the number of crystallites per unit surface area are determined.The spectral parameters are determined by applying the electronic orbital transitions.But the optical parameters are deduced using band-model consideration for thin films of Pc.The spectral and optical parameters have also been investigated by using the spectrophotometric measurements of transmittance and reflectance in the wavelength range 200–2500 nm.The absorption spectra recorded in the UV–VIS region show two absorption bands of phthalocyanine (Pc) molecule, namely the Soret band (B) and the Q-band. The Q-band shows its characteristic splitting (Davydov splitting) with ΔQ=0.23 eV.Some of the important spectral parameters, namely optical absorption coefficient (α), molar extinction coefficient (_molar), oscillator strength (f), electric dipole strength (q²) and absorption half bandwidth (Δλ) of the principle optical transitions have been evaluated.The fundamental and the onset indirect energy gaps could be estimated as 2.90 + or − 0.05 and 1.51 eV, respectively.The refractive index showed an anomalous dispersion in the absorption region as well as normal dispersion in the transparent region. From analysis of dispersion curves, the dielectric constants, the dispersion parameters and the molar polarizability were obtained.All the above parameters were obtained for films as deposited and as annealed. No remarkable annealing effect on many parameters was observed.     

Preparation and optical constants of the nano-crystal and polymer composite Bi4Ti3O12/PMMA thin films

Bismuth titanate, Bi₄Ti₃O₁₂ (BTO), is a typical ferroelectric material with useful properties for optical memory, piezoelectric and electro-optic devices. Its nano-crystals were compounded by the chemical solution decomposition technique. Its structure and size were analyzed by X-ray diffraction and transmissive electron microscopy. The composite thin film of BTO nano-crystals and high transparency polymethylmethacrylate (PMMA) polymer was prepared by spin coating. The transmitted spectrum of BTO/PMMA composite thin film in 300–1500 nm was measured. The film thickness d and the optical constants of the film, such as the refractive index n, the absorption coefficient α, and the extinction coefficient κ were obtained using the data from the transmitted spectrum.     

Optical-field profiles in InxGa1−xN -MQW laser structures

In this paper, we calculated the optical fields for In_xGa_1−xN-multiquantum well (MQW) laser structures. Two different optical cavities are compared, the conventional step separate confinement heterostructure (Step) and a graded-index (GRIN) structure with a parabolic variation of the Al content in the Al_xGa_1−xN guide layers. A comparison is made regarding the confinement factor, near- and far-field patterns. An anomalous behavior for the confinement factor is observed in the structure, and it can be eliminated by choosing an appropriated combination of the layer’s thicknesses forming the waveguide. For Al_xGa_1−xN, an improved expression for the refractive index is presented, which shows better agreement with experimental data than previously reported expressions.     

Radiation effects on the optical properties of Se85−x Te15Sb x thin films

The optical absorption of the as-deposited and γ-irradiated (doses of 3, 10, 12, 15 Mrad) thermally evaporated Se_85?x Te₁₅Sb _x (x=0, 6, 9) films was measured. The refractive index n and the extinction coefficient k of the films were calculated using an analytical method developed by Zheng et al. The Urbach relation was used in the fundamental edge region to calculate the width of the band tail states. The behavior of the composition with high concentration of antimony (x=9) was attributed to the produced Se–Sb bonds and an excess of Te–Te bonds, which break the chain structure of the Se–Te system and generate defects in the film. The related optical parameters were also calculated and discussed.