共查询到19条相似文献,搜索用时 62 毫秒
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用真空蒸镀方法制备了[Fe/Cr],[Fe/Cr/Si]和[Fe/Si]多层膜.研究了Cr层、Si层和Cr+Si层厚度变化对层间耦合和磁电阻的影响.Fe层厚为2nm,Cr层厚度变化存在耦合振荡和巨磁电阻及其振荡.磁电阻值为14.6%(4.2K).在Cr层中加入一半Si层或全部由Si层替代,振荡消失,磁电阻减小到千分之几.根据掺Si层后多层膜的电阻率变化,认为Si加入使非磁层中自由电子数减少,随之极化效应也变弱,导致振荡消失,磁电阻大为降低
关键词: 相似文献
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对以本征Si及重掺杂p型和n型Si作为中间层的Fe/Si多层膜的层间耦合进行研究,并通过退火,增大Fe,Si之间的扩散,分析界面扩散对层间耦合的影响. 实验结果表明,层状结构良好的制备态的多层膜,Fe,Si之间也存在一定程度的扩散,它是影响层间耦合的 主要因素,远远超过了半导体意义上的重掺杂,使不同种类的Si作为中间层的层间耦合基本 一致.进一步还发现,在一定范围内增大Fe,Si之间的扩散,即使多层膜的层状结构已经有了相当的退化,Fe/Si多层膜的反铁磁耦合强度基本保持不变.
关键词:
Fe/Si多层膜
层间耦合
界面扩散 相似文献
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The Ta/Si multilayers on (100) Si substrate have been studied over the annealing temper-ature range from 500 to 900℃ by X-ray diffraction and cross-section transmission electron microscopy. The periodicity of the multilayers becomes worse with increasing annealing tem-perature and disappears at 750℃. At 600℃, two kinds of modulation wavelength coexist because the size of several TaSi2 grains is larger than the contracted original modulation wavelength. The films are contracted after annealing. The largest contraction, at least 40nm decreasing in thickness, occurs at 600℃. When the annealing temperature is lower than 600℃, h-TaSi2 grains grow randomly and the growth is not affected by the substrate. At temperatures higher than 750℃, h-TaSi2 grows preferentially in [001] direction parallel to [100] axis of Si substrate. The appearance of texture depends on whether the atomic diffusion is short range or long range at the corresponding annealing temperature. 相似文献
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