钙钛矿结构Pr1-xCaxMnO3薄膜中电脉冲诱导电阻值变化的理论研究

建立一个有效的三明治隧穿模型研究在Pr1-xCaxMnO3薄膜中电流脉冲引起的电阻改变(EPIR)性质,发现载流子在三明治结构各区域间的隧穿概率以及在不均匀界面层的导通概率对材料的EPIR值产生重要影响.还研究了电流-电压曲线中的迟滞效应,得到的结果与近年来的文献报道一致.     

a-SiNx/nc-Si/a-SiNx双势垒结构中的电荷隧穿和存储效应

在等离子体增强化学气相沉积系统中利用大氢稀释逐层淀积技术制备nc-Si量子点阵列,用硅烷和氨气混合气体淀积氮化硅层,制备了a-SiN_x/nc-Si/a-SiN_x不对称双势垒结构,其中隧穿和控制a-SiN_x层的厚度分别为3和20 nm.利用电导-电压和电容-电压测量研究结构中的载流子隧穿和存储特性.在同一样品中观测到由于电荷隧穿引起的电导峰和由于电荷存储引起的电容回滞现象.研究结果表明,合理地选择隧穿层和控制栅层的厚度,就能够实现载流子发生共振隧穿进入到nc-Si量子点中,并被保存在nc-Si量子点中. 关键词： nc-Si量子点 电导峰 存储效应     

超薄栅氧化层n-MOSFET软击穿后的导电机制

研究了恒压应力下超薄栅氧化层n型金属-氧化物-半导体场效应晶体管（n-MOSFET）软击穿 后的导电机制.发现在一定的栅电压V_g范围内，软击穿后的栅电流I_g符合Fowl er-Nordheim隧穿公式，但室温下隧穿势垒_b的平均值仅为0936eV，远小于S i/Si O₂界面的势垒高度315eV.研究表明，软击穿后，处于Si/SiO₂界 面量子化能级上的 电子不隧穿到氧化层的导带，而是隧穿到氧化层内的缺陷带上._b与缺陷带能 级和电 子所处的量子能级相关；高温下，激发态电子对隧穿电流贡献的增大导致_b逐 渐降低. 关键词： 软击穿 栅电流 类Fowler-Nordheim隧穿 超薄栅氧化层     

(La0.7Sr0.3MnO3)m(BiFeO3)n超晶格间隔的La0.7Sr0.3MnO3三明治结构制备及表征

采用射频磁控溅射的方法在SrTiO₃（001） 基片上制备了（La_0.7Sr_0.3MnO₃）_m（BiFeO₃）_n超晶格间隔的La_0.7Sr_0.3MnO₃三明治结构.X射线衍射分析证明（La_0.7Sr_0.3MnO_{关键词： 超晶格薄膜 电诱导效应 隧道效应}     

Vaidya-Bonner黑洞的费米子隧穿

运用费米子隧穿的理论,对Vaidya-Bonner黑洞的费米子Hawking辐射进行研究.使用随动坐标变换,并假设γ^μ矩阵的一个合理形式,从而得到了Vaidya-Bonner黑洞的自旋为1/2的粒子的隧穿辐射行为. 关键词： Vaidya-Bonner黑洞 Dirac方程 Hawking辐射 费米子隧穿     

(La0.7Sr0.3MnO3 )m(BiFeO3)n 超晶格结构的导电机理

利用射频磁控溅射的方法在SrTiO₃(001) 基片上制备了(La_0.7Sr_0.3MnO₃)_m(BiFeO₃)_n超晶格结构.对所制备的超晶格结构进行了50—150℃温度范围内的电流-电压测试分析.结果表明,随着BiFeO₃薄膜的厚度减小,温度的升高,(La_0.7Sr_0.3MnO₃)_m(BiFeO₃)_n超晶格结构的电流变大.进一步根据介质导电模型对(La_0.7Sr_0.3MnO₃)_m(BiFeO₃)_n超晶格结构的导电特性做了分析.在温度较低或者电场较弱时,所制备的(La_0.7Sr_0.3MnO₃)_m(BiFeO₃)_n超晶格结构表现为欧姆导电,而在高温,高电场的情况下,其导电行为由空间电荷限制电流机理主导. 关键词： 超晶格薄膜 多铁 空间电荷限制电流     

尺寸可控的纳米硅的生长模型和实验验证

基于经典热力学理论，对a-SiN_x/a-Si:H/a-SiN_x三明治结构或a-Si:H/a-SiN_x多层膜结构中纳米硅成核，以及从球形到鼓形的生长过程进行了研究. 建立了限制性晶化理论模型：在纳米硅生长过程中，由于界面能增大将导致生长停止，给出限制性晶化条件——a-Si:H子层厚度小于34 nm. 在激光晶化和常规热退火两种方法形成的a-SiN_x/nc-Si/a-SiN_x三明治结构和nc-Si/a-SiN_x多层膜结构中验证了该理论模型. 关键词： 非晶硅 纳米硅 激光辐照 结晶     

La1－xSrxMnO3/TiO2 (x=0.2, 0.15, 0.04)异质pn结的整流特性

采用磁控溅射法制备的La_1-xSr_xMnO₃ (LSMO)/TiO₂异质pn结表现出很好的整流特性.室温电流电压特性曲线显示随着Sr掺杂的增加，扩散电压增大，这可能由于Sr掺杂的增加导致载流子浓度增大所致.电流电压变温特性曲线显示随着测量温度的降低，扩散电压增大，这可能由于随着测量温度的变化导致界面电子结构的变化所致.值得提出的，异质pn结电阻随温度变化曲线表现出单层LSMO的金属绝缘相变特性，并且在低测量温度时表现出随着测量温度的降低结电阻增大，这可能是由于宽带隙的TiO₂的引入导致. 关键词： 异质结 整流特性 庞磁阻     

Nd0.7Sr0.3MnO3陶瓷中界面“陷阱态”相关电阻转变行为

通过固相烧结和高能球磨后热处理两种方法分别得到不具晶(相)界和具有明显晶(相)界的两种Nd_0.7Sr_0.3MnO₃陶瓷样品, 并用两线法和四线法分别对这两种样品的电极-块体接触界面和晶(相)界界面的I-V和电脉冲诱导电阻转变效应(EPIR)进行研究. 结果发现, 在两线法测试下, 电极-块体界面具有回滞的非线性I-V特征, 并能产生稳定的EPIR效应, EPIR的稳定性随温度的升高逐渐减弱并消失; 而对具有明显晶(相)界的陶瓷样品, 四线法测试结果表明, 虽然其I-V行为也具有非线性和回滞性特点, 但不能产生EPIR 效应. 这些奇特的界面输运行为与界面中的各种缺陷充当“陷阱”并实现对载流子的捕捉和释放过程密切相关. 而大量的晶(相)界界面及其复杂的连接方式导致较大的漏导则是晶(相)界不能出现EPIR效应的主要原因.     

点接触金属/Pr$lt;sub$gt;0.7$lt;/sub$gt;Ca$lt;sub$gt;0.3$lt;/sub$gt;MnO$lt;sub$gt;3$lt;/sub$gt;/Pt结构稳定的低电流电阻开关特性

利用自主开发的导电原子力显微镜控制Pt,W探针构成点接触金属/Pr_0.7Ca_0.3MnO₃（PCMO）/Pt三明治结构,对其电流-电压（I-V）及脉冲诱导电阻开关（EPIR）特性进行了研究.研究发现,在10 nA限流下两种电极对应结构的I-V都表现出相当稳定的双极性电阻开关特性,以及大于100的电阻开关比.进一步测试发现,点接触W/PCMO/Pt器件具有在10 nA限流下稳定的EPIR特性以及100 pA限流下重复的双极性电阻开关特性.此电流比已报道的电流低3个数量级,表明此结构在低功耗存储器件方面的潜在应用.通过对比样品不同位置、不同限流、不同接触面积点接触Pt/PCMO/Pt的I-V回滞特性,把点接触器件在低电流下稳定、显著的电阻开关效应归结于小的器件面积导致强的局域电场加强了O离子迁移效应. 关键词： 脉冲诱导电阻开关 电场下氧离子迁移 电阻开关     

“Positive” and “negative” electric-pulse-induced reversible resistance switching effect in Pr<Subscript>0.7</Subscript>Ca<Subscript>0.3</Subscript>MnO<Subscript>3</Subscript> films

“Negative” electric-pulse-induced reversible resistance (EPIR) switching phenomenon was found in In/PCMO/Pt sandwich, in which the high resistance can be written with positive voltage pulses, and the low resistance can be reset using negative voltage pulses (the positive voltage direction is defined as going from the top electrode to the bottom electrode). This is just the opposite from the “positive” EPIR effect in Ag/PCMO/Pt sandwich, in which the high resistance can be written only with negative voltage pulses, and the low resistance can be reset using positive voltage pulses. The I–V hysteresis curves of In/PCMO/Pt and Ag/PCMO/Pt sandwiches also show opposite directions, i.e., counterclockwise and clockwise under a negative voltage region for indium and Ag electrode systems, respectively. C–V characteristics show that the barrier does not exist in Ag/PCMO/Pt sandwich, while In/PCMO/Pt sandwich exhibits an obvious Schottky-like barrier. We suggest that in the negative EPIR behavior in In/PCMO/Pt structure, the resistance states are mainly controlled changing the Schottky-like barrier at the interface with the weak effect of carrier trapping process, while the positive EPIR behavior in Ag/PCMO/Pt sandwich mainly depends on the carrier trapping process at the interface. PACS 72.80.-r; 73.40.-C; 75.70.-i     

Resistance switching in Fe-doped P0.7Ca0.3MnO3 thin films

An enhanced electric-pulse-induced resistance (EPIR) switching effect is observed in the Ag/P_0.7Ca_0.3Mn_1 − xFe_xO₃/YBa₂Cu₃O₇ (Ag/PCMFO/YBCO) and Ag/(PCMFO/PCMO)/YBCO structures. Unlike in the PCMO-based EPIR devices, where the Ag/PCMO interface plays a crucial role, both the Ag/PCMFO interface and the bulk PCMFO are found to have significant contributions to the EPIR switching of the PCMFO-based device. A possible explanation is to extend the pulse-driven oxygen ion/vacancy motion model at the metal/PCMO interface region to the bulk PCMFO.     

Electric-pulse-induced resistance switching in Nd0.7Sr0.3MnO3 ceramics

Nonlinear and hysteretic current–voltage characteristics and electric-pulse-induced resistance (EPIR) switching effects were found in Nd_0.7Sr_0.3MnO₃ ceramics. For samples measured using the two-wire method, a polarity-dependent, stable and reproducible EPIR effect occurs in the whole temperature range measured. The high and low resistive metastates vary with temperature and seemingly can be destroyed by temperatures larger than 400 K. However, for the same sample measured using the four-wire method, no EPIR effect is observed. The result indicates that the EPIR effect is intensively correlated with the interface between the Ag-electrodes and the bulk of the Nd_0.7Sr_0.3MnO₃ polycrystal.     

Interface-engineered resistive switching in Ag/SrTiO3/Nd0.7Ca0.3MnO3/YBa2Cu3O7 heterostructures

For Ag/Nd_0.7Ca_0.3MnO₃/YBa₂Cu₃O₇ (Ag/NCMO/YBCO) heterostructures, we investigate effects of an SrTiO₃ (STO) buffer layer inserted into the Ag/NCMO interface upon the room-temperature resistive switching. In comparison with the non-buffered (Ag/NCMO/YBCO) structure, the insertion of the STO buffer layer can greatly enhance the electric-field-induced-resistance (EPIR) effect. The STO-buffered (Ag/STO/NCMO/ YBCO) device can be switched on-and-off between the higher to lower resistance states at an EPIR ratio of 253% with pulsed voltage ±1.5 V and 405% with pulsed voltage ±3.0 V. The enhanced EPIR ratio is attributed to a combined effect of the migration of oxygen vacancies near the interface and ferroelectric polarization of the STO buffer.     

In situ photoemission study of Pr1-xCaxMnO3 epitaxial thin films with suppressed charge fluctuations

We have performed an in situ photoemission study of Pr1-xCaxMnO3 (PCMO) thin films grown on LaAlO3 (001) substrates and observed the effect of epitaxial strain on the electronic structure. We found that the chemical potential shifted monotonically with doping, unlike bulk PCMO, implying the disappearance of incommensurate charge fluctuations of bulk PCMO. In the valence-band spectra, we found a doping-induced energy shift toward the Fermi level (EF) but there was no spectral weight transfer, which was observed in bulk PCMO. The gap at EF was clearly seen in the experimental band dispersions determined by angle-resolved photoemission spectroscopy and could not be explained by the metallic band structure of the C-type antiferromagnetic state, probably due to localization of electrons along the ferromagnetic chain direction or due to another type of spin-orbital ordering.     

La0.5Ca0.5MnO3内禀与界面电脉冲诱导电阻转变效应的比较

一般地,钛矿结构锰氧化物的电脉冲诱导电阻转变(EPIR) 效应源于非内禀界面处的肖特基势垒. 本文采用固相烧结法制备了La_0.5Ca_0.5MnO₃ (LCMO)陶瓷样品, 用四线测量模式对样品电输运性质, 特别对其内禀EPIR效应和忆阻器行为进行了研究. 室温下, 尽管样品在四线测量模式下的I-V特性曲线呈欧姆线性规律, 但在适当的脉冲电压刺激下, 仍能诱导产生明显、稳定的EPIR效应. 通过与二线模式的界面EPIR比较, 发现LCMO内禀EPIR效应具有更小的脉冲临界电压、更好的稳定性和抗疲劳特性, 是稀土掺杂锰氧化物中观察到的一类新颖的EPIR效应. 关键词： 钙钛矿结构锰氧化物 电致电阻效应 电脉冲诱导电阻转变效应 肖特基势垒     

Top electrode effects on resistive switching behavior in CuO thin films

Top electrode (TE) material on the resistive switching behavior of (TE)/CuO/SnO₂:F/Si substrate has been studied. We investigated the switching properties of CuO films deposited by sol-gel process. Two kinds of top electrode (TE) material on the resistive switching behaviors have been studied. The nonpolar and bipolar resistive switching phenomenon was observed in CuO thin films with different top electrodes. The filamentary mechanism was used to explain the two kinds of resistive switching behaviors. For the Pt/CuO/ATO device, it showed the nonpolar resistive switching where conducting path is formed and disappear due to the oxygen vacancy. For the Cu/CuO/ATO device, the resistance reduction is due to the existing Cu to form conduction Cu-rich pathways. An opposite bias takes the existing Cu back to the Cu electrode to its high-resistance state. CuO thin films are also observed by XRD, AFM and XPS.     

Structural study and magnetoresistance effect of epitaxial La0.67Sr0.33MnO3–δ and Pr0.7Ca0.3MnO3−δ multilayer films

La_0.67Sr_0.33MnO_3−δ (LSMO) and Pr_0.7Ca_0.3MnO_3−δ (PCMO) multilayer epitaxial films, which were fabricated with different LSMO and PCMO layer thickness on LaAlO₃ single crystal substrates of (0 0 1) orientation by a direct current magnetron sputtering technique, were studied further, after the structure, magnetoresistance effect and magnetic properties of LSMO/PCMO/LSMO (LPL) trilayer epitaxial films were systemically studied. The superlattice structures of multilayer films were observed according to the diffraction peaks of X-ray diffraction patterns at small angles. The metal–insulator transition temperature (T_P) and peak resistivity (ρ_max) obviously changed when we altered the thickness of PCMO middle layer and the intra-field related with the thickness of those layers and their interaction. Considering the effect of the distribution of electrical field and current, and the interaction among the layers of LSMO and PCMO, an effective fact n* was introduced to replace n (the number of layer). All the calculated values of ρ (the resistivity of multilayer films) accorded with the experimental values.     

Electric pulse-induced resistive switching in ceramic interfaces

We show the existence of a reversible, complementary and polarity dependant electric pulse-induced resistance (EPIR) switching effects in Au/YBa₂Cu₃O_7-δ ceramic superconductor interfaces. Non-volatile high and low resistance states and transition regions between them are obtained as a function of the amplitude and polarity of the pulsing voltage. Relaxation processes of the resistivity after applying the pulses, not associated with heating effects, are also observed. We also report on the temperature sensitivity of these resistance hysteresis switching loops, where both the difference between high and low resistance states and the voltage needed to produce the switching decrease with increasing temperature. Our results are consistent with a mechanism for the EPIR effect based on oxygen electromigration.