N型掺杂应变Ge发光性质

应变锗材料具有准直接带特性,而且与标准硅工艺兼容,成为实现硅基发光器件重要的候选材料之一.本文基于vandeWalle形变势理论,计算了应变情况下半导体Ge材料的能带结构以及载流子在导带中的分布;通过分析载流子直接带和间接带间的辐射复合以及俄歇复合、位错等引起的非辐射复合的竞争,计算了N型掺杂张应变Ge材料直接带跃迁的内量子效率和光增益等发光性质.结果表明,张应变可有效增强Ge材料直接带隙跃迁发光.在1.5%张应变条件下,N型掺杂Ge的最大内量子效率可以达到74.6%,光增益可以与III-V族材料相比拟.     

亚皮秒脉冲激光辐照硅薄膜热效应的模拟研究

基于Boltzmann方程,采用了Chen J K等人建立的自相关模型,考虑了Si薄膜的热容、热导率、弛豫时间等热力学参量随温度非线性变化的影响.采用有限差分法,数值求解了脉宽为500 fs的激光脉冲辐照2 μm厚硅膜的自相关模型.分析了膜表面载流子浓度、载流子温度、晶格温度等随入射激光功率和脉宽等的变化规律.结果表明：在脉冲辐照初期（t<0.68 ps）,载流子和晶格之间存在着明显的非热平衡性,之后通过相互之间的弛豫碰撞,逐渐达到热平衡,载流子热容是引起载流子温度在早期迅速上升的原因;载流子温度速率方程中单光子吸收、载流子-晶格能量交换和载流子能流变化率对载流子温升影响较大,而多光子吸收、双极能流和带隙能量变化率对载流子温升的影响较小,可以忽略;较高脉冲激光能量（Ф＞0.02 J·cm－2）辐照Si膜,会引起载流子密度方程中的俄歇复合项增大,从而使载流子密度下降率增大,导致载流子温度出现双峰.     

高纯硅中补偿性杂质的光热电离光谱

首先测量了高纯n型硅样品在接近液氦温度区域内随温度变化的光热电离光谱,确定了硅样品的最佳光热电离温度范围. 在该温度范围内,在有本征带隙光照射条件下,测量了样品的高分辨率光热电离光谱,同时观察到了来自主要浅杂质施主磷以及补偿性杂质硼的正信号. 随后,应用外加磁场,对硼的光热电离光谱进行了研究,发现来自硼的光热电离信号,在外加磁场作用下,发生了由正向负信号的转变. 通过对该现象进行分析讨论,排除了该现象是温度效应的可能,指出普遍用来解释补偿性杂质光热电离响应的Darken模型存在不足,而少数载流子快速复合模 关键词： 高纯硅 光热电离光谱 元素半导体中的杂质和缺陷能级 少数载流子快速复合     

PbTe/PbSrTe半导体非对称量子阱中的Rashba效应

窄带隙半导体异质结构的自旋效应最近受到了国际上的很大关注.Ⅳ-Ⅵ族半导体具有各向异性和多能谷的特征,因此可以预期Rashba自旋效应在不同取向的Ⅳ-Ⅵ族半导体量子阱结构中存在显著差异.计算了多个取向的Pb_1-ySr_yTe/PbTe/Pb_1-xSr_xTe非对称量子阱中的Rashba分裂能,结果表明［100］取向的PbTe量子阱的Rashba分裂能在阱宽为5.0nm时 关键词： Ⅳ-Ⅵ族半导体 非对称量子阱 Rashba效应 自旋-轨道耦合分裂     

微纳尺度俄歇电子能谱新技术开发及其应用进展

随着纳米结构材料的广泛应用,新型微纳尺度表征技术成为纳米科学技术发展的重要途径.本文基于局域电子信息全面性的思想,从俄歇电子能谱的原理出发,理论推导出俄歇价电子能谱的简明表述方式,确定俄歇价电子能谱与微观电子结构信息的内在联系和物理意义,建立了俄歇电子能谱探测微区一系列宏观参量的新技术.其中应力测最技术的空间分辨率可优于20 nm,为微纳尺度力学测量的发展提供了重要的方法;非接触性的局域电学性质测量技术,超越了传统电学测量方法的思想框架,实现了无外场驱动的电荷密度分布、电场分布等本征电学性质表征、以及半导体异质结构整个空间区域的能带构造;结构相的测定技术,使纳米微区材料的晶体结构相识别成为可能;半导体微区导电类型测定技术,建续了非接触性电学测量的优点,并且能够灵活地探测分析复杂光电器件结构中不同区域的导电类型分布.通过实际应用于侧向外延GaN不同区域、AlxGa1-xN/GaN超晶格量子阱结构、ZnO纳米颗粒等纳米尺度复杂体系的微区宏观性质探测,获得应力/应变、电荷密度/电场、结构相以及导电类型及其分布等结果,验证了所建立的测量技术的有效性和可靠性.     

纤锌矿BexZn1-xO合金能隙弯曲系数的第一原理研究

采用密度泛函理论框架下的第一性原理平面波超软赝势方法, 对纤锌矿Be_xZn_1-xO合金进行能隙特性、弯曲系数和结构参数的计算. 结果表明: Be_xZn_1-xO合金的能隙和弯曲系数都随Be掺杂组分的增大而增大. 通过修正Be_xZn_1-xO合金的能隙值得知其合金弯曲系数b为6.02 eV, 这与实验值接近. 纤锌矿Be_xZn_1-xO合金的能隙弯曲系数过大主要来源于体积形变和电荷转移的贡献. 文中还分析了Be_xZn_1-xO合金的晶格常数、 平均键长和平均次近邻原子距离与Be组分的关系.     

双波长自由载流子吸收技术测量半导体载流子体寿命和表面复合速率

提出了采用双波长自由载流子吸收技术同时测量半导体材料载流子体寿命和前表面复合速率的方法.通过数值模拟,定性分析了不同载流子体寿命和前表面复合速率对信号的影响,同时对测量参数的可接受范围和不确定度进行计算并与传统频率扫描自由载流子吸收方法测量结果进行比较.结果表明：提出的双波长自由载流子吸收方法可明显减小载流子体寿命和前表面复合速率的测量不确定度,提高参数测量精度;表面杂质和缺陷越多的样品,其前表面复合速率测量不确定度越小.进一步分析表明,此现象与不同波长激光抽运产生的过剩载流子浓度分布不同有关.     

对称型单负交替一维光子晶体的能带结构

构造了(AB)^N(BA)^N对称型两种单负材料交替一维光子晶体,利用传输矩阵法进行数值模拟.结果表明：这种单负交替对称型一维光子晶体具有一种特殊带隙结构,该带隙不敏感于入射角和晶格的无序性.在该带隙内出现了两个隧穿模,该隧穿模不敏感于入射角的改变和晶格的无序性,但能带及带隙内的隧穿模却敏感于晶格标度和周期数的变化;随着入射角的改变,带隙两侧的隧穿模趋于简并.这些特性对在利用此结构光子晶体设计双重超窄带滤波器时,具有一定的参考价值. 关键词： 光子晶体 单负材料 光子带隙     

微纳尺度俄歇电子能谱新技术开发及其应用进展

随着纳米结构材料的广泛应用,新型微纳尺度表征技术成为纳米科学技术发展的重要途径。本文基于局域电子信息全面性的思想,从俄歇电子能谱的原理出发,理论推导出俄歇价电子能谱的简明表述方式,确定俄歇价电子能谱与微观电子结构信息的内在联系和物理意义,建立了俄歇电子能谱探测微区一系列宏观参量的新技术。其中应力测量技术的空间分辨率可优于20nm,为微纳尺度力学测量的发展提供了重要的方法;非接触性的局域电学性质测量技术,超越了传统电学测量方法的思想框架,实现了无外场驱动的电荷密度分布、电场分布等本征电学性质表征、以及半导体异质结构整个空间区域的能带构造;结构相的测定技术,使纳米微区材料的晶体结构相识别成为可能;半导体微区导电类型测定技术,延续了非接触性电学测量的优点,并且能够灵活地探测分析复杂光电器件结构中不同区域的导电类型分布。通过实际应用于侧向外延GaN不同区域、AlxGa1-xN/GaN超晶格量子阱结构、ZnO纳米颗粒等纳米尺度复杂体系的微区宏观性质探测,获得应力/应变、电荷密度/电场、结构相以及导电类型及其分布等结果,验证了所建立的测量技术的有效性和可靠性。     

直接带隙Ge$lt;sub$gt;1-$lt;em$gt;x$lt;/em$gt;$lt;/sub$gt;Sn$lt;sub$gt;$lt;em$gt;x$lt;/em$gt;$lt;/sub$gt;本征载流子浓度研究

通过合金化改性技术, Ge可由间接带隙半导体转变为直接带隙半导体. 改性后的Ge半导体可同时应用于光子器件和电子器件, 极具发展潜力. 基于直接带隙Ge_1-xSn_x半导体合金8带Kronig-Penny模型, 重点研究了其导带有效状态密度、价带有效状态密度及本征载流子浓度, 旨在为直接带隙改性Ge半导体物理的理解及相关器件的研究设计提供有价值的参考. 研究结果表明: 直接带隙Ge_1-xSn_x合金导带有效状态密度随着Sn组分x的增加而明显减小, 价带有效状态密度几乎不随Sn组分变化. 与体Ge半导体相比, 直接带隙Ge_1-xSn_x合金导带有效状态密度、价带有效状态密度分别低两个和一个数量级; 直接带隙Ge_1-xSn_x合金本征载流子浓度随着Sn组分的增加而增加, 比体Ge半导体高一个数量级以上. 关键词： 1-xSn_x')" href="#">Ge_1-xSn_x 直接带隙 本征载流子浓度     

Accurate first-principles detailed-balance determination of auger recombination and impact ionization rates in semiconductors

The technologically important prediction of Auger recombination lifetimes in semiconductors is addressed by means of a fully first-principles formalism, based on precise energy bands and wave functions provided by the full-potential linearized augmented plane wave code. The minority carrier Auger lifetime is determined by two related approaches: (i) a direct evaluation within Fermi's golden rule, and (ii) an indirect evaluation, based on a detailed balance formulation combining Auger recombination and its inverse process, impact ionization, in a unified framework. Lifetimes determined with the direct and indirect methods show excellent consistency between them (i) for n-doped GaAs and (ii) with measured values for GaAs and InGaAs. This indicates the computational formalism as a new sensitive tool for use in materials performance optimization.     

Auger transitions in narrow-gap semiconductors with lax band structure

Auger recombination and ionisation rates are calculated in narrow-gap semiconductor with Lax band structure⁸ such as Pb_1?xSn_xTe, Pb_1?xSn_xSe, Bi_1?xSb_x. Both low-energy (T_e? ε_g) and high-energy (ε_F ? ε_g or Te ? ε) regions are taken into consideration. In the former case we have corrected the results obtained by number of authors^3,4. The latter situation may take place in pinch channel or at the high level of laser exitation. Here we have derived the results except for constant numerical coefficient. We consider the two-particle Auger-process proposed by Emtage³ as well as three-particle ones including additional collision with acoustical phonon, charged impurity or neutral defect. The dependence of Auger transition rates upon the carrier concentration is mainly of the power-type in all variants.     

Sasers: resonant transitions in narrow-gap semiconductors and in exciton system in coupled quantum wells

Two schemes for steady stimulated phonon generation (saser, i.e., phonon laser) are proposed. The first scheme exploits a narrow-gap indirect semiconductor or analogous indirect gap semiconductor heterostructure where the tuning into resonance of one-phonon transition of electron–hole recombination can be carried out by external pressure, magnetic or electric fields. The second scheme uses one-phonon transition between direct and indirect exciton levels in coupled quantum wells. The tuning into the resonance of this transition can be accomplished by engineering of dispersion of indirect exciton by external in-plane magnetic and normal electric fields. In the second scheme the magnitude of phonon wave vector is determined by magnitude of in-plane magnetic field and, therefore, such a saser is tunable. Both schemes are analyzed and estimated numerically.     

Growth and properties of ferromagnetic In1−xMnxSb alloys

We discuss a new narrow-gap ferromagnetic (FM) semiconductor alloy, In_1−xMn_xSb, and its growth by low-temperature molecular-beam epitaxy. The magnetic properties were investigated by direct magnetization measurements, electrical transport, magnetic circular dichroism, and the magneto-optical Kerr effect. These data clearly indicate that In_1−xMn_xSb possesses all the attributes of a system with carrier-mediated FM interactions, including well-defined hysteresis loops, a cusp in the temperature dependence of the resistivity, strong negative magnetoresistance, and a large anomalous Hall effect. The Curie temperatures in samples investigated thus far range up to 8.5 K, which are consistent with a mean-field-theory simulation of the carrier-induced ferromagnetism based on the 8-band effective band-orbital method.     

Lifetime of charge carriers in Hg1-xCdxTe (x=0.20) crystals

We examine the mechanisms for Auger recombination in narrow-gap semiconductors of the Hg_1-xCd_xTe type, connected with collision between two electrons in the E_c band followed by transition of one of them to the E_v1 band and collision between two holes in the E_v1 band followed by transition of one of them to the E_v2 band. In analyzing the contributions from different recombination mechanisms over broad concentration and temperature range, we used the models of P. E. Petersen and B. L. Gel'mont, taking into account the specific characteristics of the band structure of Hg_1-xCd_xTe crystals. We determined the temperature and concentration ranges for n- and p-type semiconductors in which different recombination mechanisms are realized, including a radiative mechanism. We compare the experimental data on charge carrier lifetime with the calculation results using different recombination models in the crystals under study.V. D. Kuznetsov Siberian Physicotechnical Institute at Tomsk State University. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 2, pp. 99–104, February, 1994.     

Nature of the eigenstates in the miniband of random dimer-barrier superlattices

The dc conductance, the universal quantum fluctuations and the resistance distribution are numerically investigated in dimer semiconductor superlattices by means of the transfer matrix formalism. We are interested in the GaAs/Al_x Ga _1 − xAs layers, having identical thickness, where the aluminium concentration x takes, at random, two different values, with the constraint that one of them appears only in pairs, i.e. the random dimer barrier (RDB). These systems exhibit a miniband of extended states, around a critical energy, lying to the typical structure of the dimer cell. The states close to this resonant energy consist of weakly localized states, while in band tails i.e. for negligible conductance, the states are strongly localized. This is evidence of the suppression of localization in the RDB superlattices. The nature of the transition between these two regimes is quantitatively investigated through relevant physical quantities. The model is, hence, clearly and statistically examined.     

拉伸形变下BC3纳米管的能带结构

运用紧束缚能带理论,研究拉伸形变下BC₃纳米管的能带结构. 研究表明:随着拉伸和压缩强度的不断增加,BC₃纳米管的导带能级和价带能级逐渐靠近,最终发生能带交叠. 压缩形变下能带的交叠程度可达05 eV,而拉伸形变下只有02 eV. 对于扶手椅型BC₃纳米管,随着拉伸和压缩的不断增加,BC₃纳米管首先由直接半导体转化为间接半导体,进而发生能带的交叠,表现出金属性. 在无形变时,扶手椅型BC₃纳米 关键词： 3纳米管')" href="#">BC₃纳米管 能隙 拉伸形变 半导体     

Influence of microwave treatment on the electrophysical characteristics of technically important semiconductors and surface-barrier structures

An investigation is made of changes in the electrophysical parameters of narrow-gap (Cd_xHg_1−x Te x=0.22–0.24) and wide-gap (gallium arsenide, indium and gallium phosphides) semiconductor materials and Schottky-barrier diode structures based on these materials, stimulated by microwave electromagnetic radiation. It is shown that the parameters of materials and device structures may be improved by defect gettering. An analysis is made of possible mechanisms for the interaction between microwave radiation and the objects being studied. Zh. Tekh. Fiz. 68, 49–53 (December 1998)     

Electron states in inversion layers on the small-gap semiconductor Hg1−x Cd x Te

Summary The subband structure of the narrow-gap semiconductor Hg_1−x Cd _x Te is investigated theoretically at finite temperature by a modified sixbandk·p model based on the effective-mass approximation. A study of the complete surface energy spectrum is reported. The mobile, bound and resonant states are treated by considering energy states in a large quantum box. The theory is applied to cases with strong interband interaction when the resonant character of the subband states is prominent. The authors of this paper have agreed to not receive the proofs for correction.     

Kinetics of indirect photoluminescence in GaAs/AlxGa1−x As double quantum wells in a random potential with a large amplitude

The kinetics of indirect photoluminescence of GaAs/Al_xGa_1−x As double quantum wells, characterized by a random potential with a large amplitude (the linewidth of the indirect photoluminescence is comparable to the binding energy of an indirect exciton) in magnetic fields B≤12 T at low temperatures T≥1.3 K is investigated. It is found that the indirect-recombination time increases with the magnetic field and decreases with increasing temperature. It is shown that the kinetics of indirect photoluminescence corresponds to single-exciton recombination in the presence of a random potential in the plane of the double quantum wells. The variation of the nonradiative recombination time is discussed in terms of the variation of the transport of indirect excitons to nonradiative recombination centers, and the variation of the radiative recombination time is discussed in terms of the variation of the population of optically active excitonic states and the localization radius of indirect excitons. The photoluminescence kinetics of indirect excitons, which is observed in the studied GaAs/Al_xGa_1−x As double quantum wells for which the random potential has a large amplitude, is qualitatively different from the photoluminescence kinetics of indirect excitons in AlAs/GaAs wells and GaAs/Al_xGa_1−x As double quantum wells with a random potential having a small amplitude. The temporal evolution of the photoluminescence spectra in the direct and indirect regimes is studied. It is shown that the evolution of the photoluminescence spectra corresponds to excitonic recombination in a random potential. Zh. éksp. Teor. Fiz. 115, 1890–1905 (May 1999)