Optical and Short- wavelength Recording Properties of Ag_8In_( 14) Sb_( 55) Te_(23) Phase-change Films

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GeTe 相变薄膜的结构及光学性能研究

相变材料可迅速地实现晶态与非晶态之间的相互转换,在相变存储领域具有重要的应用.本文用脉冲激光沉积(PLD)法在Si衬底上制备了高质量的GeTe相变薄膜,并对不同温度下退火的GeTe薄膜进行了结构和光学反射率的表征.实验结果表明,室温沉积的GeTe薄膜为非晶态结构,薄膜的结晶化温度约为250℃.随着退火温度的增加,(202)衍射峰位逐渐向低角方向移动,(202)面间距逐渐增加,这可能与退火薄膜中存在大的压应力有关.薄膜的光学反射率测试表明我们制备薄膜的晶态和非晶态具有高的反射率对比度.以上结果表明PLD法制备的GeTe薄膜在光学相变存储领域具有较好的应用潜能.     

磁控溅射法制备的高反Ag_5In_5Te_(47)Sb_(33)相变薄膜的光谱性质及短波长静态记录性能

研究了磁控溅射制备的Ａｇ５Ｉｎ５Ｔｅ４７Ｓｂ３３相变薄膜的光谱及短波长静态记录性能。研究结果表明，晶态薄膜反射率较高，并在６００～９００ｎｍ波长范围内，晶态与非晶态的反射率和折射率相差很大。在ＣＤ－Ｅ系统的工作波长７８０ｎｍ处，晶态反射率高达５０％，光学常数为５．３４－１．０ｉ；非晶态反射率为２３％，光学常数为２．５－１．０３ｉ。从这一角度讲，Ａｇ５Ｉｎ５Ｔｅ４７Ｓｂ３３相变薄膜适于做ＣＤ－Ｅ系统的记录介质。另外，采用波长为５１４．４ｎｍ的短波长光学静态记录测试仪对Ａｇ５Ｉｎ５Ｔｅ４７Ｓｂ３３薄膜的记录性能进行了测试，结果表明，这种薄膜短波长记录性能较好，它在较低功率和短脉宽的激光束作用下就可得到较高的反射率对比度。     

Ge2Sb2Te5薄膜光学性能和短波长静态记录特性的研究

利用直流磁控溅射制备了单层Ge₂Sb₂Te₅薄膜,研究了薄膜在400～800 nm区域的反射、透过光谱,计算了它的吸收系数,发现薄膜在400～800 nm波长范围内具有较强的吸收.随着薄膜厚度的增加,相应的禁带宽度Eg也随之增加.对Ge2Sb2Te5薄膜光存储记录特性的研究发现,在514.5 nm波长激光辐照样品时,薄膜具有良好的写入对比度,擦除前后的反射率对比度在6%~18%范围内.对实验结果进行了分析.     

掺Sn的Ge2Sb2Te5相变存储薄膜的光学性质

提高存储密度和存取速率一直是光存储发展的方向。这对目前用于可擦重写存储的相变材料提出了越来越多的要求：它们既要对短波长有足够的响应,同时其相变速度也越快越好。因此,相变材料性能的改进十分重要,掺杂是提高相变材料性能的重要手段之一。用直流溅射法制备了掺杂不同量Sn的Ge2Sb2Te5相变薄膜,由热处理前后薄膜的X射线衍射（XRD）发现：薄膜发生了从非晶态到晶态的相变。研究了薄膜在250—900nm区域的反射光谱和透射光谱。结果表明：适当的Sn掺杂能大大增加热处理前后材料在短波长（300—405nm）的反射率衬比度,可见,通过Sn掺杂改良相变材料的短波长光存储性能是一种有效的途径。     

Evaluation of Thermoelectric Properties of Ag0.366Sb0.558Te

Ternary AgSbTe₂ materials are frequently reported to show a promising thermoelectric performance, due to the intrinsically low lattice thermal conductivity and complex valence band structure. However, stoichiometric AgSbTe₂ is found to be thermodynamically unstable and would partially decompose into Ag₂Te and Sb₂Te₃ during thermal cycling. Instead, Ag_0.366Sb_0.558Te is the composition for stabilizing the single-phase according to the Ag₂Te-Sb₂Te₃ phase diagram, while the thermoelectric transport properties have rarely been reported and are the focus of this work. Sn/Sb substitution is found to effectively increase not only the carrier concentration from ≈5 × 10¹⁹ cm⁻³ to ≈4 × 10²¹ cm⁻³, but also the density-of-states effective mass, leading to an enhanced Seebeck coefficient along with a decreased carrier mobility. Single parabolic band (SPB) model with acoustic phonon scattering enables a good understanding on the charge transport. The increased carrier concentration effectively suppresses the bipolar effect at high temperatures. As a result, a peak zT of ≈1.3 and an average of ≈0.9 are achieved.     

激光致晶态Ag11In12Te26Sb51相变介质光学常数的研究

研究了结晶度对Ag11In12 Te2 6Sb51相变薄膜光学常数的影响。用初始化仪使相变薄膜晶化 ,改变晶化参量得到不同的结晶度 ,当转速固定时 ,随激光功率的增加 ,折射率基本随之减小 ,消光系数先是增大 ,而后减小 ;当激光功率固定时 ,随转速的增大 ,折射率也随之增大 ,消光系数也是先增大后减小。非晶态与晶态间的变换、薄膜微结构的变化 (包括晶型的转变和原子间键合状态的变化 )以及薄膜内残余应力是影响Ag11In12 Te2 6Sb51相变薄膜复数折射率的主要原因。测量了单层膜的透过率和CD RW相变光盘中Ag11In12 Te2 6Sb51薄膜非晶态和晶态的反射率     

基于低维相变薄膜的显示器件光学性质的研究

采用传输矩阵模型研究了基于低维相变薄膜的显示器件的光学特性与器件结构的关系。显示器件的类型有反射型和透射型,器件结构的关键参数包括Ge_2Sb_2Te_5(GST)层的厚度、ITO层的厚度、GST层的晶态与非晶态的变化。结果表明:对于反射型器件,ITO层的厚度对器件的反射光谱影响较大,可以通过改变ITO层的厚度达到改变器件颜色的效果;GST层的厚度为12 nm时,GST的晶态与非晶态的变化使器件有最好的颜色对比度且消耗较低的电功率。对于透射型器件,通过使用超薄的GST薄膜,器件的透明度可以保持很高,器件的透明度在GST的厚度超过几纳米后迅速下降。     

Ge2 Sb2 Te5相变薄膜光学及擦除性能研究

利用蓝绿激光对非晶态Ge2Sb2Te5 相变薄膜进行擦除性能的研究,分别用1000 ns,500 ns,100 ns,60 ns脉宽的蓝绿激光进行实验.结果表明,一定脉宽下,反射率对比度随擦除功率的增加而增大.并且,在1000 ns,500 ns,100 ns,60 ns的激光作用时间范围内,非晶态薄膜均可转变成晶态.对于脉宽为60 ns的蓝绿激光,擦除功率大于4.49 mW以后,薄膜的反射率对比度高于15％,这表明Ge2Sb2Te5相变薄膜在短脉宽、低擦除功率条件下,可具有较高的晶化速度.同时,分析了非晶态和晶态Ge2Sb2Te5相变薄膜的光谱特性,对比研究了780 nm,650 nm,514 nm和405 nm波长处的反射率和反射率对比度,提出了Ge2Sb2Te5相变薄膜用于蓝光光盘的改进方法.     

Ag掺杂p型ZnO薄膜及其同质结的光电性质

采用磁控溅射技术在Si基片上生长了Ag掺杂的ZnO薄膜,XRD测试表明所得薄膜结晶性质良好,未出现Ag的分相。未掺杂和Ag掺杂氧化锌薄膜的低温(10K)光致发光(PL)谱显示:Ag的掺入使得中性施主束缚激子发射(D0X)显著减弱,并且在3.315eV处观测到了与Ag有关的施主-受主对(DAP)发射,受主缺陷的形成归因于掺入的Ag替位Zn。计算得到受主能级离价带顶约110meV。霍尔效应测得电阻率约0.1Ω.cm,迁移率约36cm2/V.s,空穴浓度约1.7×1018cm-3。在此基础上制备了ZnO∶Ag/ZnO的同质结,I-V测试显示了明显的整流特性,且反向漏电流很小。所有结果表明Ag掺杂的氧化锌薄膜已经转化为p型。     

High resolutionMNN auger spectra of Ag,Cd, In,Sb, Te,and I

The strongest lines (M ₅ N _4,5 N _4,5 andM ₄ N _4,5 N _4,5) in theMNN Auger spectra of Ag, Cd, In, Sb, Te, and I have been investigated with high resolution by means of an electrostatic cylindrical spectrometer. The measured spectra have been found to have a fine structure corresponding to the splitting of the final states of the Auger transitionsM ₅ N _4,5 N _4,5 andM ₄ N _4,5 N _4,5. This has not been observed for these elements in spectra measured by the retarding field method. The line profiles are discussed.     

相变光盘介电薄膜ZnS-SiO2 的微结构和光学特性

采用射频磁控溅射法制备了ZnS-SiO₂ 介电薄膜,利用透射电镜和椭偏仪研究了溅射条件对ZnS-SiO₂薄膜微结构和折射率n的影响.研究表明,ZnS-SiO₂薄膜中存在微小晶粒,大小为2～10 nm的ZnS颗粒分布在SiO₂基体中,当溅射功率和溅射气压变化时,ZnS-SiO₂薄膜的微结构和折射率n发生显著变化,微结构的变化是导致折射率n变化的主要原因,通过优化溅射条件可以制备适用于相变光盘的高质量ZnS-SiO₂介电薄膜.     

Electric quadrupole interaction of111Cd in the system Sb1−xMx (M=Ag,Cd,In,Sn), Sb2Te3, Bi2Te3 and In2Te3

We have performed TDPAC-measurements to investigate the static quadrupole interaction of₁₁₁Cd in the classic semimetal Sb. The coupling constant depends on the concentration of small amounts of metal admixtures. The only exception is the system Sb_1–xAg_x. The temperature dependence of the efg in the narrow gap semiconductors Sb₂Te₃ and Bi₂Te₃ is similar to that one in Te. In contrast to these results the efg in the III–VI-semiconductor In₂Te₃ is temperature independent.     

Cluster Assembled Sb Films: Studies On Structure,Surface And Optical Properties

A low energy cluster beam deposition (LECBD) technique has been used to prepare the Sb cluster films on different substrates and are characterized using a variety of probes. Proton induced X-ray emission (PIXE) analysis shows the absence of any foreign trace elemental impurity even at ppm level. Glancing angle X-ray diffraction (GXRD) and transmission electron diffraction (TED) studies reveal the presence of single crystalline feature of Sb with hexagonal symmetry along with Sb-oxides. The transmission electron micrograph (TEM) of the cluster films of thickness 20 Å and 100 Å show size distribution which is more for the 100 Å film compared to that of the 20 Å one. The photoluminescence (PL) studies at 300 K show red shifted peaks along with the one possibly due to HOMO-LUMO transition around 2.4 eV. X-ray photoelectron spectroscopy (XPS) of Sb cluster films show shoulders to the core level peaks of the Sb corresponding to 3d 3/2 and 3d 5/2 which are shifted by 1.0 to 2.0 eV suggesting the formation of Sb-oxide. Raman scattering studies show the shift of A 1g and E g vibrational modes from their bulk value.     

溅射气压对Ge2Sb2Te5薄膜光学常数的影响

实验研究了氩气气压对溅射制备的Ge2 Sb2 Te5 薄膜的光学常数随波长变化的影响 ,结果表明 :随薄膜制备时氩气气压的增加 ,Ge2 Sb2 Te5 薄膜的折射率n先增大后减小 ,而消光系数k先减小后增大。二者都随波长的变化而变化 ,且在长波长范围变化较大 ,短波长范围变化较小 ,解释了溅射气压对Ge2 Sb2 Te5 薄膜的光学常数影响的机理     

Ag掺杂对ZnO薄膜的光电性能影响

采用超声喷雾热分解法在石英衬底上以醋酸锌水溶液为前驱体,以硝酸银水溶液为Ag掺杂源,以高纯O2为载气生长了Ag掺杂ZnO(ZnO∶Ag)薄膜。研究了Ag掺杂ZnO薄膜的表面结构、电学和光学性质。结果表明所得ZnO∶Ag薄膜表面结构良好,扫描电子显微镜(SEM)测试表明薄膜表面光滑平整,结构致密均匀;在室温光致发光(PL)光谱中检测到很强的近带边紫外发光峰;透射光谱中观测到非常陡峭的紫外吸收截止边和较高的可见光区透过率,表明薄膜具有较高的晶体质量与较好的光学特性;霍尔效应测试表明,在550℃下获得了p型导电的ZnO∶Ag薄膜。     

Ag:ZnO/SiO_2复合薄膜的制备与光学性能

采用溶胶-凝胶法在玻璃衬底上制备Ag掺杂于ZnO层的Ag:ZnO/SiO2(AZSO)复合薄膜,采用XRD、SEM、UV-Vis和PL谱等手段对样品的晶体结构、微观形貌、透过率、吸收率及光致发光性能等进行表征,并观察了掺Ag量对复合薄膜光学性能的影响。XRD结果表明:样品经300℃退火处理后出现ZnO及单质Ag衍射峰;由SEM结果可观察到AZSO复合薄膜颗粒分散均匀,表面致密,其断面照片显示了薄膜的双层结构。UV-Vis吸收光谱结果表明:随着复合薄膜中Ag含量的增加,Ag与ZnO之间的电子转移及Ag颗粒的变大促使Ag的特征吸收峰呈现红移和宽化,样品的透过率也随之降低,吸收边向短波长方向移动,禁带宽度减小。PL谱结果表明:由于Ag的掺入减少了ZnO内空穴浓度并对复合薄膜的结构缺陷进行补偿,以及Ag在440nm附近的特征吸收,降低了复合薄膜的发光强度。     

Photoinduced Reorientation Process and Nonlinear Optical Properties of Ag Nanoparticle Doped Azo Polymer Films

Azobenzene polymer films doped with and without Ag nanoparticles are prepared. The photoinduced reorientation process is investigated by using an Nd：YVO4 pump beam at 532 nm and a low semiconductor laser beam at 650 nm. The reorientation rate of azo polymer films is enhanced in the presence of Ag nanoparticles, and the rate of the azo polymer film with Ag concentration of 2.2 μg/ml is larger than that of the azo polymer films with Ag concentrations of 1.1 μg/ml and 4.4 μg/ml. The third-order nonlinear optical properties of the Ag/azo composite film are obtained by the Z-scan technique at a wavelength of 532 nm, and the measured nonlinear refractive index is 9.258×10-9 esu. It is shown that the main mechanisms involved in the large nonlinear optical responses come from the local field enhancement of Ag nanoparticles and the nonlinear effect of the azo polymer matrix.     

Effect of Ag Nanoparticles on Optical Properties of R6G Doped PMMA Films

The composite PMMA films containing Ag nanoparticles and rhodamine 6G are prepared. We investigate the fluorescence properties and nonlinear optical properties of R6G/PMMA films influenced by Ag nanoparticles. The fluorescence enhancement factor is about 3.3. The corresponding nonlinear refractive index is measured to be -2.423 ×10^-8 esu using the Z-scan technique, which is much enhanced compared with the R6G/PMMA film. The results indicate that these enhancements are attributed to surface plasmon resonance of Ag nanoparticles.