Electron ionization of methane: the dissociation of the methane monocation and dication

Time-of-flight mass spectrometry and two-dimensional coincidence techniques have been used to determine, for the first time, the relative precursor-specific partial ionization cross sections following electron-methane collisions. Precursor-specific partial ionization cross sections quantify the contribution of single, double, and higher levels of ionization to the partial ionization cross section for forming a specific ion (e.g. CH(+)) following electron ionization of methane. Cross sections are presented for the formation of H(+), H(2)(+), C(+), CH(+), CH(2)(+), and CH(3)(+), relative to CH(4)(+), at ionizing electron energies from 30 to 200 eV. We can also reduce our dataset to derive the relative partial ionization cross sections for the electron ionization of methane, for comparison with earlier measurements. These relative partial ionization cross sections are in good agreement with recent determinations. However, we find that there is significant disagreement between our partial ionization cross sections and those derived from earlier studies. Inspection of the values of our precursor-specific partial ionization cross sections shows that this disagreement is due to the inefficient collection of energetic fragment ions in the earlier work. Our coincidence experiments also show that the lower energy electronic states of CH(4)(2+) populated by electron double ionization of CH(4) at 55 eV are the same (ground (3)T(1), first excited (1)E(1)) as those populated by 40.8 eV photoionization. The (3)T(1) state dissociating to form CH(3)(+) + H(+) and CH(2)(+) + H(2)(+) and the (1)E(1) to form CH(2)(+) + H(+) and CH(+) + H(+). At this electron energy, we also observe population of the first excited triplet state of CH(4)(2+) ((3)T(2)) which dissociates to both CH(2)(+) + H(+) + H and CH(+) + H(+) + H(2).     

Cross sections and ion kinetic energy analysis for the electron impact ionization of acetylene

Using a Nier-type electron impact ion source in combination with a double focusing two sector field mass spectrometer, partial cross sections for electron impact ionization of acetylene are measured for electron energies up to 1000 eV. Discrimination factors for ions are determined using the deflection field method in combination with a three-dimensional ion trajectory simulation of ions produced in the ion source. Analysis of the ion yield curves obtained by scanning the deflectors allows the assignment of ions with the same mass-to-charge ratio to specific production channels on the basis of their different kinetic energy distributions. This analysis also allows to determine, besides kinetic energy distributions of fragment ions, partial cross sections differential in kinetic energy. Moreover a charge separation reaction, the Coulomb explosion of the doubly charged parent ions C2H2++ into the fragment ions C2H+ and H+, is investigated and its mean kinetic energy release (KER=3.88 eV) is deduced.     

Electron ionization of SiCl4

Relative partial ionization cross sections (PICS) for the formation of fragment ions following electron ionization of SiCl(4), in the electron energy range 30-200 eV, have been determined using time-of-flight mass spectrometry coupled with an ion coincidence technique. By this method, the contributions to the yield of each fragment ion from dissociative single, double, and triple ionization, are distinguished. These yields are quantified in the form of relative precursor-specific PICS, which are reported here for the first time for SiCl(4). For the formation of singly charged ionic fragments, the low-energy maxima appearing in the PICS curves are due to contributions from single ionization involving predominantly indirect ionization processes, while contributions to the yields of these ions at higher electron energies are often dominated by dissociative double ionization. Our data, in the reduced form of relative PICS, are shown to be in good agreement with a previous determination of the PICS of SiCl(4). Only for the formation of doubly charged fragment ions are the current relative PICS values lower than those measured in a previous study, although both datasets agree within combined error limits. The relative PICS data presented here include the first quantitative measurements of the formation of Cl(2) (+) fragment ions and of the formation of ion pairs via dissociative double ionization. The peaks appearing in the 2D ion coincidence data are analyzed to provide further information concerning the mechanism and energetics of the charge-separating dissociations of SiCl(4) (2+). The lowest energy dicationic precursor state, leading to SiCl(3) (+) + Cl(+) formation, lies 27.4 ± 0.3 eV above the ground state of SiCl(4) and is in close agreement with a calculated value of the adiabatic double ionization energy (27.3 eV).     

A vacuum ultraviolet photoionization mass spectrometric study of acetone

The photoionization and dissociative photoionization of acetone have been studied at the photon energy range of 8-20 eV. Photoionization efficiency spectra for ions CH3COCH3+, CH3+, C2H3+, C3H3+, C3H5+, CH(2-)CO+, CH3CO+, C3H4O+, and CH3COCH2+ have been measured. In addition, the energetics of the dissociative photoionization has been examined by ab initio Gaussian-3 (G3) calculations. The computational results are useful in establishing the dissociation channels near the ionization thresholds. With the help of G3 results, the dissociation channels for the formation of the fragment ions CH3CO+, CH2CO+, CH3+, C3H3+, and CH3COCH2+ have been established. The G3 results are in fair to excellent agreement with the experimental data.     

Absolute partial cross sections and kinetic energy analysis for the electron impact ionization of ethylene

We present absolute partial electron impact ionization cross sections for ethylene in the electron energy range between threshold and 1000 eV measured with a two sector field double focusing mass spectrometer. Ion kinetic energy distribution functions have been measured at all electron energies by applying a deflection field method. Multiplication of the measured relative cross sections by the appropriately determined discrimination factors lead to accurate relative partial cross sections. Normalization of the sum of the relative partial cross sections to an absolute total cross section gives absolute partial cross section values. The initial kinetic energy distributions of several fragment ions show the presence of two or more contributions that exhibit different electron energy dependencies. Differential cross sections with respect to the initial kinetic energy of the ions are provided and are related to specific ion production channels. The electron threshold energies for the direct and numerous other dissociative ionization channels are determined by quantum chemical calculation and these allow the determination of the total kinetic energy release and the electron energy loss for the most prominent dissociative ionization channels.     

Electron-impact ionization of CCl4 and CCl2F2

Absolute partial and total cross sections for electron-impact ionization of CCl4 and CCl2F2 are reported for electron energies from threshold to 1000 eV. The product ions are mass analyzed using a time-of-flight mass spectrometer and detected with a position-sensitive detector whose output demonstrates that all product ion species are collected with equal efficiency irrespective of their initial kinetic energies. Data are presented for production of CCl3(+), CCl2(+), CCl+, C+, Cl2(+), and CCl3(2+) from CCl4; and for production of CCl(2)F+, CClF2(+), CClF(+), (CCl+ + CF2(+)), Cl+, CF+, F+, and C+ from CCl2F2. Data are also reported for formation of (CCl2(+),Cl+) and (CCl+, Cl+) ion pairs from CCl4. The total cross section for each target is obtained as the sum of the partial cross sections. The overall uncertainty in the absolute cross sections for most of the singly charged ions is +/- 5-7 %. The present partial cross sections for lighter fragment ions are found to be considerably greater than had been previously reported but the most recent total cross section measurements agree well with those reported here. Neither the binary-encounter-Bethe theory nor the Deutsch-Mark theory reproduces the experimental cross sections correctly for both targets.     

Differential, partial and total electron impact ionization cross sections for SF(6)

Single and double differential ionization cross sections for the production of ions resulting from dissociative, single and double ionization of SF(6) by electron impact have been calculated using a semiempirical formulation based on the Jain-Khare approach. In addition, triple differential cross sections have been obtained for some of the doubly charged fragment ions at an incident electron energy of 100, 150, and 200 eV, respectively, and a fixed scattering angle of 30 degrees. As no previous data seem to exist for differential cross sections we have derived from these differential cross sections corresponding partial and total ionization cross sections from threshold up to 900 eV and compared those with the available theoretical and experimental data.     

Electron-impact ionization of silicon tetrachloride (SiCl4)

We measured absolute partial cross sections for the formation of various singly charged and doubly charged positive ions produced by electron impact on silicon tetrachloride (SiCl4) using two different experimental techniques, a time-of-flight mass spectrometer (TOF-MS) and a fast-neutral-beam apparatus. The energy range covered was from the threshold to 900 eV in the TOF-MS and to 200 eV in the fast-neutral-beam apparatus. The results obtained by the two different experimental techniques were found to agree very well (better than their combined margins of error). The SiCl3(+) fragment ion has the largest partial ionization cross section with a maximum value of slightly above 6x10(-20) m2 at about 100 eV. The cross sections for the formation of SiCl4(+), SiCl+, and Cl+ have maximum values around 4x10(-20) m2. Some of the cross-section curves exhibit an unusual energy dependence with a pronounced low-energy maximum at an energy around 30 eV followed by a broad second maximum at around 100 eV. This is similar to what has been observed by us earlier for another Cl-containing molecule, TiCl4 [R. Basner, M. Schmidt, V. Tamovsky, H. Deutsch, and K. Becker, Thin Solid Films 374 291 (2000)]. The maximum cross-section values for the formation of the doubly charged ions, with the exception of SiCl3(++), are 0.05x10(-20) m2 or less. The experimentally determined total single ionization cross section of SiCl4 is compared with the results of semiempirical calculations.     

Evidence of site-specific fragmentation on thioacetic acid, CH3C(O)SH, irradiated with synchrotron radiation around the S 2p and O 1s regions

Site-specific fragmentations following S 2p and O 1s photoexcitation of thioacetic acid, CH3C(O)SH, have been studied by means of synchrotron radiation. Total ion yield (TIY) spectra were measured and multicoincidence techniques, which include photoelectron-photoion coincidence (PEPICO) and photoelectron-photoion-photoion coincidence (PEPIPICO) time-of-flight mass spectrometry, were applied. The equivalent-core approximation was employed in order to estimate ionization transition values, and the observed peaks were tentatively assigned. A site-specific fragmentation is moderately observed by comparing the mass spectra collected at resonant energies around the inner and shallow inner shell S 2p and O 1s ionization edges. Beside H+ ion, the most abundant ions observed at the S 2p edge excitation were CH3CO+, SH+, S+, and CH3+. At the O 1s region the large CH3CO+ fragment was depressed, and small CHx+ (x = 0, 1, 2, 3), S+, and SH+ fragments were dominant. The dissociation dynamic for the main ion-pair production has been discussed. Two- and three-body dissociation channels have been observed in the PEPIPICO spectra, and the dissociation mechanisms were proposed.     

Experimental and quantum-chemical studies on photoionization and dissociative photoionization of CH2Br2

The dissociative photoionization of CH2Br2 in a region approximately 10-24 eV was investigated with photoionization mass spectroscopy using a synchrotron radiation source. An adiabatic ionization energy of 10.25 eV determined for CH2Br2 agrees satisfactorily with predictions of 10.26 and 10.25 eV with G2 and G3 methods, respectively. Observed major fragment ions CH2Br+, CHBr+, and CBr+ show appearance energies at 11.22, 12.59, and 15.42 eV, respectively; minor fragment ions CHBr2+, Br+, and CH2+ appear at 12.64, 15.31, and 16.80 eV, respectively. Energies for formation of observed fragment ions and their neutral counterparts upon ionization of CH2Br2 are computed with G2 and G3 methods. Dissociative photoionization channels associated with six observed fragment ions are proposed based on comparison of determined appearance energies and predicted energies. An upper limit of DeltaH0f,298(CHBr+) < or = 300.7 +/- 1.5 kcal mol(-1) is derived experimentally; the adiabatic ionization energy of CHBr is thus derived to be < or = 9.17 +/- 0.23 eV. Literature values for DeltaH0f,298(CBr+) = 362.5 kcal mol(-1) and ionization energy of 10.43 eV for CBr are revised to be less than 332 kcal mol(-1) and 9.11 eV, respectively. Also based on a new experimental ionization energy, DeltaH0f,298(CH2Br2+) is revised to be 236.4 +/- 1.5 kcal mol(-1).     

10-100 eV Ar+ ion induced damage to D-ribose and 2-deoxy-D-ribose molecules in condensed phase

We report that 10-100 eV Ar+ ion irradiation induces severe damage to the biologically relevant sugar molecules D-ribose and 2-deoxy-D-ribose in the condensed phase on a polycrystalline Pt substrate. Ar+ ions with kinetic energies down to 15 eV induce effective decomposition of both sugar molecules, leading to the desorption of abundant cation and anion fragments, including CH3+, C2H3+, C3H3+, H3O+, CHO+, CH3O+, C2H3O+, H-, O-, and OH-, etc. Use of isotopically labelled molecules (5- 13C D-ribose and 1-D D-ribose) reveals the site specificity for some of the fragment origins, and thus the nature of the chemical bond breaking. It is found that all of the chemical bonds in both molecules are vulnerable to ion impact at energies down to 15 eV, particularly both the endo- and exocyclic C-O bonds. In addition to molecular fragmentation, several chemical reactions are also observed. A small amount of O-/O fragments abstract hydrogen to form OH-. It is found that the formation of the H3O+ ion is related to the hydroxyl groups of the sugar molecules, and is associated with additional hydrogen loss from the parent or adjacent molecules via hydrogen abstraction or proton transfer. The formation of several other cation fragments also requires hydrogen abstraction from its parent or an adjacent molecule. These fragmentations and reactions are likely to occur in a real biomedium during ionizing radiation treatment of tumors and thus bear significant radiobiological relevance.     

Absolute partial and total electron impact ionization cross sections for C3H8 from threshold up to 950 eV

Electron impact ionization of propane (C₃H₈) was studied using the ion beam deflection technique and a double focussing mass spectrometer in conjunction with a recently developed correction procedure that accounts for discrimination due to the initial kinetic energy of fragment ions. The relative corrected partial ionization cross sections for the production of C₃H ₈ ⁺ , C₃H ₇ ⁺ , C₃H ₆ ⁺ , C₃H ₅ ⁺ , C₃H ₄ ⁺ , C₃H ₃ ⁺ , C₃H ₂ ⁺ , C₃H⁺, C ₃ ⁺ ; C₂H ₅ ⁺ , C₂H ₄ ⁺ , C₂H ₃ ⁺ , C₂H ₂ ⁺ , C₂H⁺, C ₂ ⁺ ; CH ₃ ⁺ , CH ₂ ⁺ , CH⁺, C⁺; C₃H ₅ ²⁺ , C₃H ₄ ²⁺ , C₃H ₃ ²⁺ and C₃H ₂ ²⁺ were determined from threshold up to 950 eV. Absolute partial ionization cross sections were obtained by charge weighted summing of all the observed partial ionization cross sections and by normalizing to a recent accurate determination of the total ionization cross section at 100 eV by Djuric et al. 1991. The absolute total ionization cross section curve obtained is in excellent agreement in shape and magnitude with the low energy data (<200 ev)=" of=" djuric=" et=" al.=" 1991=" and=" the=" high=" energy=" data=" points=" of=" schram=" et=" al.=">     

Dissociation of energy-selected c-C2H4S+ in a region 10.6-11.8 eV: threshold photoelectron-photoion coincidence experiments and quantum-chemical calculations

Dissociation of energy-selected c-C2H4S+ was investigated in a region of 10.6-11.8 eV with a threshold photoelectron-photoion coincidence technique and a synchrotron as a source of vacuum ultraviolet radiation. Branching ratios and average releases of kinetic energy in channels of formation of c-C2H4S+, CH3CS+, and HCS+ were obtained from well-resolved time-of-flight peaks in coincidence mass spectra. Measured average releases of kinetic energy for channel CH3CS+ + H of least energy are substantial and much greater than calculated with quasiequilibrium theory; in contrast, small releases of kinetic energy near the appearance onset for channel HCS+ + CH3 agree satisfactorily with statistical calculations. Calculations of molecular electronic structures and energetics of c-C2H4S+ and C2H3S+ isomers and various fragments and transition states were also performed with Gaussian 3 method to establish dissociation mechanisms. A predicted dissociation energy of 11.05 eV for c-C2H4S --> HCS+ + CH3 agrees with a linearly extrapolated threshold at 10.99+/-0.04 eV and a predicted dissociation mechanism that c-C2H4S+ isomerizes to CH3CHS+ before dissociating to HCS+ + CH3 supports the experimental results. The large releases of kinetic energy for channel CH3CS+ + H might result from a dissociation mechanism according to which c-C2H4S+ isomerizes to a local minimum CH3CSH+ and then dissociates through a transition state to form CH3CS+ + H.     

二乙基锌的同步辐射真空紫外光电离光解离

利用同步辐射光源和反射式飞行时间质谱, 在超声冷却条件下对二乙基锌(ZnC4H10)进行真空紫外(VUV, 能量范围为8-22 eV)光电离光解离研究. 实验获得ZnC4H10的光电离质谱图; 通过测量各碎片离子的光电离效率(PIE)曲线, 获得ZnC4H10的电离势(IP=8.20±0.05 eV)及其碎片离子(ZnC2H5+、ZnH+、Zn+、C2H5+、C2H3+等)的出现势. 根据实验结果, 并结合相关文献所给的热力学数据, 推导出这些主要碎片离子的生成焓, 并分析它们可能的解离通道和主要离子的分支比. 结果表明, 其主要解离通道是母体离子发生Zn—C 键的断裂形成ZnC2H5+和C2H5+离子, ZnC2H5+离子再进一步解离形成Zn+离子, 并且含锌碎片离子的丰度占75%以上.     

Guided-ion beam and theoretical study of the potential energy surface for activation of methane by W+

A guided-ion beam tandem mass spectrometer is used to study the reactions, W(+) + CH(4) (CD(4)) and [W,C,2H](+) + H(2) (D(2)), to probe the [W,C,4H](+) potential energy surface. The reaction W(+) + CH(4) produces [W,C,2H](+) in the only low-energy process. The analogous reaction in the CD(4) system exhibits a cross section with strong differences at the lowest energies caused by zero-point energy differences, demonstrating that this reaction is slightly exothermic for CH(4) and slightly endothermic for CD(4). The [W,C,2H](+) product ion reacts further at thermal energies with CH(4) to produce W(CH(2))(x)(+) (x = 2-4). At higher energies, the W(+) + CH(4) reaction forms WH(+) as the dominant ionic product with smaller amounts of WCH(3)(+), WCH(+), and WC(+) also formed. The energy dependent cross sections for endothermic formation of the various products are analyzed and allow the determination of D(0)(W(+)-CH(3)) approximately 2.31 +/- 0.10 eV, D(0)(W(+)-CH(2)) = 4.74 +/- 0.03 eV, D(0)(W(+)-CH) = 6.01 +/- 0.28 eV, and D(0)(W(+)-C) = 4.96 +/- 0.22 eV. We also examine the reverse reaction, [W,C,2H](+) + H(2) (D(2)) --> W(+) + CH(4) (CH(2)D(2)). Combining the cross sections for the forward and reverse processes yields an equilibrium constant from which D(0)(W(+)-CH(2)) = 4.72 +/- 0.04 eV is derived. Theoretical calculations performed at the B3LYP/HW+/6-311++G(3df,3p) level yield thermochemistry in reasonable agreement with experiment. These calculations help identify the structures and electronic states of the species involved and characterize the potential energy surface for the [W,C,4H](+) system.     

243～263nm CH3COCH3 的多光子电离研究

在243～263 nm紫外光波段通过质量选择光电离激发谱研究了丙酮（CH3COCH3）的光化学反应通道。分析母体离子CH3COCH3+和碎片离子CH3CO+ 、 CH3+的光电离激发谱和质谱峰宽可以知道: 此光波段丙酮分子的光化学反应主要包括了丙酮分子经由(S1,T1)中间态产生母体离子的（1+1）双光子电离通道,母体离子进一步解离产生碎片离子CH3+的“光电离-光解离”通道和丙酮分子经由(S1,T1)中间态解离成中性自由基碎片CH3CO后再进一步被双光子电离的“光解离-光电离”通道。由母体离子光电离激发谱双光子阈值波长（255.67 nm）给出的丙酮电离势（IP）为（9.696±0.004）eV。     

Threshold photoelectron photoion coincidence spectroscopy and selected ion flow tube cation-molecule reaction studies of cyclic-C4F8

Using tunable vacuum-UV radiation from a synchrotron, the threshold photoelectron and threshold photoelectron photoion coincidence (TPEPICO) spectra of cyclic-C4F8 in the range 11-25 eV have been recorded. The parent ion is observed very weakly at threshold, 11.60 eV, and is most likely to have cyclic geometry. Ion yield curves and branching ratios have been determined for five fragments. Above threshold, the first ion observed is C3F5+, at slightly higher energy C2F4+, then successively CF+, CF2+ and CF3+ are formed. The dominant ions are C3F5+ and C2F4+, with the data suggesting the presence of a barrier in the exit channel to production of C3F5+ whilst no barrier to production of C2F4+. In complementary experiments, the product branching ratios and rate coefficients have been measured in a selected ion flow tube (SIFT) at 298 K for the bimolecular reactions of cyclic-C4F8 with a large number of atomic and small molecular cations. Below the energy where charge transfer becomes energetically allowed, only one of the ions, CF2+, reacts. Above this energy, all but one of the remaining ions react. Experimental rate coefficients are consistently greater than the collisional values calculated from modified average dipole orientation theory. The inclusion of an additional ion-quadrupole interaction has allowed better agreement to be achieved. With the exception of N+, a comparison of the fragment ion branching ratios from the TPEPICO and SIFT data suggest that long-range charge transfer is the dominate mechanism for reactions of ions with recombination energy between 12.9 and 15.8 eV. For all other ions, either short-range charge transfer or a chemical reaction, involving cleavage and making of new bond(s), is the dominant mechanism.     

Determining the partial photoionization cross-sections of ethyl radicals

Using a crossed laser-molecular beam scattering apparatus, these experiments photodissociate ethyl chloride at 193 nm and detect the Cl and ethyl products, resolved by their center-of-mass recoil velocities, with vacuum ultraviolet photoionization. The data determine the relative partial cross-sections for the photoionization of ethyl radicals to form C2H5+, C2H4+, and C2H3+ at 12.1 and 13.8 eV. The data also determine the internal energy distribution of the ethyl radical prior to photoionization, so we can assess the internal energy dependence of the photoionization cross-sections. The results show that the C2H4++H and C2H3++H2 dissociative photoionization cross-sections strongly depend on the photoionization energy. Calibrating the ethyl radical partial photoionization cross-sections relative to the bandwidth-averaged photoionization cross-section of Cl atoms near 13.8 eV allows us to use these data in conjunction with literature estimates of the Cl atom photoionization cross-sections to put the present bandwidth-averaged cross-sections on an absolute scale. The resulting bandwidth-averaged cross-section for the photoionization of ethyl radicals to C2H5+ near 13.8 eV is 8+/-2 Mb. Comparison of our 12.1 eV data with high-resolution ethyl radical photoionization spectra allows us to roughly put the high-resolution spectrum on the same absolute scale. Thus, one obtains the photoionization cross-section of ethyl radicals to C2H5+ from threshold to 12.1 eV. The data show that the onset of the C2H4++H dissociative photoionization channel is above 12.1 eV; this result offers a simple way to determine whether the signal observed in photoionization experiments on complex mixtures is due to ethyl radicals. We discuss an application of the results for resolving the product branching in the O+allyl bimolecular reaction.     

The anomalous shape of the cross section for the formation of SF3+ fragment ions produced by electron impact on SF6 revisited

The partial ionization cross section for the formation of SF(3) (+) fragment ions following electron impact on SF(6) is known to have a pronounced structure in the cross section curve slightly above 40 eV. We used the mass-analyzed ion kinetic energy (MIKE) scan technique to demonstrate the presence of a channel contributing to the SF(3) (+) partial ionization cross section that we attribute to the Coulomb explosion of doubly charged metastable SF(4) (2+) ions into two singly charged ions SF(3) (+) and F(+), with a threshold energy of about 45.5 eV. Thus the observed unusual shape of the SF(3) (+) partial ionization cross section is the result of two contributions, (i) the direct formation of SF(3) (+) fragment ions via dissociative ionization of SF(6) with a threshold energy of 22 eV and (ii) the Coulomb explosion of metastable SF(4) (2+) ions with a threshold energy of about 45.5 eV. A detailed analysis of the MIKE spectrum reveals an average kinetic energy release of about 5 eV in the Coulomb explosion of the SF(4) (2+) ions with evidence of a second channel corresponding to an average kinetic energy release of about 1.1 eV.     

Dissociative double photoionization of benzene molecules in the 26-33 eV energy range

A time-of-flight mass spectrometer with a position sensitive ion detector was used to study the dissociative double ionization of benzene by UV synchrotron radiation. The threshold energy for the main dissociative processes, leading to CH(3)(+) + C(5)H(3)(+), C(2)H(3)(+) + C(4)H(3)(+) and C(2)H(2)(+) + C(4)H(4)(+) ion pairs were characterized by exploiting a photoelectron-photoion-photoion-coincidence technique, giving 27.8 ± 0.1, 29.5 ± 0.1, and 30.2 ± 0.1 eV, respectively. The first reaction also proceeds via the formation of a metastable C(6)H(6)(2+) dication. The translational kinetic energy of the ionic products was evaluated by measuring the position of ions arriving to the detector. Theoretical calculations of the energy and structure of dissociation product ions were performed to provide further information on the dynamics of the charge separation reactions following the photoionization event.