Determination of the disorder profile in an ion‐implanted silicon carbide single crystal by Raman spectroscopy

Silicon carbide is an interesting material for GEN IV fission reactor projects because of its excellent properties. However, these properties will be altered under extreme conditions such as irradiation because of accumulation of damage. Mechanisms playing a role in defect formation require further studies in the case of high energy heavy ion irradiations. In this work a silicon carbide single crystal slice has been implanted with 20 MeV Au ions and probed by using Raman spectrometry. The resulting Raman spectra recorded as a function of depth clearly show a damaged zone, in which the width is in agreement with the projected range of the incident ions (R_p) calculated by using SRIM code. In this area, three damaged zones have been brought to light because of the high spatial resolution of the Raman spectrometry technique. The existence of these zones is discussed with regard to the different energy loss regimes of the implanted ions such as the electronic and nuclear ones. Copyright © 2012 John Wiley & Sons, Ltd.     

Structural and optical properties of a NaCl single crystal doped with CuO nanocrystals

A cupric oxide (CuO) nanocrystal-doped NaCl single crystal and a pure NaCl single crystal are grown by using the Czochralski (Cz) method. A number of techniques, including X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray (EDX) analysis, Fourier transform infrared (FT-IR) spectroscopy, Raman spectroscopy, optical absorption in the UV-visible range, and photoluminescence (PL) spectroscopy are used to characterize the obtained NaCl and NaCl:CuO crystals. It is observed that the average radius of CuO crystallites in NaCl:CuO crystal is about 29.87 nm, as derived from the XRD data analysis. Moreover, FT-IR and Raman spectroscopy results confirm the existence of the monoclinic CuO phase in NaCl crystal. UV-visible absorption measurements indicate that the band gap of the NaCl:CuO crystal is 434 nm (2.85 eV), and it shows a significant amount of blue-shift (△Eg = 1 eV ) in the band gap energy of CuO, which is due to the quantum confinement effect exerted by the CuO nanocrystals. The PL spectrum of the NaCl:CuO shows a broad emission band centred at around 438 nm, which is consistent with the absorption measurement.     

Gold nanoparticle-coated silicon cone array for surface-enhanced Raman spectroscopy

ABSTRACT

We demonstrate a silicon cone array substrate coated with gold nanoparticles and which was highly sensitive, homogeneous, and provided a large area for surface-enhanced Raman spectroscopy (SERS). A deep reactive ion-etching process was used to fabricate the high-density silicon cone array, and gold nanoparticles were formed on the silicon cone surface by magnetron sputtering. The substrate was tested with 10^?6 M rhodamine 6 G solution. Enhancement of the substrate was about 60-fold greater than that of flat substrate. Moreover, SERS signals obtained from 24 random areas on the substrate showed good homogeneity with an average standard deviation of 3.9%.     

激光诱导多孔硅晶格畸变的Raman光谱和光致发光谱研究

研究了掺钛水热法制备多孔硅的Raman光谱和光致发光谱.实验发现,当激光功率较低时,多孔硅的Raman光谱在略低于520cm^-1附近表现为一锐的单峰,和晶体硅的Raman光谱类似.随激光功率增大,该单峰向低波数移动,Raman和光致发光峰的强度与激光强度的一次方成正比.当激光功率增大到一定值时,该单峰分裂成两个Raman峰,光致发光谱的强度突然增大,与激光强度之间不再满足一次方的关系,位于低波数一侧的Raman峰随激光功率增大进一步向低波数移动.多孔硅Raman光谱随激光功率的变化是关键词：多孔硅Raman光谱光致发光     

Improving the material quality of silicon ingots by aluminum gettering during crystal growth

We present a method for the purification of silicon ingots during the crystallization process that reduces significantly the width of the low charge carrier lifetime region at the ingot top. The back‐diffusion of impurities from the ingot top is suppressed by adding a small amount of pure aluminum into the silicon melt right at the end of the solidification. We study the aluminum gettering effect by instrumental neutron activation analysis (INAA) and Fe_i imaging. Furthermore, we present a model for aluminum gettering of Fe in the silicon ingot that is in agreement with literature data for aluminum gettering at lower temperature. The distribution of iron in the ingots with and without aluminum is fairly well predicted by a combination of this model with a model for Fe contamination from the crucible system. A simulation with varying Al content exhibits further potential for an increased yield of silicon wafers with high charge carrier lifetime. (© 2016 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim)     

An application of Raman spectroscopy on the measurement of residual stress in porous silicon

The porous silicon film, at micron level, and the bulk silicon substrate is a basic structure in MEMS components. The residual stress, due to the lattice mismatch between the film and the substrate, exists on the interface and may cause cracking and damaging on the component. Micro-Raman spectroscopy is an optical measurement method that was rapidly applied into the fields of chemistry, physics, material science and mechanics. In this paper, the method is introduced and applied to the study of the stress problems in porous silicon as follows. (1) In the electrochemical etching technique for porous silicon preparation, the distribution of the tensile residual stress along the transitional region between etched and un-etched area is experimentally studied and the result reveals the stress is continuous across the region. In the etched region it reaches GPa level, and in the transition region the gradient of the stress is high. (2) In chemical etching preparation of porous silicon, the residual stress rises up seriously in the cracked area, up to 0.92 GPa. With the porosity increasing, the tensile stress on the porous silicon film increases accordingly. The appearance of the porous silicon film surface is also given by metalloscope and atomic force microscope. The structure of the micro-pores is expected to have a close relation with the distribution of the residual stress.     

光子相关光谱技术及其应用

讨论了光子相关光谱（PCS）技术的原理和测量过程，介绍了光子相关光谱方法在生物工程、药物学以及微生物领域的应用。     

Pseudo nanocrystal silicon induced .luminescence enhancement in a-Si/SiO2 multilayers

Enhanced photoluminescence （PL） at room temperature from thermally annealed a-Si：H/SiO2 multilayers is observed through the step-by-step thermal post-treatment. The correlation between the PL and the crystallization process is studied using temperature-dependent PL, Raman, cross section high-resolution transmission electron microscopy （XHRTEM） and x-ray diffraction （XRD） techniques. An intensified PL band around 820 nm is discovered from the sample annealed near the crystallization onset temperature, which is composed of two peaks centred at 773 nm and 863 nm, respectively. It is found that the PL band centred at 863 nm is related to the pseudo nanocrystal （p-nc-Si） silicon, and the PL band centred at 773 nm is attributed to Si = O bonds stabilized in the p-nc-Si surface.     

表面增强拉曼光谱生物成像技术及其应用

基于表面增强拉曼光谱的成像分析方法具有频带窄,水溶液背景弱,稳定性好,高特异性等优势已成为生物成像领域的优良选择。拉曼成像技术拓展了拉曼光谱的应用范围,使其不再只是检测单点化学成分的手段,而进一步用于对评价区域内化学物质成分、分布及变化进行整体统计和描述。本文探讨了表面增强拉曼散射的原理及增强机制,介绍了基于表面增强拉曼光谱的拉曼成像技术,并对其在无标记成像及带标记成像中的细胞成像、活体成像,特别是其在生物医学方面的应用进行了详细论述,最后讨论了表面增强拉曼光谱生物成像技术存在的问题,展望了该项技术的研究和应用前景。     

Near-infrared Raman spectroscopy using hollow-core photonic bandgap fibers

We report a NIR Raman spectroscopy system incorporating hollow-core photonic bandgap fibers (HC-PBFs) in both the excitation and collection paths. Raman excitation was achieved at NIR laser wavelength of 785 nm. We demonstrate that using HC-PBFs, Raman spectroscopy can be performed without the use of an additional longpass filter on the collection side. A narrow bandpass filter on the excitation side is also not required. These results provide a framework where HC-PBF based Raman probes can be developed and used in space restricted biomedical and sensing applications.     

Surface enhanced Raman spectroscopy of aromatic compounds on silver nanoclusters

Surface enhanced Raman spectroscopy (SERS) has been used to characterize multilayers of three different aromatic compounds in the proximity of silver nanoclusters. SERS of mercapto benzoic acid (MBA), which adsorbs onto the silver nanoclusters through the sulfur moiety, exhibits frequency shifts in comparison to the Raman spectrum of crystalline MBA. Conversely, benzoic acid and benzophenone that adsorb through the oxygen species lack these frequency shifts, and show only a typical SERS enhancement. We employed X-ray photoelectron spectroscopy (XPS), to probe the nature of the binding between the silver and the three different aromatic compounds. Thereafter, we assigned the major Raman peaks of all three molecules to specific molecular vibrations. Overall, this enables us to determine the origin of the observed shifts in the SERS spectrum of MBA and similar molecules.     

硅波导受激喇曼散射放大信号光的数值模拟

提出了用连续泵浦光在硅波导中的受激喇曼散射对信号光进行放大的方法.建立了信号光和泵浦光在硅波导中传输的耦合方程,得到了计算信号光增益的理论模型.利用数值模拟结果,对泵浦功率沿波导的分布,信号光在不同波导长度以及输入功率情况下的增益等进行了分析和讨论.结果表明,适当增加波导长度和泵浦光功率可以得到较高喇曼增益的结论.     

硅中浅杂质的激光感应光电导谱

首次采用光子能量小于硅中浅受主杂质电离能的可调谐远红外激光器作为激发源,获得了硅中浅受主杂质的光电导谱.可调谐半导体远红外激光器的调谐范围为380～500cm~(-1),光子流密度约10~(18)/cm~2·sec,用双光子跃迁对光电导谱进行了解释.对于Si:Al样品,光电导谱中的双峰分别相应于2P~1和2P~2中间态的双光子共振跃迁.也观察到了双光子透明的反共振现象.     

Photo-modification and synthesis of semiconductor nanocrystals

Both photo-oxidation and photosynthesis manifest a strong interaction between nanoparticles and photons due to the large surface area-to-volume ratio. The final sizes of the semiconductor nanocrystals are determined by the photon energy during these phenomena. The photosynthesis is demonstrated in a Si-rich oxide and is similar to thermal synthesis, which involves the decomposition of SiO_x into Si and SiO₂, that is well known and often employed to form Si or Ge nanocrystals embedded in SiO₂ by annealing SiO_x at high temperature. However, photosynthesis is much faster, and allows the low-temperature growth of Si nanocrystals and is found to be pronounced in the SiO nanopowder, which is made by thermal CVD using SiH₄ and O₂. The minimum laser power required for the photosynthesis in the SiO nanopowder is much lower than in the Si-rich oxide formed by the co-sputtering of Si and SiO₂. This is attributed to the weak bond strength of Si-Si and Si-O in the SiO nanopowder. Photosynthesis, which can control the size and position of Si nanocrystals, is a novel nanofabrication technique making the best use of the strong interaction between photons and nanoparticles.     

Vibrational spectroscopy characterization of magnetron sputtered silicon oxide and silicon oxynitride films

Vibrational (infrared and Raman) spectroscopy has been used to characterize SiO_xN_y and SiO_x films prepared by magnetron sputtering on steel and silicon substrates. Interference bands in the infrared reflectivity measurements provided the film thickness and the dielectric function of the films. Vibrational modes bands were obtained both from infrared and Raman spectra providing useful information on the bonding structure and the microstructure (formation of nano-voids in some coatings) for these amorphous (or nanocrystalline) coatings. X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM) analysis have also been carried out to determine the composition and texture of the films, and to correlate these data with the vibrational spectroscopy studies. The angular dependence of the reflectivity spectra provides the dispersion of vibrational and interference polaritons modes, what allows to separate these two types of bands especially in the frequency regions where overlaps/resonances occurred. Finally the attenuated total reflection Fourier transform infrared measurements have been also carried out demonstrating the feasibility and high sensitivity of the technique. Comparison of the spectra of the SiO_xN_y films prepared in various conditions demonstrates how films can be prepared from pure silicon oxide to silicon oxynitride with reduced oxygen content.     

基于硅波导的喇曼光放大器

在硅波导上添加反向偏压的PIN结构,当波导产生受激喇曼散射时,可以将波导中双光子吸收(TPA)产生的光生自由载流子扫出波导,降低了波导的非线性损失,极大地提高了硅波导中泵浦光对信号光的喇曼增益。为了应用已经非常成熟的硅工艺,并且应用硅波导使器件小型化,根据法布里-帕罗(F-P)腔和行波放大器理论,在硅波导两端的解理面蒸镀增透膜,应用这种波导的喇曼效应设计了一种光放大器,即基于硅波导的喇曼光放大器。建立了计算放大器增益的方程,给出了不同波导长度和输入功率情况下的放大器增益,得出适当增加波导长度和泵浦光功率可以得到较高喇曼增益的结论。基于硅的光放大器有较高的饱和功率且没有泵浦源的限制,通过调整泵浦激光的波长可以放大不同波长的信号光。     

Study of porous silicon structure by Raman scattering

In this paper, the effect of etching time on light emitting porous silicon has been studied by using Raman scattering. Enhancement of Raman intensity by increasing the porosity is observed. Also there is a red shift, about 4 cm⁻¹, from the Raman peak of crystalline silicon to that of porous silicon. The phonon confinement model suggests the existence of spherical nanocrystalline silicon with diameter around 7 nm. But SEM images show that the samples have a sheetlike structure that confines phonons in one dimension. This should not cause any shift in their Raman spectra. It is suggested that the observed Raman peak shift is due to the spherical nanocrystals on the surface of these sheets.