A setup for synchrotron‐radiation‐induced total reflection X‐ray fluorescence and X‐ray absorption near‐edge structure recently commissioned at BESSY II BAMline

An automatic sample changer chamber for total reflection X‐ray fluorescence (TXRF) and X‐ray absorption near‐edge structure (XANES) analysis in TXRF geometry was successfully set up at the BAMline at BESSY II. TXRF and TXRF‐XANES are valuable tools for elemental determination and speciation, especially where sample amounts are limited (<1 mg) and concentrations are low (ng ml^?1 to µg ml^?1). TXRF requires a well defined geometry regarding the reflecting surface of a sample carrier and the synchrotron beam. The newly installed chamber allows for reliable sample positioning, remote sample changing and evacuation of the fluorescence beam path. The chamber was successfully used showing accurate determination of elemental amounts in the certified reference material NIST water 1640. Low limits of detection of less than 100 fg absolute (10 pg ml^?1) for Ni were found. TXRF‐XANES on different Re species was applied. An unknown species of Re was found to be Re in the +7 oxidation state.     

Determination of Trace Elements in High‐Purity Palladium by Inductively Coupled Plasma Mass Spectrometry Using an Internal Standard Method

Method validation of inductively coupled plasma mass spectrometry analyses for trace impurities in high‐purity materials is often limited not only by the lack of suitable reference materials with the same matrix composition but also by the lack of a significant number of certified trace element concentrations in the available reference materials. This paper demonstrates a new and simple method for the direct determination of 44 trace elements in high‐purity palladium using inductively coupled plasma mass spectrometry and an internal standard method. Sc and In were employed as internal standards to effectively eliminate nonspectral interferences from the Pd matrix. The detection limits of the 44 trace impurities were from 0.00078 to 0.46 µg/mL and the relative standard deviations (n=6) were below 3.5%. The method was further validated using a palladium standard material (Aldrich palladium standard material, CAS no. 7440053). The analytical results are in good agreement with the certified values.     

Determination of gold and silver in dross using EDXRF technique

Gold and silver in dross were determined by energy‐dispersive X‐ray fluorescence technique. Sample was prepared by pressed pellet method using microcrystalline cellulose powder as binder, and a method of standard additions was used for quantification. L_β X‐ray of gold (11.4 keV) and K_β X‐ray of silver (24.9 keV) were used for analysis. The measured concentrations of gold and silver were 132 ± 8 and 1181 ± 84 mg kg^?1, respectively. The results were validated by instrumental neutron activation analysis technique. The t‐test indicated that there was no significant difference between results obtained by the two techniques. Energy‐dispersive X‐ray fluorescence is a simple, precise and accurate technique for the determination of gold and silver in dross. Copyright © 2014 John Wiley & Sons, Ltd.     

Quantitative determination of mineral phase effects observed in APXS analyses of geochemical reference materials

Calibration of the Curiosity Rover's alpha particle X‐ray spectrometer (APXS) was accomplished using geochemical reference materials and a fundamental parameters treatment of the X‐ray fluorescence and particle‐induced X‐ray emission (PIXE) excitation processes. For most major and minor elements the influence of different rock types was not significant. For the three light elements, Na, Mg, and Al, which are excited almost entirely by PIXE, systematic differences among felsic and mafic rocks were observed. A qualitative explanation is found in the very shallow interrogation depth (a few microns), which suggests that the X‐rays of these elements must emerge from a single mineral rather than an assumed average over the various minerals present. A quantitative explanation was sought by determining the mineralogy of several reference materials and computing their expected PIXE X‐ray yields with an adaptation of the yield prediction sub‐routine GUYLS in the Guelph PIXE software package GUPIX. The complexity of assigning the certified overall element mass fractions to specific minerals limited this exercise to cases with only a few minerals present. Good agreement was found between the X‐ray yields determined in the calibration exercise and those predicted in this new approach. It is expected that automation of the computational approach may enable examination of mineralogically more complex reference materials. This might also offer a means of coupling results from the X‐ray diffraction and APXS instruments on Mars. Copyright © 2014 John Wiley & Sons, Ltd.     

Validation and traceability of XRF and SEM‐EDS elemental analysis results for solder in high‐reliability applications

A procedure and calibration samples were developed for X‐ray fluorescence spectrometry and scanning electron microscopy (SEM) with energy dispersive spectrometry (EDS) analysis methods for Sn and Pb amounts in solder and coatings. Test methods are needed by laboratories that perform destructive physical analysis of high‐reliability electronics for MIL‐STD‐1580B. Calibrants are prepared by evaporative deposition of multiple, alternating quantities of pure Sn and pure Pb having mass per unit area proportional to mass fractions of Sn and Pb in a solder being mimicked. Validation reference materials are prepared by evaporative deposition of thin films of SRM 1729 Tin Alloy (97Sn–3Pb). Films are created on high‐purity Ni foil to mimic some actual electronics structures and prevent charging during SEM‐EDS measurements. Maximum thickness of films prepared this way must be kept below approximately 1 µm to ensure that the entire thickness is probed by the primary X‐ray or electron beam and that measured X‐rays come from the entire thickness of all films. Detailed procedures are presented, and method performance was characterized. The primary purpose is to create calibrations for Sn and Pb that are simple to implement and establish traceability to the international system of units. The secondary purpose is to validate calibrations using a certified reference material to prove that, for simpler structures of thin solder coatings on metal, both X‐ray fluorescence and SEM‐EDS provide accurate results. Keeping films thin may be unrealistic in comparison with some, if not many, electronic structures, but this approach enables a laboratory to demonstrate competence in a controlled manner. Copyright © 2014 John Wiley & Sons, Ltd.     

Determinations of low atomic number elements in real uranium oxide samples using vacuum chamber total reflection x‐ray fluorescence

Conditions for the total reflection x‐ray fluorescence (TXRF) analysis of real uranium samples for low atomic number elements using vacuum chamber TXRF spectrometer were optimized. It was observed that for analysis of low atomic number elements, almost complete removal of uranium matrix is required. Two certified reference materials of uranium containing trace elements in different concentrations were dissolved in minimum amount of high purity nitric acid. The uranium matrix from these solutions was separated by solvent extraction using tri‐n‐butyl phosphate as extracting reagent. Low atomic number elements in TXRF spectrum of the aqueous phase could be seen only after six tri‐n‐butyl phosphate equilibrations in extraction. The TXRF determinations of the certified low atomic number elements Mg and Al were made in these aqueous solutions after addition of Sc as an internal standard. The TXRF determined values for Mg were in good agreement with the certified values, whereas TXRF determined Al values differed from the certified values appreciably, probably due to the interference of Al Kα peak with escape peak of U Mα and the neighboring Si Kα peak. Copyright © 2013 John Wiley & Sons, Ltd.     

Accurate determination of the Ca:P ratio in rough hydroxyapatite samples by SEM‐EDS,PIXE and RBS—a comparative study

The Ca:P ratio in a certified standard of hydroxyapatite was determined by X‐ray spectrometry (XRS), with the X‐rays excited by both electrons and ions using energy dispersive spectroscopy on the scanning electron microscope (SEM‐EDS) and particle‐induced X‐ray emission (PIXE). The certified value of Ca:P was accurately verified by 3 MeV ⁴He⁺ Rutherford Backscattering Spectrometry (RBS). We show that the demonstrably rough surface of this sample does not cause perturbation of the Ca:P ratio within the uncertainties of each of the XRS measurements. Copyright © 2009 John Wiley & Sons, Ltd.     

Optimized energy dispersive X‐ray fluorescence analysis of atmospheric aerosols collected at pristine and perturbed Amazon Basin sites

Elemental composition of aerosols is important to source apportionment studies and to understand atmospheric processes that influence aerosol composition. Energy dispersive X‐ray fluorescence spectroscopy was applied for measuring the elemental composition of Amazonian atmospheric aerosols. The instrument used was a spectrometer Epsilon 5, PANalytical B.V., with tridimensional geometry that reduces the background signal with a polarized X‐ray detection. The measurement conditions were optimized for low‐Z elements, e.g. Mg, Al, Si, that are present at very low concentrations in the Amazon. From Na to K, our detection limits are about 50% to 75% lower than previously published results for similar instrument. Calibration was performed using Micromatter standards, except for P whose standard was produced by nebulization of an aqueous solution of KH₂PO₄ at our laboratory. The multi‐element reference material National Institute of Standards and Technology–2783 (air particulate filter) was used for evaluating the accuracy of the calibration procedure of the 22 elements in our standard analysis routine, and the uncertainty associated with calibration procedures was evaluated. The overall performance of the instrument and validation of our measurements were assessed by comparison with results obtained from parallel analysis using particle‐induced X‐ray emission and another Epsilon 5 spectrometer. The elemental composition in 660 samples collected at a pristine site in the Amazon Basin and of 1416 samples collected at a site perturbed by land use change was determined. Our measurements show trace elements associated with biogenic aerosols, soil dust, biomass burning, and sea‐salt, even for the very low concentrations as observed in Amazonia. Copyright © 2014 John Wiley & Sons, Ltd.     

Combined X‐ray diffraction and alpha particle X‐ray spectrometer analysis of geologic materials

The shallow interrogation depth of the lightest elements (Na, Mg, Al, and Si) detected by the particle‐induced X‐ray emission branch of the Curiosity Rover's alpha particle X‐ray spectrometer suggests that the X‐rays of these elements very likely emerge from a single mineral grain. This reality violates the assumption of atomic homogeneity at the micron scale made in both existing spectrum‐reduction approaches for the alpha particle X‐ray spectrometer. Consequently, analytical results for these elements in igneous geochemical reference materials exhibit deviations from certified concentrations in a manner that can be related to the total alkali‐silica diagram. A computer code is introduced here to provide quantitative prediction of these deviations using the mineral abundances determined from X‐ray diffraction. The latter are converted to area coverage fractions to represent the sample surface, and a fundamental parameters computation predicts the elemental X‐ray yields from each mineral and sums these. In this process, the chemistry of each individual mineral has to be varied by an iterative simplex approach; X‐ray yields are computed and compared with the peak areas from the fit of the bulk sample. When the difference between mineral yields and peak areas for each element are minimized, the mineral formulae are set and elemental X‐ray yields provided. The ratio between the summed mineral X‐ray yields and the corresponding yields based on the homogeneity assumption may then be compared directly with the concentration deviations measured in our earlier work. For several rock types, good agreement is found, thereby consolidating our understanding of the effects of sample mineralogy on alpha particle X‐ray spectrometer results. Copyright © 2017 John Wiley & Sons, Ltd.     

Trace element determinations in uranium by total reflection X‐ray fluorescence spectrometry using polychromatic X‐ray excitation

Suitability of polychromatic X‐rays has been assessed for the total reflection X‐ray fluorescence (TXRF) trace elemental determinations in aqueous solutions as well as uranium oxide certified reference materials. The method involves total reflection of X‐rays below a certain energy level on the TXRF sample support and exciting the analytes present in ng amount on these supports, measuring the TXRF spectra, processing the spectra, and finally determining the elemental concentrations. For uranium‐based samples, the samples were dissolved, main matrix uranium was separated from these solutions using solvent extraction, and trace elements were determined using aqueous phase following above approach. The method is simple and easier to implement compared with the monochromatic excitation but has similar or in some cases better detection limits compared with those obtained using monochromatic excitation. The details of the methodology, quality of analytical results, and detection limits are described and compared with those obtained using monochromatic excitation. Copyright © 2017 John Wiley & Sons, Ltd.     

Dimensional characterization of selected elements in airborne PM10 samples using μ‐SRXRF

Micro synchrotron radiation X‐ray fluorescence (μ‐SRXRF) is a powerful spectroscopy technique that uses synchrotron radiation to induce X‐ray fluorescence in samples and provides exhaustive information on the micron and submicron scale. Among the major advantages of μ‐SRXRF spectroscopy are its nondestructive nature and that samples can usually be analyzed without pretreatment. At the ESRF (Grenoble, France) ID‐21 beamline, we examined PM₁₀ samples collected at two sites in the Province of Trieste, Italy, in order to determine possible correlations among some low‐ to mid‐Z elements (S, Cl, K, Ca, Ti, V, Cr, Mn, and Fe), as well as investigated the possibility of using synchrotron radiation imaging techniques as a way to examine the granulometry of PM₁₀ particles containing the various chemical elements. A consistent significant correlation between Ca and S has been found, which, coupled with the data obtained in a related study, indicates that a major part of the sulfate is present as CaSO₄. Granulometry measurement via imaging techniques has shown that some elements such as Fe, Ca, and S are more amenable to this type of analysis than others. Additionally, the spatial homogeneity of a PM_2.5 certified reference material (NIST SRM‐2783) has been investigated by analyzing four adjacent areas on the certified sample (total area 1 mm²). The certified reference material has shown a percentage relative standard deviation less than 7% for Al, Si, P, S, Cl, K, Ca, V, Cr, and Fe, and close to 17% for Ti and Mn. Copyright © 2011 John Wiley & Sons, Ltd.     

Utilization of standardless analysis algorithms using WDXRF and XRD for Egyptian iron ore identification

On the basis of fundamental parameter approaches, the validity of standardless wavelength dispersive X‐ray fluorescence (WDXRF) and X‐ray powder diffraction algorithms was confirmed for analyzing Egyptian iron ore samples collected from two different locations, Aswan and Baharyia. The studied Egyptian iron ores represent different depositional environments and consequently exhibit variable mineralogical and chemical compositions. In the case of WDXRF analysis, the ground powders of iron ore samples were mixed and pressed with low contamination binder in a mass ratio of wax: sample = 4: 0.9 g at 120 kN cm^?2. A standardless method for quantitative WDXRF was employed, which requires accurate determination of the amount of organic material in the sample. On the basis of differential thermal analysis, a new method is introduced for the determination of loss of ignition. With the application of the proposed method and standardless quantitative analysis, results for 12 elements in iron ores were obtained: Fe, Mn, Mg, Si, Al, Ca, Na, K, S, Ba, Zn, and Cl. The reliability and precision of the adopted procedure were tested against a standard reference material ‘Iron ore concentrate (SRM 690, NIST, USA)’. The quantitative analysis results of the certified reference material were found acceptable. Depending on the WDXRF results, the powder samples were directly introduced to X‐ray powder diffraction goniometry, and the phase compositions were quantitatively determined by using a standardless analysis program based on Rietveld method. The main phases of all iron ore samples are the hematite and goethite, whereas other phases are found with varying ratios, namely quartz, nordstrandite, rhodochrosite, kaolinite, todorokit, bassanit, andydrite, and hydroxyapatite. Copyright © 2012 John Wiley & Sons, Ltd.     

Determination of elemental composition of Lake Baikal sponges by wavelength dispersive X‐ray fluorescence spectrometry

Sponge endemic species inhabit the Lake Baikal from the ancient times. Because the sponges are the biological filters of the Baikal water and they contribute greatly to silicon circulation in the lake, it is crucial to analyze their composition. Only a few publications report the analytical data concerning the element composition of Lake Baikal sponges. However, the analytical data were mainly obtained by destructive methods. No data on the concentrations of some alkaline and volatile elements are available so far. This article describes the application of wavelength dispersive X‐ray fluorescence spectrometry to study the sponges of Lubomirskia baicalensis, Baikalospongia bacillifera, and Baikalospongia recta species collected at the littoral part of the Beryozovy Cape in the Southern Baikal. The concentrations of 19 elements Na, Mg, Al, Si, P, S, Cl, K, Ca, Ti, Mn, Fe, Ni, Cu, Zn, Br, Rb, Sr, and Ba have been determined. In this article, we discuss the problem of selecting calibration samples for wavelength dispersive X‐ray fluorescence spectrometry, because appropriate reference samples are not available. The synthetic specimens, prepared by mixing plant certified reference materials and silicon dioxide in certain proportions, were proposed for calibration. The compositions of sponges cleaned from mineral particles and symbiotic organisms, as well as unwashed sponges, have been compared. Copyright © 2013 John Wiley & Sons, Ltd.     

Development of variable‐magnification X‐ray Bragg optics

A novel X‐ray Bragg optics is proposed for variable‐magnification of an X‐ray beam. This X‐ray Bragg optics is composed of two magnifiers in a crossed arrangement, and the magnification factor, M, is controlled through the azimuth angle of each magnifier. The basic properties of the X‐ray optics such as the magnification factor, image transformation matrix and intrinsic acceptance angle are described based on the dynamical theory of X‐ray diffraction. The feasibility of the variable‐magnification X‐ray Bragg optics was verified at the vertical‐wiggler beamline BL‐14B of the Photon Factory. For X‐ray Bragg magnifiers, Si(220) crystals with an asymmetric angle of 14° were used. The magnification factor was calculated to be tunable between 0.1 and 10.0 at a wavelength of 0.112 nm. At various magnification factors (M≥ 1.0), X‐ray images of a nylon mesh were observed with an air‐cooled X‐ray CCD camera. Image deformation caused by the optics could be corrected by using a 2 × 2 transformation matrix and bilinear interpolation method. Not only absorption‐contrast but also edge‐contrast due to Fresnel diffraction was observed in the magnified images.     

X‐ray tube spectral measurement method for quantitative analysis of X‐ray fluorescence analysis

Lα and Lβ X‐ray fluorescence spectra of a lead metallic sheet were measured using an energy dispersive X‐ray spectrometer by changing the X‐ray tube voltage and the material of the primary filter. The Lα to Lβ intensity ratio changed from Lα: Lβ = 3: 1 at 15 kV to Lα: Lβ = 1: 1 at 50 kV depending on the X‐ray tube voltage and the filter. The scattered X‐ray spectra of an acrylic slab instead of the sample in the sample holder were measured by changing the applied voltage and the material of the primary filter. The calculated values of the Pb Lα/Lβ intensity ratio of the metallic sheet using the Shiraiwa–Fujino formula by inserting the scattered X‐ray spectra of an acrylic plate as incident X‐ray spectra and the fundamental parameters taken from the Elam database were in good agreement with the experimental ones. We conclude that we can obtain an incident X‐ray spectrum approximately by measuring the scattered X‐ray spectrum without measuring the direct incident beam. Copyright © 2010 John Wiley & Sons, Ltd.     

Monte Carlo simulation code for confocal 3D micro‐beam X‐ray fluorescence analysis of stratified materials

Stratified materials are of great importance for many branches of modern industry, e.g. electronics or optics and for biomedical applications. Examination of chemical composition of individual layers and determination of their thickness helps to get information on their properties and function. A confocal 3D micro X‐ray fluorescence (3D µXRF) spectroscopy is an analytical method giving the possibility to investigate 3D distribution of chemical elements in a sample with spatial resolution in the micrometer regime in a non‐destructive way. Thin foils of Ti, Cu and Au, a bulk sample of Cu and a three‐layered sandwich sample, made of two thin Fe/Ni alloy foils, separated by polypropylene, were used as test samples. A Monte Carlo (MC) simulation code for the determination of elemental concentrations and thickness of individual layers in stratified materials with the use of confocal 3D µXRF spectroscopy was developed. The X‐ray intensity profiles versus the depth below surface, obtained from 3D µXRF experiments, MC simulation and an analytical approach were compared. Correlation coefficients between experimental versus simulated, and experimental versus analytical model X‐ray profiles were calculated. The correlation coefficients were comparable for both methods and exceeded 99%. The experimental X‐ray intensity profiles were deconvoluted with iterative MC simulation and by using analytical expression. The MC method produced slightly more accurate elemental concentrations and thickness of successive layers as compared to the results of the analytical approach. This MC code is a robust tool for simulation of scanning confocal 3D µXRF experiments on stratified materials and for quantitative interpretation of experimental results. Copyright © 2011 John Wiley & Sons, Ltd.     

A miniature X‐ray tube approach to measuring lead in bone using L‐XRF

Using a miniature X‐ray tube and silicon PiN diode detector, an approach to measuring lead (Pb) in bone phantoms was tested. The X‐ray tube was used to excite L‐line X‐ray fluorescence (L‐XRF) of lead in bone phantoms. The bone phantoms were made from plaster of Paris and dosed with varying quantities of lead. Phantoms were made in two sets with different shapes to model different bone surfaces. One set of bone phantoms was circular in cross‐section (2.5‐cm diameter), the other square in cross‐section (2.2 cm × 2.2 cm). Using an irradiation time of 180 s (real time), five trials were run for each bone phantom. Analysis was performed for both Lα and Lβ lead X‐rays. Based on these calibration trials, (3σ₀/slope) minimum detection limits of 7.4 ± 0.3 µg Pb g^?1 (circular cross‐section) and 8.6 ± 0.6 µg Pb g^?1 (square cross‐section) were determined for the bare bone phantoms. To simulate a more realistic in vivo scenario with soft tissue overlying bone, further trials were performed with a resin material placed between the experimental system and the bone phantom. For the square cross‐section bone phantoms, a layer of resin with a thickness of 1.2 mm was used, and a minimum detection limit of 17 ± 3 µg Pb g^?1 determined. For the circular cross‐section phantoms, a layer of resin with an average thickness of 2.7 mm was used. From these, a more realistic minimum detection limit for in vivo applications (43 ± 7 µg Pb g^?1) was determined. Copyright © 2011 John Wiley & Sons, Ltd.     

Feasibility for chemometric energy dispersive X‐ray fluorescence and scattering (EDXRFS) spectroscopy method for rapid soil quality assessment

Soil quality assessment (SQA) is important for modulating agricultural productivity and thus requires simple and rapid analysis of soil (macro & micro) nutrients (here called soil quality indicators – SQIs). We report proof of concept of a chemometrics‐assisted energy dispersive X‐ray fluorescence and scattering (EDXRFS) spectroscopy technique for direct rapid analysis of SQIs. The EDXRFS method exploits, in addition to fluorescence, the X‐ray scatter peaks obtained non‐invasively from soils to develop a calibration strategy for quantitative analysis of SQIs in model clay soils doped with micronutrients (Fe, Cu, and Zn) and macronutrients (NO₃^?, SO₄^2?, and H₂PO₄^?). The soil samples and certified reference materials IAEA Soil‐7 and IAEA Soil‐1 (used to build spectral library for soil classification) were irradiated at various live times (to simulate different signal‐to‐noise ratios of analyte signals and analysis speed) in a teflon holder and were analyzed using a ¹⁰⁹Cd‐excited XRF spectrometer. Principal components analysis was used for spectral data compression and pattern recognition (including for those SQI spectral signatures without any visibly discernible characteristic X‐ray lines), whereas partial least squares regression and artificial neural networks were used to build a calibration and quantitative analysis strategy. The method furnishes soil micronutrient and macronutrient information simultaneously and rapidly (t = 200 s). To the best of the authors' knowledge, this is the first time that an XRF method has demonstrated spectroanalytical potential for quantitative macronutrients analysis in soils applicable to routine SQA. Coupling EDXRFS with multivariate chemometrics enables rapid and reliable assessment of chemical SQIs. Copyright © 2011 John Wiley & Sons, Ltd.     

Determination of Pb,As, Cd and trace elements in polluted soils near a lead–zinc mine using polarized X‐ray fluorescence spectrometry and the characteristics of the elemental distribution in the area

Polarization energy dispersive X‐ray fluorescence spectrometry was used in the determination of Pb, As and Cd, as well as Cr, Cu, Zn, Ni and other minor and trace elements in the soil samples taken from a polluted area by lead mine exploitation. Two difficulties have to be overcome. One is strong overlap of Pb Lα over As Kα and another is lack of suitable certified reference materials. The different excitation conditions and analytical lines were tried to reduce the impact of overlap of Pb Lα over As Kα. When KBr was used as the second target, compared with Zr, the proportion from Pb Lα was reduced about six times. Even so, however, the overlap was not reduced enough to be ignored. The inductively coupled plasma atomic emission spectrometry and mass spectrometry methods were used to analyze parts of soil samples and provide data for compensating lack of reference materials. By this method, the analytical concentration range of Pb, As and Cd were significantly extended. The analytical range of Pb, As and Cd were 1.4 µg/g~4.2%, 0.6 µg/g~9.3% and 0.5 µg/g~1500 µg/g, respectively. The high concentrations of Pb, As and Cd were found in the samples in the vicinity of the Pb‐Zn mine. The concentrations of Pb, As, Cd, Zn and Cu were higher than the Class III in the Chinese environmental quality standard for soils. The highest concentrations of Pb, As, Cd and Zn in the soil samples were 14 960, 2726, 65 and 9439 µg/g, respectively. Copyright © 2012 John Wiley & Sons, Ltd.