Structural evolution of self‐assisted GaAs nanowires grown on Si(111)

GaAs nanowires are grown on Si(111) by self‐assisted molecular beam epitaxy, and the ratio between wurtzite and zinc‐blende phases is determined as function of nanowire length using asymmetric X‐ray diffraction. We show that under the applied growth conditions, nanowires grow in both phases during the initial stage of growth, whereas the zinc‐blende content increases with growth time and dominates in long nanowires. Compared to the zinc‐blende units, the vertical lattice parameter of the wurtzite segments is 0.7% larger, as measured by the positions of respective diffraction peaks. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X‐ray diffraction

In GaAs nanowires grown along the cubic [111]_c direction, zinc blende and wurtzite arrangements have been observed in their stacking sequence, since the energetic barriers for nucleation are typically of similar order of magnitude. It is known that the interplanar spacing of the (111)_c Ga (or As) planes in the zinc blende polytype varies slightly from the wurtzite polytype. However, different values have been reported in the literature. Here, the ratio of the interplanar spacing of these polytypes is extracted based on X‐ray diffraction measurements for thin GaAs nanowires with a mean diameter of 18–25 nm. The measurements are performed with a nano‐focused beam which facilitates the separation of the scattering of nanowires and of parasitic growth. The interplanar spacing of the (111)_c Ga (or As) planes in the wurtzite arrangement in GaAs nanowires is observed to be 0.66% ± 0.02% larger than in the zinc blende arrangement.     

A sample cell for in situ electric‐field‐dependent structural characterization and macroscopic strain measurements

When studying electro‐mechanical materials, observing the structural changes during the actuation process is necessary for gaining a complete picture of the structure–property relationship as certain mechanisms may be meta‐stable during actuation. In situ diffraction methods offer a powerful and direct means of quantifying the structural contributions to the macroscopic strain of these materials. Here, a sample cell is demonstrated capable of measuring the structural variations of electro‐mechanical materials under applied electric potentials up to 10 kV. The cell is designed for use with X‐ray scattering techniques in reflection geometry, while simultaneously collecting macroscopic strain data using a linear displacement sensor. The results show that the macroscopic strain measured using the cell can be directly correlated with the microscopic response of the material obtained from diffraction data. The capabilities of the cell have been successfully demonstrated at the Powder Diffraction beamline of the Australian Synchrotron and the potential implementation of this cell with laboratory X‐ray diffraction instrumentation is also discussed.     

Direct observation of elemental segregation in InGaN nanowires by X‐ray nanoprobe

Using synchrotron radiation nanoprobe, this work reports on the elemental distribution in single In_x Ga_1–xN nanowires (NWs) grown by molecular beam epitaxy directly on Si(111) substrates. Single NWs dispersed on Al covered sapphire were characterized by nano‐X‐ray fluorescence, Raman scattering and photoluminescence spectroscopy. Both Ga and In maps reveal an inhomogeneous axial distribution inside sin‐ gle NWs. The analysis of NWs from the same sample but with different dimensions suggests a decrease of In segregation with the reduction of NW diameter, while Ga distribution seems to remain unaltered. Photoluminescence and Raman scattering measurements carried out on ensembles of NWs exhibit relevant signatures of the compositional disorder. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

In‐situ X‐ray diffraction study of an electric field induced phase transition and giant strain in Na0.5Bi0.5TiO3–x %BaTiO3 lead‐free single crystals

A giant electric field (E) induced strain of ε = 0.60% has been observed for Na_0.5Bi_0.5TiO₃–5.6%BaTiO₃ single crystals under E = 20 kV/cm at 130 °C. In‐situ X‐ray diffraction (XRD) revealed that this induced transition was between pseudocubic and tetragonal structures. Our work provides a potential alternative to lead‐based piezoelectric materials. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Individual GaAs nanorods imaged by coherent X‐ray diffraction

Using scanning X‐ray diffraction microscopy with a spot size of 220 × 600 nm, it was possible to inspect individual GaAs nanorods grown seed‐free through circular openings in a SiN_x mask in a periodic array with 3 µm spacing on GaAs[111]B. The focused X‐ray beam allows the determination of the strain state of individual rods and, in combination with coherent diffraction imaging, it was also possible to characterize morphological details. Rods grown either in the centre or at the edge of the array show significant differences in shape, size and strain state.     

The electrical properties of semiconductor/metal,semiconductor/liquid,and semiconductor/conducting polymer contacts

Critical comparisons are drawn between the basic electrical properties of semiconductor/metal, semiconductor/liquid, and semiconductor/conducting polymer junctions. A theoretical model is developed to describe the basic current-voltage properties of semiconductor contacts, with emphasis on the contrasts between ideal and observed behavior. Using the concepts from this model, the characteristics of a variety of semiconductor contacts are evaluated. The discussion focuses on the following semiconductors: Si, GaAs, InP, and II-VI compounds based on the Cd-(chalcogenide) materials.     

X‐ray focusing by the system of refractive lens(es) placed inside asymmetric channel‐cut crystals

An X‐ray one‐dimensionally focusing system, a refracting–diffracting lens (RDL), composed of Bragg double‐asymmetric‐reflecting two‐crystal plane parallel plates and a double‐concave cylindrical parabolic lens placed in the gap between the plates is described. It is shown that the focal length of the RDL is equal to the focal distance of the separate lens multiplied by the square of the asymmetry factor. One can obtain RDLs with different focal lengths for certain applications. Using the point‐source function of dynamic diffraction, as well as the Green function in a vacuum with parabolic approximation, an expression for the double‐diffracted beam amplitude for an arbitrary incident wave is presented. Focusing of the plane incident wave and imaging of a point source are studied. The cases of non‐absorptive and absorptive lenses are discussed. The intensity distribution in the focusing plane and on the focusing line, and its dependence on wavelength, deviation from the Bragg angle and magnification is studied. Geometrical optical considerations are also given. RDLs can be applied to focus radiation from both laboratory and synchrotron X‐ray sources, for X‐ray imaging of objects, and for obtaining high‐intensity beams. RDLs can also be applied in X‐ray astronomy.     

Implementation of ultrafast X‐ray diffraction at the 1W2B wiggler beamline of Beijing Synchrotron Radiation Facility

The implementation of a laser pump/X‐ray probe scheme for performing picosecond‐resolution X‐ray diffraction at the 1W2B wiggler beamline at Beijing Synchrotron Radiation Facility is reported. With the hybrid fill pattern in top‐up mode, a pixel array X‐ray detector was optimized to gate out the signal from the singlet bunch with interval 85 ns from the bunch train. The singlet pulse intensity is ～2.5 × 10⁶ photons pulse^?1 at 10 keV. The laser pulse is synchronized to this singlet bunch at a 1 kHz repetition rate. A polycapillary X‐ray lens was used for secondary focusing to obtain a 72 µm (FWHM) X‐ray spot. Transient photo‐induced strain in BiFeO₃ film was observed at a ～150 ps time resolution for demonstration.     

Optimized spatial overlap in optical pump–X‐ray probe experiments with high repetition rate using laser‐induced surface distortions

Ultrafast X‐ray diffraction experiments require careful adjustment of the spatial overlap between the optical excitation and the X‐ray probe pulse. This is especially challenging at high laser repetition rates. Sample distortions caused by the large heat load on the sample and the relatively low optical energy per pulse lead to only tiny signal changes. In consequence, this results in small footprints of the optical excitation on the sample, which turns the adjustment of the overlap difficult. Here a method for reliable overlap adjustment based on reciprocal space mapping of a laser excited thin film is presented.     

X‐ray photon correlation spectroscopy in systems without long‐range order: existence of an intermediate‐field regime

Successful X‐ray photon correlation spectroscopy studies often require that signals be optimized while minimizing power density in the sample to decrease radiation damage and, at free‐electron laser sources, thermal impact. This suggests exploration of scattering outside the Fraunhofer far‐field diffraction limit d²/λR, where d is the incident beam size, λ is the photon wavelength and R is the sample‐to‐detector distance. Here it is shown that, in an intermediate regime d²/λ > Rdξ/λ, where ξ is the structural correlation length in the material, the ensemble averages of the scattered intensity and of the structure factor are equal. Similarly, in the regime d²/λ > Rdξ(τ)/λ, where ξ(τ) is a time‐dependent dynamics length scale of interest, the ensemble‐averaged correlation functions g₁(τ) and g₂(τ) of the scattered electric field are also equal to their values in the far‐field limit. This broadens the parameter space for X‐ray photon correlation spectroscopy experiments, but detectors with smaller pixel size and variable focusing are required to more fully exploit the potential for such studies.     

In situ observation of water distribution and behaviour in a polymer electrolyte fuel cell by synchrotron X‐ray imaging

In situ visualization of the distribution and behaviour of water in a polymer electrolyte fuel cell during power generation has been demonstrated using a synchrotron X‐ray imaging technique. Images were recorded using a CCD detector combined with a scintillator (Gd₂O₂S:Tb) and relay lens system, which were placed at 2.0 m or 2.5 m from the fuel cell. The images were measured continuously before and during power generation, and data on cell performance was recorded. The change of water distribution during power generation was obtained from X‐ray images normalized with the initial state of the fuel cell. Compared with other techniques for visualizing the water in fuel cells, this technique enables the water distribution and behaviour in the fuel cell to be visualized during power generation with high spatial resolution. In particular, the effects of the specifications of the gas diffusion layer on the cathode side of the fuel cell on the distribution of water were efficiently identified. This is a very powerful technique for investigating the mechanism of water flow within the fuel cell and the relationship between water behaviour and cell performance.     

Elastic strain determination in semiconductor epitaxial layers by HREM

A new technique that is independent of image contrast and robust to the presence of experimental noise is presented to analyze strains from high resolution electron microscopy (HREM) lattice images. This approach involves the analysis of the cumulative sum of deviations (CUSUM) in lattice-fringe spacings from a target value. The effects of surface roughness at an interface, and surface relaxation due to transmission electron microscope (TEM) sample preparation are discussed. The CUSUM method was applied to two simulated and two experimental HREM images of semiconductor strained layer structures in [ ] zone axis projection. The CUSUM technique was able to accurately reproduce the strain profiles from the simulated and experimental images in all cases studied except for the component of the strain in the slip direction (e_xx) of an edge dislocation in a simulated image. In this case, the strain field near the core appeared hemispherical rather than lobed as expected.     

The competitive growth of cubic domains in Ti1–xAlxN films studied by diffraction anomalous near‐edge structure spectroscopy

Titanium and aluminium nitride films deposited by magnetron sputtering generally grow as columnar domains made of oriented nanocrystallites with cubic or hexagonal symmetry depending on Al content, which are embedded in more disordered grain boundaries. The substitution of Al atoms for Ti in the cubic lattice of the films improves their resistance to wear and oxidation, allowing their use as protective coatings. Ti K‐edge X‐ray absorption spectroscopy, which probes both crystallized and more disordered grain boundaries, and X‐ray diffraction anomalous fine structure, which is sensitive to short‐ and long‐range order within a given crystallized domain, are carried out on a set of Ti_1–xAl_xN films deposited by magnetron sputtering on Si substrates. Attention is paid to the shape of the pre‐edge region, which is sensitive to the symmetry of the site occupied by Ti atoms, either octahedral in face‐centred‐cubic Ti‐rich (TiN, Ti_0.54Al_0.46N) samples or tetrahedral in hexagonal‐close‐packed Al‐rich (Ti_0.32Al_0.68N) films. In order to obain information on the titanium environment in the well crystallized areas, subtraction of the smooth part of the energy‐dependent structure factor for the Bragg reflections is applied to the pre‐edge region of the diffraction anomalous data in order to restore their spectroscopic appearance. A flat pre‐edge is related to the typical octahedral environment of Ti atoms for cubic reflections. The difference observed between pre‐edge spectra associated with face‐centred‐cubic 200 and 111 Bragg reflections of Ti_0.54Al_0.46N is assigned to Ti enrichment of 111 large well ordered domains compared with the more disordered 200 ones. The sharp peak observed in the spectrum recorded from the hexagonal 002 peak of Ti_0.32Al_0.68N can be regarded as a standard for the pure tetrahedral Ti environment in hexagonal‐close‐packed nitride.     

An off‐axis magnetron‐sputtering system for in situ studies of artificial superlattices growth by synchrotron radiation scattering

A sputtering chamber for the growth of artificial superlattices of oxide‐based materials is described. The chamber is designed to fit into a standard Huber eight‐circle diffractometer. The chamber serves for investigation with synchrotron radiation of growth characteristics of oxide‐based artificial superlattices in situ. Two Be windows of large area in the vacuum chamber enable measurement of reflections of X‐rays at entrance and exit angles up to ～50°. Large perpendicular momentum transfers are practical with this apparatus. The possibility of investigating X‐ray scattering in situ is demonstrated by observation of the effects of the modulation length and the stacking period on the growth characteristics of BaTiO₃/LaNiO₃ artificial superlattices.     

Delayed phase separation in growth of organic semiconductor blends with limited intermixing

Binary mixed thin films of picene (C₂₂H₁₄, PIC) and pentacene (C₂₂H₁₄, PEN) consist of crystallites with a statistical occupation of the lattice sites by either PEN or PIC and unit cell parameters continuously changing with the mixing ratio. For high PIC ratios a PIC phase forms which corresponds to a limited intermixing of the two compounds. The growth behavior of these mixtures is investigated in situ and in real‐time using grazing incidence X‐ray diffraction. We observe a delayed phase separation in PIC‐rich blends, i.e. complete intermixing in the monolayer range and the nucleation of a pure PIC‐phase in addition to the intermixed phase starting from the second monolayer.

Growth scenario of picene‐rich pentacene‐picene blends.     

Evaluation of enamel crystallites in subsurface lesion by microbeam X‐ray diffraction

Early caries lesion is a demineralization process that takes place in the top 0.1 mm layer of tooth enamel. In this study, X‐ray microbeam diffraction was used to evaluate the hydroxyapatite crystallites in the subsurface lesion of a bovine enamel section and the results are compared with those obtained by transversal microradiography, a method commonly used for evaluation of tooth mineral. Synchrotron radiation from SPring‐8 was used to obtain a microbeam with a diameter of 6 µm. Wide‐angle X‐ray diffraction reports the amount of hydroxyapatite crystals, and small‐angle X‐ray scattering reports that of voids in crystallites. All three methods showed a marked decrease in the enamel density in the subsurface region after demineralization. As these diffraction methods provide structural information in the nanometre range, they are useful for investigating the mechanism of the mineral loss in early caries lesion at a nanometre level.     

Structural variation in a synchrotron‐induced contamination layer (a‐C:H) deposited on a toroidal Au mirror surface

A carbon layer deposited on an optical component is the result of complex interactions between the optical surface, adsorbed hydrocarbons, photons and secondary electrons (photoelectrons generated on the surface of optical elements). In the present study a synchrotron‐induced contamination layer on a 340 mm × 60 mm Au‐coated toroidal mirror has been characterized. The contamination layer showed a strong variation in structural properties from the centre of the mirror to the edge region (along the long dimension of the mirror) due to the Gaussian distribution of the incident photon beam intensity/power on the mirror surface. Raman scattering measurements were carried out at 12 equidistant (25 mm) locations along the length of the mirror. The surface contamination layer that formed on the Au surface was observed to be hydrogenated amorphous carbon film in nature. The effects of the synchrotron beam intensity/power distribution on the structural properties of the contamination layer are discussed. The I(D)/I(G) ratio, cluster size and disordering were found to increase whereas the sp²:sp³ ratio, G peak position and H content decreased with photon dose. The structural parameters of the contamination layer in the central region were estimated (thickness ? 400 Å, roughness ? 60 Å, density ? 72% of bulk graphitic carbon density) by soft X‐ray reflectivity measurements. The amorphous nature of the layer in the central region was observed by grazing‐incidence X‐ray diffraction.     

Diffraction of X‐ray free‐electron laser femtosecond pulses on single crystals in the Bragg and Laue geometry

A solution of the problem of dynamical diffraction for X‐ray pulses with arbitrary dimensions in the Bragg and Laue cases in a crystal of any thickness and asymmetry coefficient of reflection is presented. Analysis of pulse form and duration transformation in the process of diffraction and propagation in a vacuum is conducted. It is shown that only the symmetrical Bragg case can be used to avoid smearing of reflected pulses.     

Assessment of deviatoric lattice strain uncertainty for polychromatic X‐ray microdiffraction experiments

X‐ray microdiffraction is a powerful technique for conducting high‐spatial‐resolution lattice strain measurements. However, there has been limited validation of the technique to date. An experiment was conducted at the Advanced Light Source to assess the uncertainty of deviatoric lattice strains measured using polychromatic X‐ray microdiffraction. It is shown that the measurement uncertainty is different for each component of the deviatoric lattice strain tensor. Monte Carlo simulations of the experiment are used to explain the differences in uncertainty. The simulations point to the existence of spurious deformation modes that arise erroneously in the strain calculation owing to measurement noise and limited pole figure coverage. Methods for reducing measurement uncertainty are proposed.