Method of resonance near-field optical microscopy

We have solved the problem in which a thin metal wafer (probe) with a nanohole interacts with the flat surface of a metastructured film consisting of metal nanoparticles in an external optical radiation field. Nanoparticles are considered as two-level atomic systems. This interaction of the wafer-probe and the flat surface in the external optical radiation field gives rise to optical near-field resonance, the frequency of which differs significantly from the natural frequencies of two-level atoms in the medium and the probe. The fields inside and outside the probe and metastructured film are calculated in the near-field and far-field zones. The maximum resolution, which is achievable in the suggested scheme of near-field optical microscopy, can reach about 10 nm. __________ Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 74, No. 4, pp. 499–506, July–August, 2007.     

High-sensitivity piezoelectric tube sensor for shear-force detection in scanning near-field optical microscopy

An easy-to-implement non-optical shear-force detection setup for tip–sample distance regulation in scanning near-field optical microscopy is demonstrated. The detection method is based on attaching the near-field probe to a piezoelectric tube resulting in excellent mechanical contact between tip and detector. The main advantages of the method are good signal-to-background contrast and thus potential for high sensitivity. The method is demonstrated by obtaining approach curves of silicon surfaces. The suitability for optical experiments is further shown by measuring the near-field intensity distribution of the emission of a semiconductor laser.     

Image dipole approach and polarization effects in scanning near-field optical microscopy

A coupled-dipole approach is proposed in order to study the coupling between the probe tip and the rough sample in SNOM. In the present model both the optical probe tip and the sample protrusions are represented by polarizable dipole spheres. The induced polarization effects on the sample surface can be replaced by the image dipoles in the circumstance of quasi-static electromagnetic field approximation. Applying the radiation theory of the dipole, we have established a set of self-consistent equations to describe the field distribution at the sites of the probe tip and the sample protrusions. The results are completely the same as those obtained by means of the dyadic electromagnetic propagator formalism and also the derivation procedure is relatively simple. This method permits us to analyze the physical mechanisms of the interaction between the probe tip and the rough surface in SNOM intuitively. Based on this approach, we further discuss the influence of polarization of the incident light on the imaging quality. The calculating result shows that the shape and the contrast of the images of the sample are both sensitive to the field polarization, and the z-polarized mode is proved to give better resolution in SNOM.     

High extinction ratio metal-insulator-semiconductor waveguide surface plasmon polariton polarizer

The attenuation characteristics of a multilayer metal clad GaAs-AlGaAs optical waveguide polarizer are theoretically investigated. The dispersion relations and field distribution of the multilayer structures are calculated for different geometrical parameters and material properties. The polarizer studied consists of a single mode finite/infinite metal clad GaAs-AlGaAs waveguide with a dielectric (SiO₂/Si₃N₄) buffer layer inserted between the metal and the waveguide.Conventionally, the TM polarized waves are found to exhibit an absorption peak at a particular buffer thickness (called critical buffer thickness).We shall show that the maximum TM absorption can be improved by a multiple factor up to 7 by choosing a buffer layer thicker than its critical value. This corresponds to an extinction ratio of 1470 dB for a polarizer length of 1 mm. Further, thicker buffers reduce the insertion losses and values as low as 0.1 dB can be obtained. The strong TM absorption in these structures is interpreted as resonant coupling of the guided mode to the lossy surface plasmon polariton supported by the thin metal film. Thicker buffer also reduces the TE losses (insertion losses) and hence increases the extinction ratio (ratio of TM to TE losses).This can be achieved by optimizing the buffer and the metal thicknesses. Another equally efficient polarizer can be designed by positioning a dielectric (same as buffer) layer (superstrate layer) above the metal film and then optimizing the buffer, metal and the superstrate thicknesses. We also show that the proposed polarizer with the superstrate layer is highly stable even when exposed to the extreme atmospheric changes.     

The coaxial tip as a nano-antenna for scanning near-field microwave transmission microscopy

A novel scanning-probe setup is reported that maps the complex transmission of microwaves. Response to topographic features as small as 15 nm was observed. The sharpened coaxial probe tip serves as a microwave antenna and, at the same time, as a tunnel tip to warrant precise distance control by STM (scanning tunneling microscope) feedback. The instrument can be applied to map the microwave conductivity of, e.g. thin films or low-dimensional semiconductors. Consequences for the development of an infrared microscope are outlined.     

Modeling of a surface plasmon polariton interferometer

We model the operation of a micro-optical interferometer for surface plasmon polaritons (SPPs) that comprises an SPP beam-splitter formed by equivalent scatterers lined up and equally spaced. The numerical calculations are carried out by using a relatively simple vectorial dipolar model for multiple SPP scattering [Phys. Rev. B 67 (2003) 165405]. The SPP beam-splitter is simulated elucidating the influence of system parameters, such as the angle of SPP beam incidence, scattering particle size, and inter-particle distance, on the splitting efficiency and phase difference between the transmitted and reflected beams. It is found that the splitting efficiency is very sensitive to the size of scatterers and angle of incidence. Comparing our simulations with experimental data available in the literature, we conclude that this approach can be used, with certain limitations, for modelling of SPP components assembled of individual scatterers, e.g., beam-splitters and interferometers, and suggest further improvements of the model used.     

Imaging of human meiotic chromosomes by scanning near-field optical microscopy (SNOM)

Centromeres and telomeres are key structures of mitotic and meiotic chromosomes. Especially telomeres develop particular structural properties at meiosis. Here, we investigated the feasibility of scanning near-field optical microscopy (SNOM) for light-microscopic imaging of meiotic telomeres in the sub-hundred nanometer resolution regime. SNOM was applied to visualise the synaptonemal complex (SC) and telomere proteins (TRF1, TRF2) after differential immuno-fluorescent labelling. We tested and compared two different preparation protocols for their applicability in a SNOM setting using micro-fabricated silicon nitride aperture tips. Protocol I consisted of differential labelling of meiotic chromosome cores (SC) by SCP3 immuno-fluorescence and telomeres by TRF1 or TRF2 immuno-fluorescence, while protocol II combined absorption labelling with alkaline phosphatase substrates of cores with fluorescent labelling of telomeres. The results obtained indicate that protocol I reveals a better visualisation of structural (topographic) details than protocol II. By means of SNOM, meiotic chromosome cores could be visualised at a resolution overtopping that of far-field light microscopy.     

Recent developments in nanofabrication using scanning near-field optical microscope lithography

In addition to its well-known capabilities in imaging and spectroscopy, scanning near-field optical microscopy (SNOM) has recently shown its great potentials for fabricating various structures at the nanoscale. A variety of SNOM-based fabrication techniques have been developed for different applications. In this paper, the SNOM-based techniques involving three major functions: material modification, addition, and removal, are examined with emphasis on their abilities and reliability to make structures with resolutions at the nanometer level. The principles and procedures underlying each technique are presented, and the differences and uniqueness among them are subsequently discussed. Finally, concluding remarks are provided to summarize the major techniques studied and to recommend the scopes for technology improvement and future research.     

Coupling-induced excitation of a forbidden surface plasmon mode of a gold nanorod

Using the finite-difference time-domain (FDTD) method, we simulate the coupling between a gold nanorod and gold nanoparticles with different plasmonic resonant frequencies/volumes as well as that between the nanorod and a dielectric nanosphere. The influences of coupling with different nanoparticles on the excitation of a forbidden longitudinal surface plasmon mode of the nanorod under normal incidence are investigated. It is found that the cause of this excitation is the broken symmetry of the local electric field experienced by the nanorod resulting from the charge pileup on the other nanoparticle. This result is valuable for understanding the near-field optical characterization of plasmonic metal nanoparticles. Supported by the National Natural Science Foundation of China (Grant Nos. 10821062 and 10804004), the National Basic Research Program of China (Grant No. 2007CB307001), and the Specialized Research Fund for the Doctoral Program of Higher Education (Grant No. 200800011023) Contributed by GONG QiHuang     

基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.     

基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.     

Influence of the probe--sample interaction on scanning near-field optical microscopic images in the far field

We have studied the influence of probe--sample interaction in a scanning near-field optical microscopy (SNOM) in the far field by using samples with a step structure. For a sample with a step height of $\sim \lambda $/4, the SNOM image contrast between the two sides of the step changes periodically at different scan heights. For a step height of $\sim \lambda $/2, the image contrast remains approximately the same. The probe--sample interaction determines the SNOM image contrast here. The influence of different refractive indices of the sample has been also analysed by using a simple theoretical model.     

Optical waveguide behavior of Se-doped and undoped CdS one-dimensional nanostructures using near-field optical microscopy

The optical waveguide behaviors of CdS and CdS _x Se_1−x nanostructures are studied using near-field optical microscopy. Optical measurements demonstrate that light may be guided on sub-wavelength scales along CdS nanoribbons in straight or bent structures. The photoluminescence (PL) spectra from nanoribbon emission using scanning near-field optical microscopy are analyzed under different incident laser intensities. The PL spectra along Se-doped and undoped CdS nanoribbons at different propagation distances are investigated. Both the guided PL spectra of Se-doped and undoped CdS nanoribbons show red-shifts because of the band-edge absorption. Our results are useful for the development of new kinds of functional nano devices. Supported by the National Natural Science Foundation of China (Grant Nos. 10574002, 90406007, and 50602015) and the National Basic Research Program of China (Grant No. 2007CB936800)     

表面等离子体共振技术的一些新应用

介绍了表面等离子体共振技术在表面等离子体共振传感器、扫描近场光学显微技术、薄膜光学和膜厚测量、全息成像技术、Q开关、精密角度测量等领域的新应用.     

Surface plasmon polariton coupling between nano recording marks and their effect on optical read-out signal

We use the three-dimensional finite-difference time-domain method to investigate surface plasmon polariton coupling between two nano-recording marks which are of different shapes. The different coupling characteristics and the influence of these coupling effects on the read-out reflection signal will be discussed.     

Lattice plasmon mode excitation via near-field coupling

The optical response of metal nanoparticles can be modified through near-field or far-field interaction,yet the lattice plasmon modes(LPMs)considered can only be excited from the latter.Here instead,we present a theoretical evaluation for LPM excitation via the near-field coupling process.The sample is an arrayed structure with specific units composed of upper metal disks,a lower metal hole and a sandwiched dielectric post.The excitation process and underlying mechanism of the LPM and the influence of the structure parameters on the optical properties have been investigated in detail by using a finite-difference time-domain(FDTD)numerical method.Our investigation presented here should advance the understanding of near-field interaction of plasmon modes for LPM excitation,and LPMs could find some potential applications,such as in near-field optical microscopes,biosensors,optical filters and plasmonic lasers.     

阿基米德螺旋微纳结构中的表面等离激元聚焦

研究光在微纳结构中的分布与传播, 实现在纳米范围内操纵光子, 对于微型光学芯片的设计有着重要意义. 本文利用聚焦离子束刻蚀方法, 在基底为石英玻璃的150 nm厚金膜上刻制了不同参数的阿基米德螺旋微纳狭缝结构, 通过改变入射光波长、手性、及螺旋结构手性和螺距等方式, 在理论和实验上系统地研究了阿基米德螺旋微纳结构中的表面等离激元聚焦性质. 我们发现, 除了入射激光偏振态、螺旋结构手性之外, 结构螺距与表面等离激元波长的比值也可以用来控制结构表面电场分布, 进而在结构中心形成0阶、1阶乃至更高阶符合隐失贝塞尔函数的涡旋电场. 通过相位分析, 我们对涡旋电场的成因进行了解释. 并利用有限时域差分的模拟方法计算了不同螺距时, 结构中形成的电场及相应空间相位分布. 最后利用扫描近场光学显微镜, 观测结构中不同的光场分布, 在结构中心得到了亚波长的聚焦光斑及符合不同阶贝塞尔函数的涡旋形表面等离激元聚焦环.     

Surface plasmon polariton assisted optical pulling force

We demonstrate both analytically and numerically the existence of optical pulling forces acting on particles located near plasmonic interfaces. Two main factors contribute to the appearance of this negative recoil force. The interference between the incident and reflected waves induces a rotating dipole with an asymmetric scattering pattern, while the directional excitation of surface plasmon polaritons (SPPs) enhances the linear momentum of scattered light. The strongly asymmetric SPP excitation is determined by spin–orbit coupling of the rotating dipole and surface plasmon polariton. As a result of the total momentum conservation, the force acting on the particle points in a direction opposite to the incident wave propagation. We derive analytical expressions for the force acting on dipolar particles placed in the proximity of plasmonic surfaces. Analytical expressions for this pulling force are derived within the dipole approximation and are in excellent agreement with results of electromagnetic numerical calculations. The forces acting on larger particles are analyzed numerically, beyond the dipole approximation.

     

Review of near-field optical microscopy

This review has introduced a new near-field optical microscope (NOM)—atomic force microscope combined with photon scanning tunneling microscope (AF / PSTM). During scanning, AF/PSTM could get two optical images of refractive index image and transmissivity image, and two AFM images of topography image and phase image. A reflected near-field optical microscope (AF/RSNOM) has also been developed on AF/PSTM platform. The NOM has been reviewed in this paper and the comparison between AF/PSTM & RSNOM and the commercial A-SNOM & RNOM has also been discussed. The functions of AF/PSTM & RSNOM are much better than A-SNOM & RNOM.     

25 nm resolution single molecular fluorescence imaging by scanning near-field optical/atomic force microscopy

High-resolution single molecular near-field fluorescence images were observed by scanning near-field optical/atomic force microscopy (SNOM/AFM). We modified the SNOM/AFM for both high-resolution fluorescence imaging and high-resolution topographic imaging. The imaged fluorophore, Alexa 532, is prepared with a poly-methyl-methacrylate (PMMA) film coating. A fluorescence resolution of 25 nm was obtained with a simultaneous topographic image of a flat surface. A sample prepared with a lower PMMA concentration exhibited a rough surface in the micro area. The results for the flat surface indicated that the fluorescence resolution is worst in the rough surface sample, that the maximum fluorescence intensities for the individual fluorophore are similar, and that the decay rate is faster. Thus, we concluded that the morphological effect is an important factor in fluorescence image resolution and the apparent lifetimes of the fluorescence molecules.